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1. 发明申请

WO2014015234A3 SYSTEMS AND METHODS FOR CORRECTING HIGH ORDER ABERRATIONS IN LASER REFRACTIVE SURGERY 审中-公开
公开(公告)号：WO2014015234A3
公开(公告)日：2014-01-23
申请号：PCT/US2013/051246
申请日：2013-07-19
申请人： AMO MANUFACTURING USA, LLC. , FABRIKANT, Anatoly , DAI, Guang-Ming , CHERNYAK, Dimitri , LOGAN, Ben , HINDI, David , WANG, Qi
发明人： FABRIKANT, Anatoly , DAI, Guang-Ming , CHERNYAK, Dimitri , LOGAN, Ben , HINDI, David , WANG, Qi
IPC分类号： A61F9/008
摘要： Optical correction methods, devices, and systems reduce optical aberrations or inhibit refractive surgery induced aberrations. Error source control and adjustment or optimization of ablation profiles or other optical data address high order aberrations. A simulation approach identifies and characterizes system factors that can contribute to, or that can be adjusted to inhibit, optical aberrations. Modeling effects of system components facilitates adjustment of the system parameters.

2. 发明申请

WO2014055690A1 SYSTEMS AND METHODS FOR TREATMENT TARGET DECONVOLUTION 审中-公开
标题翻译：用于治疗目标去卷积的系统和方法
公开(公告)号：WO2014055690A1
公开(公告)日：2014-04-10
申请号：PCT/US2013/063126
申请日：2013-10-02
申请人： AMO DEVELOPMENT, LLC. , DAI, Guang-ming , FABRIKANT, Anatoly , CHERNYAK, Dimitri
发明人： DAI, Guang-ming , FABRIKANT, Anatoly , CHERNYAK, Dimitri
IPC分类号： A61F9/008
CPC分类号： G06F19/3437 , A61F9/00802 , A61F2009/00857 , A61F2009/00878 , A61F2009/00897 , G06F19/00 , G16H50/50
摘要： Deconvolution systems and methods based on cornea smoothing can be used to obtain an ablation target or treatment shape that does not induce significant high-order aberrations such as spherical aberration. Exemplary ablation targets or treatment shapes can provide a post-operative spherical aberration that is equal to or below a naturally occurring amount of spherical aberration.
摘要翻译：可以使用基于角膜平滑的去卷积系统和方法来获得不引起显着的高阶像差（例如球面像差）的消融靶或治疗形状。示例性的消融靶或治疗形状可以提供等于或低于天然存在的球面像差量的术后球面像差。

3. 发明申请

WO2015103273A1 WAVEFRONT MEASUREMENT PRE-SMOOTHING SYSTEMS AND METHODS 审中-公开
标题翻译： WAVEFRONT测量预曝光系统和方法
公开(公告)号：WO2015103273A1
公开(公告)日：2015-07-09
申请号：PCT/US2014/072769
申请日：2014-12-30
申请人： AMO Development, LLC. , FABRIKANT, Anatoly , CHERNYAK, Dimitri , DAI, Guang-ming , SHAH, Jayesh
发明人： FABRIKANT, Anatoly , CHERNYAK, Dimitri , DAI, Guang-ming , SHAH, Jayesh
IPC分类号： A61F9/008
CPC分类号： A61F9/008 , A61F2009/0088
摘要： Embodiments of the present invention encompass systems and methods for generating a vision treatment target for an eye of a patient. Exemplary techniques can involve obtaining a wavefront measurement for the eye of the patient, processing the wavefront measurement, using a low pass filter, to obtain an ocular wavefront, and generating the vision treatment target based on the ocular wavefront. In some cases, the wavefront is processed by applying a Fourier transform to the wavefront measurement to obtain a Fourier spectrum of the wavefront, convolving, in the Fourier domain, the Fourier spectrum of the wavefront and the low pass filter to obtain a Fourier spectrum convolution result, and applying an inverse transform to the convolution result to obtain the ocular wavefront. The ocular wavefront can represent a low pass filtered version of the wavefront measurement, such that high spatial frequency features present in the wavefront measurement are not present in the ocular wavefront
摘要翻译：本发明的实施例包括用于产生患者眼睛的视力治疗目标的系统和方法。示例性技术可以包括获得患者眼睛的波前测量，使用低通滤波器处理波前测量，以获得眼波阵面，以及基于眼波前生成视觉治疗目标。在一些情况下，通过对波前测量应用傅里叶变换来处理波阵面，以获得波前的傅立叶频谱，在傅立叶域中卷积波前和低通滤波器的傅立叶频谱以获得傅立叶频谱卷积结果，并且对卷积结果应用逆变换以获得眼波。眼波前可以表示波前测量的低通滤波版本，使得波前测量中存在的高空间频率特征不存在于眼波前

4. 发明申请

WO2015070092A1 TREATMENT VALIDATION SYSTEMS AND METHODS 审中-公开
标题翻译：治疗验证系统和方法
公开(公告)号：WO2015070092A1
公开(公告)日：2015-05-14
申请号：PCT/US2014/064678
申请日：2014-11-07
申请人： AMO DEVELOPMENT LLC , DAI, Guang-ming , FABRIKANT, Anatoly , CHEMYAK, Dimitri , SHAH, Jayesh
发明人： DAI, Guang-ming , FABRIKANT, Anatoly , CHEMYAK, Dimitri , SHAH, Jayesh
IPC分类号： A61F9/008
CPC分类号： A61F9/00802 , A61F9/00804 , A61F9/00806 , A61F2009/00857 , A61F2009/00872 , A61F2009/00878
摘要： Treatment validation techniques include generating a modified treatment target from an original treatment target using a modification process, and comparing induced aberrations provided by the original and modified treatment targets, so as to verify the modified treatment target or the modification process. In some cases, a modification process may include a deconvolution process, a low pass filter process, a scaling process, or an adjustment process. The induced aberrations may include high order aberrations, such as spherical aberration.
摘要翻译：治疗验证技术包括使用修改过程从原始治疗靶产生修饰治疗靶，并比较由原始和修改的治疗靶标提供的诱导像差，以验证修改的治疗目标或修饰过程。在一些情况下，修改过程可以包括去卷积处理，低通滤波处理，缩放处理或调整处理。感应像差可以包括高阶像差，例如球面像差。

5. 发明申请

WO2013013182A1 TILT COMPENSATION, MEASUREMENT, AND ASSOCIATED ADJUSTMENT OF REFRACTIVE PRESCRIPTIONS DURING SURGICAL AND OTHER TREATMENTS OF THE EYE 审中-公开
标题翻译：倾斜补偿，测量和相关调整眼科手术和其他治疗期间的折射性治疗
公开(公告)号：WO2013013182A1
公开(公告)日：2013-01-24
申请号：PCT/US2012/047665
申请日：2012-07-20
申请人： AMO DEVELOPMENT, LLC. , CHERNYAK, Dimitri , FABRIKANT, Anatoly
发明人： CHERNYAK, Dimitri , FABRIKANT, Anatoly
IPC分类号： A61F9/008
CPC分类号： A61F9/008 , A61F9/00804 , A61F2009/00844 , A61F2009/00846 , A61F2009/00848 , A61F2009/00872 , A61F2009/00882
摘要： Embodiments of the present invention provide methods and systems for determining an ablation treatment for an eye of a patient. The systems and method may involve determining an ellipsoid shape corresponding to an anterior corneal surface of the patient's eye. The ellipsoid shape may include an anterior portion, a major axis, and an apex, where the major axis intersects the anterior portion at the apex. The systems and method may also involve determining a tilted orientation of the eye, such as when the patient fixates on a target during a laser ablation procedure. The systems and method may further involve determining the ablation treatment based on the ellipsoid shape and/or the tilted orientation.
摘要翻译：本发明的实施例提供了用于确定患者眼睛的消融治疗的方法和系统。系统和方法可以涉及确定对应于患者眼睛的前角膜表面的椭圆形状。椭圆形状可以包括前部，长轴和顶点，其中长轴在顶点与前部相交。系统和方法还可以包括确定眼睛的倾斜取向，例如当患者在激光烧蚀过程期间固定在靶上时。系统和方法还可以包括基于椭圆形状和/或倾斜取向来确定消融治疗。

6. 发明申请

WO2016015010A1 SYSTEMS AND METHODS FOR LASER BEAM DIRECT MEASUREMENT AND ERROR BUDGET 审中-公开
标题翻译：用于激光束直接测量和错误预算的系统和方法
公开(公告)号：WO2016015010A1
公开(公告)日：2016-01-28
申请号：PCT/US2015/042108
申请日：2015-07-24
申请人： AMO MANUFACTURING USA, LLC
发明人： BEREZHNYY, Ihor , FABRIKANT, Anatoly , DAI, Guangming , LOGAN, Benjamin , TANG, Anthony , PRICE, Henry , CALEBOTTA, Stephen
IPC分类号： A61F9/008
CPC分类号： A61F9/00802 , A61B2018/00577 , A61B2018/00684 , A61B2018/00738 , A61B2018/00767 , A61B2018/00779 , A61B2018/2035 , A61F9/00804 , A61F9/00814 , A61F2009/00844 , A61F2009/00855 , A61F2009/00878 , A61F2009/00882 , A61F2009/00897 , G01J1/10 , G01J1/4228 , G01J1/4257 , G01J1/429 , G01J1/58 , G01J11/00
摘要： Embodiments of the present invention generally describe systems, devices, and methods for directly measuring pulse profiles during pulse delivery. In some embodiment, the pulse profiles may be measured while the pulse is delivered to ablate a material. Embodiments, may calculate ablation spot parameters based on the pulse profiles and may refine one or more subsequent laser pulses based on deviations from the calculated ablation spot parameters from desired ablation spot parameters. In some embodiments, a fluence profiler is provided. The fluence profiler may measure a pulse profile of a laser pulse from a portion of the laser pulse. The fluence profiler may utilize a UV radiation energy sensor device and a camera-based imager. The measurements from the UV radiation energy sensor device and the camera-based imager may be combined and scaled to provide a measured pulse profile that corresponds to the delivered pulse.
摘要翻译：本发明的实施例一般描述了用于在脉冲传送期间直接测量脉冲轮廓的系统，装置和方法。在一些实施例中，可以在输送脉冲以消融材料的同时测量脉冲分布。实施例可以基于脉冲轮廓来计算消融点参数，并且可以基于来自所需消融点参数的计算的消融点参数的偏差来细化一个或多个后续激光脉冲。在一些实施例中，提供注量分析器。注量分析器可以从激光脉冲的一部分测量激光脉冲的脉冲分布。注量分析器可以利用UV辐射能量传感器装置和基于相机的成像器。可以组合和缩放来自UV辐射能量传感器装置和基于相机的成像器的测量值，以提供对应于传送脉冲的测量脉冲分布。

7. 发明申请

WO2004076963A2 APPARATUS AND METHOD FOR DETECTING OVERLAY ERRORS USING SCATTEROMETRY 审中-公开
标题翻译：用于使用散射检测来检测重叠错误的装置和方法
公开(公告)号：WO2004076963A2
公开(公告)日：2004-09-10
申请号：PCT/US2004/005419
申请日：2004-02-23
申请人： KLA-TENCOR TECHNOLOGIES CORPORATION , MIEHER, Walter, D. , LEVY, Ady , GOLOVANEVSKY, Boris , FRIEDMANN, Michael , SMITH, Ian , ADEL, Michael , FABRIKANT, Anatoly , BEVIS, Christopher, F. , FIELDEN, John , BAREKET, Noah , GROSS, Ken , ZALICKI, Piotr , WACK, Dan , DECECCO, Paola , DZIURA, Thaddeus, G. , GHINOVKER, Mark
发明人： MIEHER, Walter, D. , LEVY, Ady , GOLOVANEVSKY, Boris , FRIEDMANN, Michael , SMITH, Ian , ADEL, Michael , FABRIKANT, Anatoly , BEVIS, Christopher, F. , FIELDEN, John , BAREKET, Noah , GROSS, Ken , ZALICKI, Piotr , WACK, Dan , DECECCO, Paola , DZIURA, Thaddeus, G. , GHINOVKER, Mark
IPC分类号： G01B
CPC分类号： G03F9/7088 , G01N21/956 , G01N2021/213 , G03F7/70625 , G03F7/70633 , G03F7/70683 , G03F9/7049 , G03F9/7084
摘要： Disclosed is a method of determining an overlay error between two layers of a multiple layer sample. For a plurality of periodic targets that each have a first structure formed from a first layer and a second structure formed from a second layer of the sample, an optical system is employed to thereby measure an optical signal from each of the periodic targets. There are predefined offsets between the first and second structures. An overlay error is determined between the first and second structures by analyzing the measured optical signals from the periodic targets using a scatterometry overlay technique based on the predefined offsets. The optical system comprises any one or more of the following apparatus: an imaging reflectometer, an imaging spectroscopic reflectometer, a polarized spectroscopic imaging reflectometer, a scanning reflectometer system, a system with two or more reflectometers capable of parallel data acquisition, a system with two or more spectroscopic reflectometers capable of parallel data acquisition, a system with two or more polarized spectroscopic reflectometers capable of parallel data acquisition, a system with two or more polarized spectroscopic reflectometers capable of serial data acquisition without moving the wafer stage or moving any optical elements or the reflectometer stage, imaging spectrometers, imaging system with wavelength filter, imaging system with long-pass wavelength filter, imaging system with short-pass wavelength filter, imaging system without wavelength filter, interferometric imaging system, imaging ellipsometer, a spectroscopic ellipsometer, a laser ellipsometer having a photoelastic modulator, an imaging spectroscopic ellipsometer, a scanning ellipsometer system, a system with two or more ellipsometers capable of parallel data acquisition, a system with two or more ellipsometers capable of serial data acquisition without moving the wafer stage or moving any optical elements or the ellipsometer stage, a Michelson interferometer, and a Mach-Zehnder interferometer, a Sagnac interferometer, a scanning angle of incidence system, a scanning azimuth angle system, a +/- first order differential reflectometer, a +/- first order differential polarized reflectometer.
摘要翻译：公开了一种确定多层样本的两层之间的覆盖误差的方法。对于每个具有由第一层形成的第一结构和由第二层样品形成的第二结构的多个周期性目标，采用光学系统，从而测量来自每个周期性目标的光信号。在第一和第二结构之间有预定义的偏移。通过使用基于预定偏移的散射测量覆盖技术来分析来自周期性目标的所测量的光信号，在第一和第二结构之间确定覆盖误差。光学系统包括以下装置中的任何一个或多个：成像反射计，成像光谱反射计，偏振光谱成像反射计，扫描反射计系统，具有两个或更多个能够并行数据采集的反射计的系统，具有两个具有能够并行数据采集的两个或更多个偏振分光反射计的系统，具有两个或更多个偏振光谱反射计的系统，其能够进行串行数据采集而不移动晶片台或移动任何光学元件或反射计阶段，成像光谱仪，波长滤波器成像系统，长波长滤波器成像系统，短波长滤波器成像系统，无波长滤波器成像系统，干涉成像系统，成像椭偏仪，光谱椭偏仪，激光椭偏仪具有光弹性调制器，成像光谱椭偏仪，扫描椭偏仪系统，具有能够并行数据采集的两个或更多个椭偏仪的系统，具有两个或更多个椭圆计的系统，能够进行串行数据采集而不移动晶片台或移动任何光学元件或椭圆偏振台，迈克尔逊干涉仪和马赫 - 策德尔干涉仪，Sagnac干涉仪，入射系统的扫描角度，扫描方位角系统，+/-一阶微分反射计，+/-一阶差分偏振反射计。

8. 发明申请

WO2013082466A1 SYSTEM AND METHOD FOR OPHTHALMIC SURFACE MEASUREMENTS BASED ON SEQUENTIAL ESTIMATES 审中-公开
标题翻译：基于序列估计的眼表面测量系统与方法
公开(公告)号：WO2013082466A1
公开(公告)日：2013-06-06
申请号：PCT/US2012/067357
申请日：2012-11-30
申请人： AMO DEVELOPMENT, LLC. , FABRIKANT, Anatoly
发明人： FABRIKANT, Anatoly
IPC分类号： A61F9/008 , A61B3/107 , A61B3/00 , A61B5/107 , A61B5/00 , G01B11/24
CPC分类号： A61B3/107 , A61B5/725 , A61F9/00804 , A61F9/00806 , A61F2009/00872 , A61F2009/0088 , A61F2009/00882 , F04C2270/041
摘要： Systems and methods for measuring a topography of an optical tissue surface of an eye are provided by combining measured elevations of the surface with a priori information of the surface to provide an estimate of mean and covariance of post- measurement orthogonal polynomial sequence amplitudes associated with the surface, determining a variance of elevation of the surface from the estimate, and constructing the topography from the estimate of mean and covariance of post-measurement amplitudes based on a comparison of the variance of elevation of the surface with a pre-determined threshold. The a priori information includes an estimate of mean and covariance of pre-measurement orthogonal polynomial sequence amplitudes associated with the surface.
摘要翻译：通过将表面的测量高程与表面的先验信息组合来提供用于测量眼睛的光学组织表面的形貌的系统和方法，以提供与该表面相关联的测量后正交多项式序列振幅的平均和协方差的估计根据估计的平均和协方差的估计，基于表面高程的方差与预定阈值的比较来确定表面高程的方差与估计的平均和协方差的构造。先验信息包括与表面相关联的预测量正交多项式序列振幅的平均值和协方差的估计。

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