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    • 7. 发明申请
    • LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
    • LITHOGRAPHIC装置和装置制造方法
    • WO2015062921A1
    • 2015-05-07
    • PCT/EP2014/072590
    • 2014-10-22
    • ASML NETHERLANDS B.V.
    • BUTLER, HansDE HOON, Cornelius, Adrianus, LambertusVAN DER WIJST, Marc, Wilhelmus, MariaVERHEES, ThijsKERSSEMAKERS, Sander
    • G03F7/20
    • G03F7/70775G03F7/70766G03F7/70833G03F7/709
    • A lithographic apparatus (300) includes: a base frame (50); an illumination system (310) configured to condition a radiation beam and supported by the base frame; a support (320) constructed to support a patterning device (350), the patterning device being capable of imparting the radiation beam with a pattern in its cross- section to form a patterned radiation beam; a substrate table (100.2, 100.3) constructed to hold a substrate (110); a projection system (340) configured to project the patterned radiation beam onto a target portion of the substrate; a positioning device (100) configured to position the substrate table, the positioning device being supported by the base frame; a sensor (395) configured to sense a vibration caused by a torque exerted on the base frame and, an actuator configured to exert a force on the illumination system or the base frame, in response to the sensed vibration, in order to at least partly dampen the vibration.
    • 光刻设备(300)包括:基架(50); 照明系统(310),被配置为调节辐射束并由所述基架支撑; 构造成支撑图案形成装置(350)的支撑件(320),所述图案形成装置能够在其横截面中赋予辐射束图案以形成图案化的辐射束; 构造成保持衬底(110)的衬底台(100.2,100.3); 投影系统(340),被配置为将所述图案化的辐射束投影到所述基板的目标部分上; 定位装置(100),其被配置为定位所述基板台,所述定位装置由所述基架支撑; 传感器(395),其被配置为感测由施加在所述基座框架上的扭矩引起的振动;以及致动器,其被配置为响应于所感测到的振动而对所述照明系统或所述基座框架施加力,以便至少部分地 抑制振动。
    • 9. 发明申请
    • LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
    • 光刻设备和器件制造方法
    • WO2017118508A1
    • 2017-07-13
    • PCT/EP2016/080062
    • 2016-12-07
    • ASML NETHERLANDS B.V.
    • BUTLER, HansDE HOON, Cornelius, Adrianus, LambertusJACOBS, Fransiscus, MathijsKAGAN, PavelSTARREVELD, Jeroen, PieterWIJCKMANS, Maurice, Willem, Jozef, Etiënne
    • G03F7/20
    • G03F7/709G03F7/70833
    • A lithographic apparatus is described, the lithographic apparatus comprising: - an illumination system (IL) configured to condition a radiation beam; - a support (SA2) constructed to support a patterning device (MA), the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam (PR); - a projection system (PS) configured to project the patterned radiation beam onto a target portion of a substrate (W), - a stage assembly (SA) comprising: - a substrate table (WT) constructed to hold the substrate; and - a positioning device configured to displace the substrate table relative to the projection system; - a base frame onto which stage assembly and the projection system are mounted; - the base frame comprising a first portion (SABF) configured to support the stage assembly and a second portion (BF2) configured to support the projection system, the first portion and the second portion being connected to each other via a compliant portion (DC) of the base frame.
    • 描述了一种光刻设备,该光刻设备包括: - 照射系统(IL),其被配置为调节辐射束; - 构造成支撑图案形成装置(MA)的支撑件(SA2),所述图案形成装置能够在辐射束的横截面上赋予图案以形成图案化的辐射束(PR); - 投影系统(PS),其经配置以将所述经图案化的辐射束投影到衬底(W)的目标部分上; - 平台组合件(SA),其包括: - 衬底台(WT),其经构造以保持所述衬底; 以及 - 定位装置,其被构造成相对于所述投影系统移位所述衬底台; - 台架组件和投影系统安装在其上的基座框架; - 基架包括被配置为支撑台组件的第一部分(SABF)和被配置为支撑投影系统的第二部分(BF2),第一部分和第二部分经由柔性部分(DC)彼此连接, 的基本框架。