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1. 发明申请

WO2014009980A1 INTERFACE BOARD OF A TESTING HEAD FOR A TEST EQUIPMENT OF ELECTRONIC DEVICES AND CORRESPONDING TESTING HEAD 审中-公开
标题翻译：电子设备测试设备的测试头接口板和相应的测试头
公开(公告)号：WO2014009980A1
公开(公告)日：2014-01-16
申请号：PCT/IT2012000214
申请日：2012-07-11
申请人： TECHNOPROBE SPA , CAMPARDO GIOVANNI , MAGGIONI FLAVIO , LIBERINI RICARDO
发明人： CAMPARDO GIOVANNI , MAGGIONI FLAVIO , LIBERINI RICARDO
IPC分类号： G01R31/319 , G01R1/04 , G01R31/28
CPC分类号： G01R1/0408 , G01R31/2889 , G01R31/31905
摘要： An interface board (50) of a testing head (31) for a test equipment of electronic devices is described, such a testing head (31) comprising a plurality of contact probes (34), each contact probe (34) having at least one contact tip suitable to abut against contact pads of a device to be tested (35), as well as a contact element for the connection with a board (36) of the test equipment. Suitably, the interface board (50) comprises a substrate (51) and at least one redirecting die (40) housed on a first surface of that substrate (51) and a plurality of contact pins (53) projecting from a second surface of that substrate (51) opposed to the first surface, the redirecting die (40) comprising at least one semiconductor substrate (41) whereon at least a first plurality of contact pads (42A) is realized, suitable to contact a contact element of a contact probe (34) of the testing head (31), the contact pins (53) being suitable to contact the board (36).
摘要翻译：描述了用于电子设备的测试设备的测试头（31）的接口板（50），这种测试头（31）包括多个接触探针（34），每个接触探针（34）具有至少一个接触尖端适于抵靠待测试装置（35）的接触垫，以及用于与测试装置的板（36）连接的接触元件。合适地，接口板（50）包括衬底（51）和容纳在该衬底（51）的第一表面上的至少一个改向模（40），以及从该衬底的第二表面突出的多个触针（53）（40）包括至少一个半导体衬底（41），在所述半导体衬底上实现至少第一多个接触垫（42A），所述半导体衬底适于接触接触探针的接触元件（31）的所述接触销（34），所述接触销（53）适于接触所述板（36）。

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