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    • 3. 发明申请
    • DETECTION DEVICE FOR DETECTING PHOTONS EMITTED BY A RADIATION SOURCE
    • 用于检测由辐射源发射的光的检测装置
    • WO2012095710A3
    • 2012-11-08
    • PCT/IB2011055962
    • 2011-12-27
    • KONINKL PHILIPS ELECTRONICS NVPHILIPS INTELLECTUAL PROPERTYHERRMANN CHRISTOPHSTEADMAN BOOKER ROGERMUELHENS OLIVER
    • HERRMANN CHRISTOPHSTEADMAN BOOKER ROGERMUELHENS OLIVER
    • G01T1/17
    • G01T1/17
    • The invention relates to a detection device (6) for detecting photons emitted by a radiation source (2). A signal generation unit (20) generates a detection signal indicative of the energy of a detected photon while photons strike the detection device (6),and a baseline signal, which is affected by photons that previously struck the detection device (6),while photons are prevented from striking the detection device (6). A baseline shift determination unit (40) determines a baseline shift of the detection signal depending on the baseline signal. An energy determination unit (30) determines the energy of a detected photon depending on the detection signal and the determined baseline shift. Since the baseline shift of the detection signal is determined from a baseline signal that is generated while photons are prevented from striking the detection device (6), the baseline shift can be determined with higher accuracy, resulting in an improved energy determination.
    • 本发明涉及用于检测由辐射源(2)发射的光子的检测装置(6)。 信号产生单元(20)在光子撞击检测装置(6)时产生指示检测到的光子的能量的检测信号以及受先前撞击检测装置(6)的光子影响的基线信号,同时 防止光子撞击检测装置(6)。 基线偏移确定单元(40)根据基线信号确定检测信号的基线偏移。 能量确定单元(30)根据检测信号和确定的基线位移来确定检测到的光子的能量。 由于检测信号的基线偏移是根据在光子被阻止撞击检测装置(6)时产生的基线信号来确定的,所以可以以更高的准确度确定基线偏移,从而导致改进的能量确定。
    • 6. 发明申请
    • RADIATION DETECTOR ASSEMBLY WITH TEST CIRCUITRY
    • 辐射检测器总成与测试电路
    • WO2011077302A2
    • 2011-06-30
    • PCT/IB2010055633
    • 2010-12-07
    • KONINKL PHILIPS ELECTRONICS NVPHILIPS INTELLECTUAL PROPERTYHERRMANN CHRISTOPHSTEADMAN ROGERMUELHENS OLIVER
    • HERRMANN CHRISTOPHSTEADMAN ROGERMUELHENS OLIVER
    • G01T1/17
    • G01T1/243G01T1/247G01T7/005H01J49/0009H04N5/32H04N5/378H04N17/002
    • A radiation detector assembly (20) includes a detector array module (40) configured to convert radiation particles to electrical detection pulses, and an application specific integrated circuit (ASIC) (42) operatively connected with the detector array. The ASIC includes signal processing circuitry (60) configured to digitize an electrical detection pulse received from the detector array, and test circuitry (80) configured to inject a test electrical pulse into the signal processing circuitry. The test circuitry includes a current meter (84) configured to measure the test electrical pulse injected into the signal processing circuitry, and a charge pulse generator (82) configured to generate a test electrical pulse that is injected into the signal processing circuitry. The radiation detector assembly (20) is assembled by operatively connecting the ASIC (42) with the detector array module (40), and the signal processing circuitry (60) of the ASIC of the assembled radiation detector assembly is tested without the use of radiation.
    • 辐射检测器组件(20)包括被配置为将辐射粒子转换成电检测脉冲的检测器阵列模块(40)以及与检测器阵列可操作地连接的专用集成电路(ASIC)(42)。 ASIC包括被配置为数字化从检测器阵列接收的电检测脉冲的信号处理电路(60),以及配置成将测试电脉冲注入到信号处理电路中的测试电路(80)。 测试电路包括配置成测量注入到信号处理电路中的测试电脉冲的电流计(84)和被配置为产生被注入到信号处理电路中的测试电脉冲的充电脉冲发生器(82)。 通过将ASIC(42)与检测器阵列模块(40)可操作地连接来组装放射线检测器组件(20),并且组装的辐射探测器组件的ASIC的信号处理电路(60)被测试而不使用辐射 。