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    • 2. 发明申请
    • MOLD FOR INJECTION MOLDING
    • 注塑模具
    • WO2007029987A1
    • 2007-03-15
    • PCT/KR2006/003590
    • 2006-09-08
    • BESTNER INC.YOON, Tae-Sik
    • YOON, Tae-Sik
    • B29C45/26
    • B29C45/4421B29C33/301
    • According to the present invention, there is provided with a mold for injection molding comprising a first mold having a concave first molding surface; and a second mold having a convex second molding surface, the second mold being arranged to be spaced from the first mold for a cavity to be defined between the first and second molding surfaces. At this time, the second mold includes a plurality of unit molds coupled with and disassembled from each other, and protrusions of a predetermined shape are formed on the second molding surface. Therefore, a hemispherical molded product can be easily removed from the mold when injection molding the molded product with protrusions of a predetermined shape formed on an inner surface thereof.
    • 根据本发明,提供了一种用于注塑的模具,包括具有凹形第一模制表面的第一模具; 以及具有凸形的第二成型表面的第二模具,所述第二模具被布置成与所述第一模具间隔开以形成在第一和第二模制表面之间的空腔。 此时,第二模具包括多个单元模具,它们彼此联接和拆卸,并且在第二模制表面上形成预定形状的凸起。 因此,当在其内表面上形成具有预定形状的突起的模制产品注射成型时,可以容易地从模具中移除半球状模制产品。
    • 4. 发明申请
    • METHOD FOR CONTROLLING DISLOCATION POSITIONS IN SILICON GERMANIUM BUFFER LAYERS
    • 用于控制硅锗缓冲层中的位移位置的方法
    • WO2007018495A3
    • 2007-12-13
    • PCT/US2005026364
    • 2005-07-25
    • UNIV CALIFORNIAXIE YA-HONGYOON TAE-SIK
    • XIE YA-HONGYOON TAE-SIK
    • H01L21/20H01L21/36H01L21/76
    • H01L29/1054B82Y10/00H01L21/26506H01L21/26533H01L21/266H01L2924/0002H01L2924/00
    • A method for controlling dislocation position in a silicon germanium buffer layer located on a substrate includes depositing a strained silicon germanium layer on the substrate and irradiating one or more regions of the silicon germanium layer with a dislocation inducing agent. The dislocation inducing agent may include ions, electrons, or other radiation source. Dislocations in the silicon germanium layer are located in one or more of the regions. The substrate and strained silicon germanium layer may then be subjected to an annealing process to transform the strained silicon germanium layer into a relaxed state. A top layer of strained silicon or silicon germanium may be deposited on the relaxed silicon germanium layer. Semiconductor-based devices may then be fabricated in the non-damaged regions of the strained silicon or silicon germanium layer. Threading dislocations are confined to damaged areas which may be transformed into SiO 2 isolation regions.
    • 用于控制位于衬底上的硅锗缓冲层中的位错位置的方法包括在衬底上沉积应变硅锗层并用位错诱导剂照射硅锗层的一个或多个区域。 位错诱导剂可以包括离子,电子或其它辐射源。 硅锗层中的位错位于一个或多个区域中。 然后可以对衬底和应变硅锗层进行退火处理,以将应变硅锗层转变成松弛状态。 应变硅或硅锗的顶层可沉积在松散的硅锗层上。 然后可以在应变硅或硅锗层的未损坏区域中制造基于半导体的器件。 穿透位错限于可能转化为SiO 2隔离区的损坏区域。