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    • 9. 发明申请
    • METHOD AND APPARATUS FOR RF DIODE SPUTTERING
    • 射频二极管溅射的方法和装置
    • WO1997035044A1
    • 1997-09-25
    • PCT/US1997003047
    • 1997-03-04
    • MATERIALS RESEARCH CORPORATION
    • MATERIALS RESEARCH CORPORATIONHURWITT, Steven
    • C23C14/40
    • H01J37/3447C23C14/34H01J37/34
    • A sputtering system (50) includes an evacuatable chamber (52) having a target (58) which includes a sputtering surface (60). The target (58) is biased to form a cathode element (70) which causes the emission of electrons. The system (50) further includes an anode element (74) which includes the substrate (62). In use, a sputtering gas is ionized in response to the electrons to form a plasma. The plasma includes a cathode dark space (24) having a first thickness (T) wherein ionization does not occur. A plate element (76) having a bottom surface (80) is positioned a first distance (D) from the sputtering surface (60). Electrons emitted from the target (58) are absorbed by the plate element (76) to inhibit plasma formation in a first area (82) adjacent the bottom surface (60) such that target material (58) is not eroded opposite the first area (82). Further, plasma is formed in a second area (94) adjacent an edge (84, 86, 90, 92) to cause target material (58) to be eroded from the second area (94).
    • 溅射系统(50)包括具有包括溅射表面(60)的靶(58)的可抽空腔(52)。 靶(58)被偏压以形成导致电子发射的阴极元件(70)。 系统(50)还包括包括基板(62)的阳极元件(74)。 在使用中,溅射气体响应于电子被电离以形成等离子体。 等离子体包括具有不会发生电离的第一厚度(T)的阴极暗空间(24)。 具有底表面(80)的板元件(76)与溅射表面(60)定位成第一距离(D)。 从靶元件(58)发射的电子被平板元件(76)吸收,以抑制邻近底面(60)的第一区域(82)中的等离子体形成,使得靶材料(58)不与第一区域相对 82)。 此外,等离子体形成在与边缘(84,86,90,92)相邻的第二区域(94)中,以引起目标材料(58)从第二区域(94)侵蚀。