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    • 4. 发明申请
    • CURRENT SENSE AMPLIFIER
    • 电流检测放大器
    • WO2006027373A1
    • 2006-03-16
    • PCT/EP2005/054430
    • 2005-09-07
    • INFINEON TECHNOLOGIES AGGOGL, DietmarVIEHMANN, Hans-Heinrich
    • GOGL, DietmarVIEHMANN, Hans-Heinrich
    • G11C7/06G11C11/16
    • G11C7/04G11C7/02G11C7/062G11C7/067G11C11/16G11C2207/063
    • A high-speed current sense amplifier has complementary reference cells and load devices that eliminate capacitive mismatch contributions. The current sense amplifier includes a voltage comparator, a first clamping device coupled between a first input of the voltage comparator and a first input signal node. The first clamping device is coupled to a reference voltage. A second clamping device is coupled between the second input of the voltage comparator and a second input signal node. The second clamping device is also coupled to the reference voltage. A current mirror is coupled between the first and second input of the voltage comparator and is coupled to an active capacitance balancing circuit. The active capacitance balancing circuit may be combined with the voltage comparator. Equalization devices may be coupled between the first and second inputs of the voltage comparator, and between the first input signal node and the second input signal node.
    • 高速电流检测放大器具有补充参考电池和负载装置,可消除电容失配的贡献。 电流检测放大器包括电压比较器,耦合在电压比较器的第一输入端和第一输入信号节点之间的第一钳位装置。 第一夹紧装置耦合到参考电压。 第二钳位装置耦合在电压比较器的第二输入端和第二输入信号节点之间。 第二钳位装置也耦合到参考电压。 电流镜耦合在电压比较器的第一和第二输入端之间并耦合到有源电容平衡电路。 有源电容平衡电路可以与电压比较器组合。 均衡装置可以耦合在电压比较器的第一和第二输入之间,以及第一输入信号节点和第二输入信号节点之间。
    • 6. 发明申请
    • MAGNETORESISTIVE RANDOM ACCESS MEMORY (MRAM) CROSS-POINT ARRAY WITH REDUCED PARASITIC EFFECTS
    • 磁阻随机存取存储器(MRAM)具有降低PARASITIC效应的交叉点阵列
    • WO2003067603A1
    • 2003-08-14
    • PCT/EP2003/000805
    • 2003-01-27
    • INFINEON TECHNOLOGIES AG
    • GOGL, DietmarVIEHMANN, Hans-Heinrich
    • G11C11/16
    • G11C11/15
    • An architecture for a magnetoresistive random access memory (MRAM) storage cell 300 with reduced parasitic effects is presented. Tow additional runs of metal laid in parallel to both the wordline 310 and the bitline 320 of the MRAM device, respectively, to provide a write wordline 345 and a write bitline 355 are separated from the wordline and the bitline by a dielectric layer 340 and 350 respectively and which provides electrical isolation of the write currents from a magnetic stacks. The electrical isolation of the write wordline 345 and write bitlines 355 reduces the parasitic capacitance, inductance, and resistance seen by the wordline and bitlines during the write operation. The wordline 310 and bitlines 320 remain as in a standard MRAM cross-point array architecture and are dedicated for reading the contents of the MRAM storage cell.
    • 提出了具有减小的寄生效应的磁阻随机存取存储器(MRAM)存储单元300的架构。 分别与MRAM器件的字线310和位线320并行布置的附加金属线以提供写字线345和写位线355通过介电层340和350与字线和位线分离 并分别提供来自磁性堆栈的写入电流的电隔离。 写字线345和写位线355的电隔离减少了在写操作期间由字线和位线看到的寄生电容,电感和电阻。 字线310和位线320保持在标准MRAM交叉点阵列架构中,并且专用于读取MRAM存储单元的内容。