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    • 1. 发明申请
    • LATERALLY CONTACTED BLUE LED WITH SUPERLATTICE CURRENT SPREADING LAYER
    • 具有超级电流扩展层的横向接触蓝光LED
    • WO2013009394A1
    • 2013-01-17
    • PCT/US2012/039208
    • 2012-05-23
    • BRIDGELUX, INC.CHEN, ZhenFENWICK, WilliamLESTER, Steve
    • CHEN, ZhenFENWICK, WilliamLESTER, Steve
    • H01L33/04H01L33/32H01L33/14
    • H01L33/04H01L33/14H01L33/32
    • A laterally contacted blue LED device involves a PAN structure disposed over an insulating substrate. The substrate may be a sapphire substrate that has a template layer of GaN grown on it. The PAN structure includes an re¬ type GaN layer, a light-emitting active layer involving indium, and a p-type GaN layer. The n-type GaN layer has a thickness of at least 500nm. A Low Resistance Layer (LRL) is disposed between the substrate and the PAN structure such that the LRL is in contact with the bottom of the n- layer. In one example, the LRL is an AlGaN/GaN superlattice structure whose sheet resistance is lower than the sheet resistance of the n-type GnA layer. The LRL reduces current crowding by conducting current laterally under the n-type GaN layer. The LRL reduces defect density by preventing dislocation threads in the underlying GaN template from extending up into the PAN structure.
    • 横向接触的蓝色LED装置涉及设置在绝缘基板上的PAN结构。 衬底可以是具有在其上生长的GaN的模板层的蓝宝石衬底。 PAN结构包括RE型GaN层,包含铟的发光活性层和p型GaN层。 n型GaN层的厚度为500nm以上。 在基板和PAN结构之间设置低电阻层(LRL),使得LRL与n层的底部接触。 在一个示例中,LRL是其薄层电阻低于n型GnA层的薄层电阻的AlGaN / GaN超晶格结构。 LRL通过在n型GaN层下面横向导电来减少电流拥挤。 LRL通过防止下层GaN模板中的位错螺纹向上延伸到PAN结构中来降低缺陷密度。
    • 10. 发明申请
    • TEST STIMULI COMPRESSION AND TEST RESPONSE COMPACTION IN LOW-POWER SCAN TESTING
    • 低功耗扫描测试中的测试刺激压缩和测试响应压缩
    • WO2013016989A1
    • 2013-02-07
    • PCT/CN2012/077512
    • 2012-06-26
    • TSINGHUA UNIVERSITYXIANG, DongCHEN, Zhen
    • XIANG, DongCHEN, Zhen
    • G01R31/319
    • G01R31/318547
    • It is essential to propose a new scan testing scheme that efficiently compresses stimulus data and compacts test responses, provides low-power feature, and reduces test application cost significantly. A new test response compaction scheme called selective test response collection is proposed to reduce test response data, which is combined with a structure-analysis-based test response compactor by using a new coordination measure. The scan architecture is also established considering the coordination relationship between scan flip-flops. A new low-power test application scheme is proposed, which is able to compress test data very well and the test application time remains at the level of multiple scan chain designs. A combination of a scan architecture and an existent test compression scheme can greatly compress test data.
    • 必须提出一种新的扫描测试方案,可有效地压缩刺激数据并压缩测试响应,提供低功耗特性,并显着降低测试应用成本。 提出了一种称为选择性测试响应集合的新的测试响应压缩方案,以减少测试响应数据,通过使用新的协调度量结合基于结构分析的测试响应压缩器。 考虑到扫描触发器之间的协调关系,扫描架构也被建立。 提出了一种新的低功耗测试应用方案,能够很好地压缩测试数据,测试应用时间保持在多个扫描链设计的水平。 扫描架构和现有测试压缩方案的组合可以大大压缩测试数据。