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    • 10. 发明申请
    • TEST STIMULI COMPRESSION AND TEST RESPONSE COMPACTION IN LOW-POWER SCAN TESTING
    • 低功耗扫描测试中的测试刺激压缩和测试响应压缩
    • WO2013016989A1
    • 2013-02-07
    • PCT/CN2012/077512
    • 2012-06-26
    • TSINGHUA UNIVERSITYXIANG, DongCHEN, Zhen
    • XIANG, DongCHEN, Zhen
    • G01R31/319
    • G01R31/318547
    • It is essential to propose a new scan testing scheme that efficiently compresses stimulus data and compacts test responses, provides low-power feature, and reduces test application cost significantly. A new test response compaction scheme called selective test response collection is proposed to reduce test response data, which is combined with a structure-analysis-based test response compactor by using a new coordination measure. The scan architecture is also established considering the coordination relationship between scan flip-flops. A new low-power test application scheme is proposed, which is able to compress test data very well and the test application time remains at the level of multiple scan chain designs. A combination of a scan architecture and an existent test compression scheme can greatly compress test data.
    • 必须提出一种新的扫描测试方案,可有效地压缩刺激数据并压缩测试响应,提供低功耗特性,并显着降低测试应用成本。 提出了一种称为选择性测试响应集合的新的测试响应压缩方案,以减少测试响应数据,通过使用新的协调度量结合基于结构分析的测试响应压缩器。 考虑到扫描触发器之间的协调关系,扫描架构也被建立。 提出了一种新的低功耗测试应用方案,能够很好地压缩测试数据,测试应用时间保持在多个扫描链设计的水平。 扫描架构和现有测试压缩方案的组合可以大大压缩测试数据。