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    • 4. 发明申请
    • AUTOMATED TEST EQUIPMENT WITH DIB MOUNTED THREE DIMENSIONAL TESTER ELECTRONICS BRICKS
    • 自动测试设备与DIB安装三维测试仪电子砖
    • WO2006005031A1
    • 2006-01-12
    • PCT/US2005/023676
    • 2005-06-30
    • TERADYNE, INC.TENEKETGES, Nicholas J.
    • TENEKETGES, Nicholas J.
    • G01R31/28
    • G01R31/2889
    • Automated test equipment is provided which includes a test head having a tester electronics brick (305) mounted to a device interface board. In some embodiments, support circuitry is positioned adjacent the tester electronics bricks opposite the DIB. The support circuitry may include power circuitry and/or data bus circuitry, which may be coupled to separate sides, or the same side of the tester electronics brick. A heat transfer apparatus (315) located between the DIB and the support circuitry may be provided for cooling the tester electronics bricks. A tester electronics brick may include multi-chip modules (310) arranged so that the edges generally define interface sides of the tester electronics brick. These sides may include a DIB interface side (305 1) mounted to the DIB, a data bus interface side (305 5), a power interface side, and a heat transfer interface side (315). Contacts (325) may be located at the edges of the MCMs.
    • 提供了自动测试设备,其包括具有安装到设备接口板的测试仪电子砖(305)的测试头。 在一些实施例中,支撑电路位于与DIB相对的测试器电子部件砖附近。 支持电路可以包括电源电路和/或数据总线电路,其可耦合到测试仪电子部件的分离侧或同一侧。 可以提供位于DIB和支撑电路之间的传热装置(315),用于冷却测试仪电子砖。 测试仪电子砖可以包括布置成使得边缘通常限定测试仪电子砖的界面侧的多芯片模块(310)。 这些侧面可以包括安装到DIB的DIB接口侧(305 1),数据总线接口侧(305,5),电源接口侧和传热接口侧(315)。 触点(325)可以位于MCM的边缘。