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    • 5. 发明申请
    • REDUCING TRAP EFFECTS IN A SCINTILLATOR BY APPLICATION OF SECONDARY RADIATION
    • 通过应用二次辐射降低扫描仪中的陷阱效应
    • WO2008126009A3
    • 2009-05-22
    • PCT/IB2008051329
    • 2008-04-08
    • PHILIPS INTELLECTUAL PROPERTYKONINKL PHILIPS ELECTRONICS NVSNOEREN RUDOLPH MSTEINHAUSER HEIDRUNNOORDHOEK NICOLAAS JSIMON MATTHIAS
    • SNOEREN RUDOLPH MSTEINHAUSER HEIDRUNNOORDHOEK NICOLAAS JSIMON MATTHIAS
    • G01T1/20
    • G01T1/2018G01T1/20
    • According to an embodiment of the invention, a radiation detector device (10) for detecting a primary radiation (6) comprises a scintillator (12) which generates a converted primary radiation in response to incoming primary radiation (6) and a photo detector (14) for detecting the converted primary radiation. The radiation detector device (10) further comprises a secondary radiation source (20) for irradiating the scintillator (12) with a secondary radiation (22) which has a wavelength different from a wavelength of the first radiation (6) and which is capable of producing a spatially more uniform response of the scintillator (12) to primary radiation. In an embodiment of the invention, the radiation detector device (10) is an X-ray detector of an X-ray imaging apparatus where the primary radiation is X-ray radiation and the secondary radiation has a wavelength between 350 nm and 450 nm. According to an embodiment, the irradiation with the secondary radiation, e.g. UV radiation, produces a uniform gain distribution of the X-ray detector (10).
    • 根据本发明的实施例,用于检测初级辐射(6)的辐射检测器装置(10)包括闪烁体(12),其响应于入射的主辐射(6)和光检测器(14)产生转换的一次辐射 )用于检测转换的一次辐射。 辐射检测器装置(10)还包括用于用闪光体(12)照射具有与第一辐射(6)的波长不同的波长的次辐射(22)的次辐射源(20) 产生闪烁体(12)对初级辐射的空间上更均匀的响应。 在本发明的一个实施例中,辐射检测器装置(10)是X射线成像装置的X射线检测器,其中初级辐射是X射线辐射,二次辐射具有在350nm和450nm之间的波长。 根据一个实施例,用二次辐射的照射,例如, UV辐射,产生X射线检测器(10)的均匀增益分布。