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    • 2. 发明申请
    • METHOD FOR REPAIRING COPPER DIFFUSION BARRIER LAYERS ON A SEMICONDUCTOR SOLID SUBSTRATE AND REPAIR KIT FOR IMPLEMENTING THIS METHOD.
    • 用于修复半导体固体基板上的铜扩散阻挡层和修复方法的方法。
    • WO2010026243A1
    • 2010-03-11
    • PCT/EP2009/061527
    • 2009-09-07
    • ALCHIMERMEVELLEC, Vincent
    • MEVELLEC, Vincent
    • C23C18/18C23C18/31H01L21/768
    • C23C18/1893C23C18/31C23C18/34H01L21/288H01L21/76846H01L21/76868H01L21/76873H01L21/76898
    • Method for repairing copper diffusion barrier layers on a semiconductor solid substrate and repair kit for implementing this method. One subject of the present invention is a method for repairing a surface of a substrate coated with a discontinuous copper diffusion barrier layer of a titanium-based material. According to the invention, this method comprises: a) the contacting of the surface with a suspension containing copper or copper alloy nanoparticles for a time of between 1 s and 15 min; and b) the contacting of the thus treated surface with a liquid solution having a pH of between 8.5 and 12 and containing: - at least one metal salt, - at least one reducing agent, - at least one stabilizer at a temperature of between 50°C and 90°C, preferably between 60°C and 80°C, for a time of between 30 s and 10 min, preferably between 1 min and 5 min, in order to thus form a metallic film having a thickness of at least 50 nanometers re-establishing the continuity of the copper diffusion barrier layer. Application: Fabrication of interconnects in integrated circuits.
    • 在半导体固体基板上修复铜扩散阻挡层的方法以及用于实施该方法的修理工具。 本发明的一个主题是用于修复涂覆有钛基材料的不连续铜扩散阻挡层的基板的表面的方法。 根据本发明,该方法包括:a)使表面与含有铜或铜合金纳米颗粒的悬浮液接触1至15分钟; 和b)如此处理的表面与pH为8.5至12的液体溶液的接触,并且含有: - 至少一种金属盐,至少一种还原剂, - 至少一种稳定剂,温度为50 ℃和90℃,优选60℃至80℃之间,时间为30秒至10分钟,优选1分钟至5分钟,以便形成至少具有至少厚度的金属膜 50纳米重新建立铜扩散阻挡层的连续性。 应用:集成电路中互连的制造。