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    • 2. 发明申请
    • METHODS FOR DEPOSITING METAL IN HIGH ASPECT RATIO FEATURES
    • 用于在高比例特征中沉积金属的方法
    • WO2012036936A3
    • 2012-05-31
    • PCT/US2011050507
    • 2011-09-06
    • APPLIED MATERIALS INCBROWN KARLRITCHIE ALANPIPITONE JOHNRUI YINGHOFFMAN DANIEL J
    • BROWN KARLRITCHIE ALANPIPITONE JOHNRUI YINGHOFFMAN DANIEL J
    • C23C14/40C23C14/02C23C14/58
    • C23C14/046C23C14/185C23C14/3492
    • Methods of depositing metal in high aspect ratio features are provided herein. In some embodiments, a method of processing a substrate includes applying RF power at VHF frequency to a target comprising metal disposed in the PVD chamber above the substrate to form a plasma from a plasma-forming gas, sputtering metal atoms from the target using the plasma while maintaining a first pressure in the PVD chamber sufficient to ionize a predominant portion of the sputtered metal atoms, depositing the ionized metal atoms on a bottom surface of the opening and on a first surface of the substrate, applying a first RF power to redistribute at least some of the deposited metal atoms from the bottom surface and upper surface to sidewalls of the opening, and repeating the deposition the redistribution processes until a first layer of metal is deposited on substantially all surfaces of the opening.
    • 本文提供了以高纵横比特征沉积金属的方法。 在一些实施例中,处理衬底的方法包括将VHF频率的RF功率施加到包括设置在衬底上的PVD室中的金属的靶以形成来自等离子体形成气体的等离子体,使用等离子体溅射来自靶的金属原子 同时保持PVD室中的第一压力足以电离溅射的金属原子的主要部分,将离子化的金属原子沉积在开口的底表面上并在衬底的第一表面上,施加第一RF功率以在 至少一些沉积的金属原子从开口的底表面和上表面到侧壁,并且重新沉积重新分布过程,直到第一金属层沉积在开口的基本上所有的表面上。
    • 7. 发明申请
    • NON-CONTACT PROCESS KIT
    • 非接触式工艺包
    • WO2008079722A3
    • 2009-04-16
    • PCT/US2007087466
    • 2007-12-13
    • APPLIED MATERIALS INCBROWN KARLBAJAJ PUNEET
    • BROWN KARLBAJAJ PUNEET
    • F16J15/40
    • C23C14/564C23C14/50H01L21/68735
    • A process kit for use in a physical vapor deposition (PVD) chamber, along with a PVD chamber having a non-contact process kit are provided. In one embodiment, a process kit includes a generally cylindrical shield that has a substantially flat cylindrical body, at least one elongated cylindrical ring extending downward from the body, and a mounting portion extending upwards from an upper surface of the body. In another embodiment, a process kit includes a generally cylindrical deposition ring. The deposition ring includes a substantially flat cylindrical body, at least one downwardly extending u-channel coupled to an outer portion of the body, an inner wall extending upward from an upper surface of an inner region of the body, and a substrate support ledge extending radially inward from the inner wall.
    • 提供了一种用于物理气相沉积(PVD)室的工艺试剂盒,以及具有非接触式工艺试剂盒的PVD室。 在一个实施例中,处理套件包括大致圆柱形的屏蔽件,其具有基本平坦的圆柱形主体,从主体向下延伸的至少一个细长圆柱形环以及从主体的上表面向上延伸的安装部分。 在另一个实施例中,处理套件包括大致圆柱形的沉积环。 沉积环包括基本上平坦的圆柱体,至少一个向下延伸的u通道,其耦合到主体的外部部分,从主体的内部区域的上表面向上延伸的内壁,以及延伸的基板支撑凸缘 从内壁径向向内。
    • 8. 发明申请
    • PEDESTAL ASSEMBLY WITH ENHANCED THERMAL CONDUCTIVITY
    • 具有增强的热导率的PEDESTAL装配
    • WO02082511A3
    • 2003-02-20
    • PCT/US0208373
    • 2002-03-19
    • APPLIED MATERIALS INC
    • TSAI CHENG-HSIUNGBROWN KARLBREZOCZKY THOMAS
    • C23C16/458H01L21/00H01L21/683H01L21/687H01L21/68
    • H01L21/68785C23C16/4586H01L21/67103H01L21/6833Y10T29/41
    • A pedestal assembly for supporting a substrate within a semiconductor process chamber is provided. In one embodiment, the pedestal assembly generally includes a ceramic body, a metallic housing and a cooling plate. The ceramic body is coupled to the housing and is adapted to support the substrate. The cooling plate is disposed against the ceramic body. A conformal graphite interstitial layer disposed between the cooling plate and the ceramic body to provide enhanced thermal conductivity therebetween over a thermal operating range of the pedestal assembly. In another embodiment, a pedestal assembly generally includes a removable ceramic body disposed on a cover. A conformal graphite interstitial layer disposed in a vacuum environment surrounding the pedestal assembly between the ceramic body and the cover. Optionally, a second conformal graphite interstitial layer disposed in an internal volume of the pedestal assembly between the cooling plate and the cover.
    • 提供了一种用于在半导体处理室内支撑衬底的基座组件。 在一个实施例中,基座组件通常包括陶瓷体,金属壳体和冷却板。 陶瓷体联接到壳体并且适于支撑衬底。 冷却板抵靠陶瓷体设置。 布置在冷却板和陶瓷体之间的保形石墨间隙层,以在基座组件的热操作范围之间提供增强的导热性。 在另一个实施例中,基座组件通常包括设置在盖上的可移除陶瓷体。 安置在陶瓷体和盖之间的基座组件周围的真空环境中的保形石墨间隙层。 可选地,设置在冷却板和盖之间的基座组件的内部容积中的第二共形石墨间隙层。
    • 10. 发明申请
    • ELECTROSTATIC CHUCK AND METHOD OF FABRICATING THE SAME
    • 静电切割机及其制造方法
    • WO0201611A3
    • 2002-05-23
    • PCT/US0119292
    • 2001-06-15
    • APPLIED MATERIALS INC
    • BROWN KARLSANSONI STEVENCROCKER STEVEN C
    • H01L21/683H01L21/68
    • H01L21/6833
    • Apparatus for protecting a substrate and a support surface of a substrate support chuck comprising a protective coating (100) of a diamond-like carbon-based material deposited upon the support surface. The protective coating may also contain silicon-based materials. The protective coating is deposited via plasma-enhanced CVD and is approximately in the range of 1 - 5 mu m thick. The apparatus may also have a wafer spacing mask (110) disposed upon the protective coating. A method of fabricating a substrate support chuck is also disclosed and comprises the steps of forming a chuck body having a support surface and depositing a carbon-based material over the support surface of said chuck body to form a protective coating (100). Optionally, a step of depositing a wafer spacing mask (110) upon the protective coating may be added. The protective coating results in a substantial decrease in contamination of chucks, wafers and the process chamber environment.
    • 用于保护基板支撑卡盘的基板和支撑表面的装置,其包括沉积在支撑表面上的类金刚石碳基材料的保护涂层(100)。 保护涂层还可以含有硅基材料。 保护涂层通过等离子体增强CVD沉积,其厚度约为1-5μm。 该装置还可以具有设置在保护涂层上的晶片间隔掩模(110)。 还公开了一种制造基板支撑卡盘的方法,包括以下步骤:形成具有支撑表面的卡盘主体并将碳基材料沉积在所述卡盘主体的支撑表面上以形成保护涂层(100)。 可选地,可以添加在保护涂层上沉积晶片间隔掩模(110)的步骤。 保护涂层导致卡盘,晶片和处理室环境污染的显着减少。