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    • 4. 发明申请
    • REMOVAL OF ETCHANT RESIDUES
    • 去除残留物
    • WO02068712A3
    • 2003-05-01
    • PCT/US0203093
    • 2002-01-25
    • APPLIED MATERIALS INC
    • SUN ZHI-WENJIANG ANBEIHUANG TUO-CHUAN
    • B08B7/00C03C15/00C23C16/44C23F1/00H01J37/32H01L21/00H01L21/304H01L21/306H01L21/3065
    • H01L21/02046H01J37/321H01J37/32449H01J37/32935
    • A substrate processing apparatus has a chamber (108) with a subs trate transport to transport a substrate onto a substrate support (170) in the chamber, a gas supply (42), to provide a gas in th e chamber, a gas energizer (158) to energize the gas, and a gas exhaust to exhaust (152) the gas. A controller (300) operates one or more of the substrate support, gas supply, gas energizer, and gas exhaust, to set etching process conditions in the chamber to etch a plurality of substrates, thereby depositing etchant residues on surfaces in the chamber. The controller also operates one or more of the substrate support, gas supply, gas energizer, and gas exhaust, to set cleaning process conditions in the chamber to clean the etchant residues. The cleaning process conditions comprise a volumetric flow ratio of O2 to CF4 of from about 1:1 to about 1:40.
    • 衬底处理装置具有一个腔室(108),该腔室具有将衬底输送到腔室中的衬底支撑件(170)上的辅助输送器,气体供应器(42),以在腔室中提供气体,气体激发器( 158)以使气体通电,并且排气排出(152)气体。 控制器(300)操作衬底支撑件,气体供应器,气体激发器和气体排出中的一个或多个,以在腔室中设置蚀刻工艺条件以蚀刻多个衬底,由此在腔室中的表面上沉积蚀刻剂残留物。 控制器还操作一个或多个衬底支撑件,气体供应器,气体激励器和气体排出器,以设置腔室中的清洁工艺条件以清洁蚀刻剂残留物。 清洗过程条件包括O2至CF4的体积流量比为约1:1至约1:40。