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1. 发明申请

WO2007056226A3 METHOD FOR DETERMINING INFORMATION ABOUT THE INTERNAL WORKINGS OF A CHIP BASED ON ELECTRO-MAGNETIC EMISSIONS THEREFROM 审中-公开
公开(公告)号：WO2007056226A3
公开(公告)日：2007-05-18
申请号：PCT/US2006/043101
申请日：2006-11-03
申请人： HUIE, John
发明人： HUIE, John
IPC分类号： G01R31/311
摘要： A novel a method for determining the internal operation of an integrated circuit (102) 5 includes measuring electromagnetic (EM) emissions from the integrated circuit chip (102) and analyzing the EM emissions using an RF close end probe (108). The emissions are measured while the IC (102) is provided with power and any external clock signal( 110).

2. 发明申请

WO2008118343A1 ANALOG-TO-DIGITAL CONVERTER SYSTEM WITH INCREASED SAMPLING FREQUENCY 审中-公开
标题翻译：具有增加采样频率的模数转数转换器系统
公开(公告)号：WO2008118343A1
公开(公告)日：2008-10-02
申请号：PCT/US2008/003693
申请日：2008-03-20
申请人： VNS PORTFOLIO LLC , MOORE, Charles, H. , SNIVELY, Leslie, O. , HUIE, John
发明人： MOORE, Charles, H. , SNIVELY, Leslie, O. , HUIE, John
IPC分类号： H03M1/12
CPC分类号： H03M1/1245 , H03M1/1215 , H03M1/60
摘要： The present invention is an improvement in sampling a high frequency input analog signal and converting it to a digital output signal. This is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using a different ADC for each sampling, wherein each sampling is sequentially offset a certain amount of time from the most recent preceding sampling. The samplings from the multitude of ADCs are combined to form a single contiguous digital output signal. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a specified permittivity material device, and a sequencer or multiplier.
摘要翻译：本发明是对高频输入模拟信号进行采样并将其转换为数字输出信号的改进。这是通过使用多个模数转换器与分布式采样系统结合来实现的。多个转换器和分布式采样系统的组合允许使用诸如0.18微米硅的常规器件处理，并且还提供非常高频率的输入信号的精确采样。分布式采样系统通过对每个采样使用不同的ADC来提供输入信号的多次采样，其中每个采样从最近的先前采样顺序地偏移一定量的时间。来自多个ADC的采样被组合以形成单个相邻的数字输出信号。分布式采样系统的类型包括串联互连的多个细长迹线图案，指定的介电常数材料器件和定序器或乘法器。

3. 发明申请

WO2008118346A3 VARIABLE SIZED APERTURE WINDOW OF AN ANALOG-TO-DIGITAL CONVERTER 审中-公开
标题翻译：模拟数字转换器的可变大小的窗口窗口
公开(公告)号：WO2008118346A3
公开(公告)日：2008-11-13
申请号：PCT/US2008003698
申请日：2008-03-20
申请人： VNS PORTFOLIO LLC , MOORE CHARLES H , SNIVELY LESLIE O , HUIE JOHN
发明人： MOORE CHARLES H , SNIVELY LESLIE O , HUIE JOHN
IPC分类号： H03M1/12
CPC分类号： H03M1/1245 , H03M1/1215 , H03M1/60
摘要： Sampling high frequency input analog signals and conversion to digital output signals accomplished using many analog-to- digital converters and distpbuted sampling system - combination allowing conventional device processing e g 0.18 micron silicon, and providing accurate sampling of very high frequency signals. Distributed sampling system provides multiple samplings of input using multiple ADCs collecting samplings, each offset by a fixed amount of time from the most recent. Each ADC has a designated CPU to obtain sufficient data transfer capabilities. Samplings from ADCs are a sepes of digital output values, possibly the result of samplings at the same or different frequencies. Distributed sampling systems include elongated trace patterns series-connected, inverter pairs series-connected, specific permittivity material device, and sequencer/multiplier. Another sampling system includes vanable-sized aperture window, width of sample pulse narrowed through vapable clock mechanism producing faster sampling rates. Vanable-sized aperture window system can be used solely, or in combination with others.
摘要翻译：采用高频输入模拟信号和转换为数字输出信号，使用许多模数转换器和分频采样系统进行组合，允许常规器件处理（例如0.18微米硅），并提供非常高频率信号的精确采样。分布式采样系统使用多个采集采样的ADC提供多个输入采样，每个采样偏移距离最近一段固定的时间。每个ADC都有一个指定的CPU来获得足够的数据传输能力。 ADC的采样是数字输出值的分辨率，可能是相同或不同频率的采样结果。分布式采样系统包括串联连接的细长迹线图案，串联连接的逆变器对，特定介电常数材料器件和定序器/倍增器。另一个采样系统包括可选尺寸的孔径窗口，采样脉冲宽度通过可变时钟机制变窄，产生较快的采样率。可拆式孔径窗系统可单独使用，也可与其他组合使用。

4. 发明申请

WO2008118346A2 VARIABLE SIZED APERTURE WINDOW OF AN ANALOG-TO-DIGITAL CONVERTER 审中-公开
标题翻译：模拟数字转换器的可变大小的窗口窗口
公开(公告)号：WO2008118346A2
公开(公告)日：2008-10-02
申请号：PCT/US2008/003698
申请日：2008-03-20
申请人： VNS PORTFOLIO LLC , MOORE, Charles, H. , SNIVELY, Leslie, O. , HUIE, John
发明人： MOORE, Charles, H. , SNIVELY, Leslie, O. , HUIE, John
IPC分类号： H03M1/12
CPC分类号： H03M1/1245 , H03M1/1215 , H03M1/60
摘要： An improvement in sampling a high frequency input analog signal and converting it to a digital output signal is disclosed. This is accomplished by using a multitude of analog- to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using multiple ADCs for multiple samplings, wherein each sampling is sequentially offset a fixed amount of time from the most recent preceding sampling. Each ADC has a designated central processing unit (CPU) to obtain sufficient data transfer capabilities. The samplings from the multitude of ADCs are a series of sequential digital output values. The digital output values could be the result of samplings all at the same frequency, or at different frequencies. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a multitude of inverter pairs interconnected in series, a specific permittivity material device, and a sequencer or multiplier. A second enhanced sampling system includes a variable sized aperture window, wherein a width of a sample pulse is narrowed through a variable clock mechanism to produce a faster sampling rate. This variable sized aperture window system can be used by itself, or in combination with any of the presently described multiple ADC distributed sampling systems.
摘要翻译：公开了对高频输入模拟信号进行采样并将其转换为数字输出信号的改进。这是通过使用多个模数转换器与分布式采样系统结合来实现的。多个转换器和分布式采样系统的组合允许使用诸如0.18微米硅的常规器件处理，并且还提供非常高频率的输入信号的精确采样。分布式采样系统通过对多个采样使用多个ADC来提供输入信号的多次采样，其中每个采样从最近的先前采样顺序地偏移固定的时间量。每个ADC都有一个指定的中央处理单元（CPU），以获得足够的数据传输能力。来自多个ADC的采样是一系列顺序数字输出值。数字输出值可能是以相同频率或不同频率进行采样的结果。分布式采样系统的类型包括串联互连的多个细长迹线图案，串联互连的多个逆变器对，特定介电常数材料器件和定序器或乘法器。第二增强采样系统包括可变大小的孔径窗口，其中采样脉冲的宽度通过可变时钟机构变窄以产生更快的采样率。该可变尺寸的孔径窗系统可以自身使用，或与任何目前描述的多个ADC分布式采样系统组合使用。

5. 发明申请

WO2007056226A2 METHOD FOR DETERMINING INFORMATION ABOUT THE INTERNAL WORKINGS OF A CHIP BASED ON ELECTRO-MAGNETIC EMISSIONS THEREFROM 审中-公开
标题翻译：用于确定基于电磁辐射的芯片内部工作信息的方法
公开(公告)号：WO2007056226A2
公开(公告)日：2007-05-18
申请号：PCT/US2006043101
申请日：2006-11-03
申请人： HUIE JOHN
发明人： HUIE JOHN
IPC分类号： G01R31/311
CPC分类号： G01R31/002 , G01R31/31727
摘要： A novel a method for determining the internal operation of an integrated circuit (IC) includes measuring electromagnetic (EM) emissions from the integrated circuit chip and analyzing the EM emissions. In a particular method, the EM emissions from the IC are measured using an RF close end probe. In a particular method, the electromagnetic emissions are measured with the IC configured in various ways. In the normal operating mode, the emissions are measured while the IC is provided with power and any external clock signal(s). After measuring the emissions of the IC in normal operating mode, the IC is reconfigured by disabling the external clock signal(s) to the IC and remeasuring the emissions. The external clock signal is disabled by disconnecting the power to the IC, disabling the external clock signal, and then reconnecting power to the IC. In yet a third test mode, the external clock signal is reenabled while power continues to be supplied to the IC. Information about the presence and/or proper functioning of internal clocks of the IC can be determined by analyzing the spectral scan data obtained in one or more of the three test modes.
摘要翻译：用于确定集成电路（IC）的内部操作的新颖方法包括测量来自集成电路芯片的电磁（EM）发射并分析EM发射。在特定的方法中，使用RF近端探针测量IC的EM发射。在一种特定的方法中，电磁辐射是用各种方式配置的IC来测量的。在正常工作模式下，在IC提供电源和任何外部时钟信号时测量发射。在正常工作模式下测量IC的发射后，通过禁用IC的外部时钟信号和重新测量发射来重新配置IC。通过断开IC的电源，禁用外部时钟信号，然后重新连接IC的电源来禁用外部时钟信号。在第三种测试模式下，外部时钟信号在电源继续提供给IC时被重新使能。可以通过分析在三个测试模式中的一个或多个获得的光谱扫描数据来确定关于IC的内部时钟的存在和/或正常功能的信息。

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