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1. 发明申请

WO2005031329A1 IN-SITU X-RAY DIFFRACTION SYSTEM USING SOURCES AND DETECTORS AT FIXED ANGULAR POSITIONS 审中-公开
标题翻译：在固定角度位置使用源和检测器的现场X射线衍射系统
公开(公告)号：WO2005031329A1
公开(公告)日：2005-04-07
申请号：PCT/US2004/025112
申请日：2004-08-04
申请人： X-RAY OPTICAL SYSTEMS, INC. , GIBSON, David M. , GIBSON, Walter M. , HUANG, Huapeng
发明人： GIBSON, David M. , GIBSON, Walter M. , HUANG, Huapeng
IPC分类号： G01N23/20
CPC分类号： G01N23/207 , G01N23/20
摘要： An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation - with a collimating optic disposed with respect to the fixed source for producing a substantially parallel beam of x-ray radiation by receiving and redirecting the divergent paths of the divergent x-ray radiation. A first x-ray detector collects radiation diffracted from the sample; wherein the source and detector are fixed, during operation thereof, in position relative to each other and in at least one dimension relative to the sample according to a-priori knowledge about the known characteristic of the sample. A second x-ray detector may be fixed relative to the first x-ray detector according to the a-priori knowledge about the known characteristic of the sample, especially in a phase monitoring embodiment of the present invention.
摘要翻译：用于测量原位状态的材料的样品的已知特性的x射线衍射技术。该技术包括使用x射线源发射基本上发散的X射线辐射 - 通过相对于固定源布置的准直光学器件，用于通过接收和重定向发散的发散路径来产生基本上平行的X射线束 x射线辐射。第一x射线检测器收集从样品衍射的辐射; 其中所述源和检测器在其操作期间相对于彼此处于固定的位置，并且相对于所述样品在至少一个维度中根据关于样品的已知特征的先验知识而被固定。根据关于样品的已知特征的先验知识，第二X射线检测器可相对于第一x射线检测器固定，特别是在本发明的相位监测实施例中。

2. 发明申请

WO02103710A2 WAVELENGTH DISPERSIVE XRF SYSTEM USING FOCUSING OPTIC FOR EXCITATION AND A FOCUSING MONOCHROMATOR FOR COLLECTION 审中-公开
标题翻译：使用聚焦光的波长散射XRF系统和用于收集的聚焦单色器
公开(公告)号：WO02103710A2
公开(公告)日：2002-12-27
申请号：PCT/US0219272
申请日：2002-06-18
申请人： X RAY OPTICAL SYS INC , CHEN ZEWU , GIBSON DAVID M
发明人： CHEN ZEWU , GIBSON DAVID M
IPC分类号： G01T1/36 , G01N23/223 , G21K1/00 , G21K1/06 , G21K4/00
CPC分类号： G21K1/062 , B82Y10/00 , G01N23/223 , G01N2223/076 , G21K1/06 , G21K2201/064
摘要： X-ray fluorescence (XRF) spectroscopy systems and methods are provided. One system (100) includes a source (110) of x-ray radiation and an excitation optic (120) disposed between the x-ray radiation source (110) and the sample (130) for collecting x-ray radiation from the source and focusing the x-ray radiation to a focal point on the sample to incite at least one analyte in the sample to fluoresce. The system (100) further includes an x-ray fluorescence detector (150) and a collection optic (140) comprising a doubly curved diffracting optic disposed between the sample and the x-ray fluorescence detector for collecting x-ray fluorescence from the focal point on the sample and focusing the fluorescent x-rays towards the x-ray fluorescence detector.
摘要翻译：提供X射线荧光（XRF）光谱系统和方法。一个系统（100）包括x射线辐射源（110）和设置在x射线辐射源（110）和样品（130）之间的激发光学器件（120），用于从源收集X射线辐射，将x射线辐射聚焦到样品上的焦点，以煽动样品中的至少一种分析物发荧光。系统（100）还包括x射线荧光检测器（150）和收集光学元件（140），其包括设置在样品和x射线荧光检测器之间的双曲面衍射光学器件，用于从焦点收集X射线荧光并将荧光X射线对准X射线荧光检测器。

3. 发明申请

WO2008097345A3 WIDE PARALLEL BEAM DIFFRACTION IMAGING METHOD AND SYSTEM 审中-公开
标题翻译：宽平行光束成像方法与系统
公开(公告)号：WO2008097345A3
公开(公告)日：2008-12-24
申请号：PCT/US2007075682
申请日：2007-08-10
申请人： X RAY OPTICAL SYS INC , HUANG HUAPENG , GIBSON DAVID M
发明人： HUANG HUAPENG , GIBSON DAVID M
IPC分类号： G01N23/20
CPC分类号： G01N23/20
摘要： An x-ray diffraction technique (apparatus, method and program products) for measuring crystal structure from a large sample area. The measurements are carried out using a large size collimating optic (up to 25 mm or more in diameter or corresponding cross-section) along with a 2-dimensional x-ray image detector. The unique characteristics of polycapillary collimating optics enable an efficient x-ray diffraction system (either low power or high power) to measure a large portion (or even the whole sample surface area) of the sample to obtain critical crystal structure information, such as the orientation of the whole sample, defects in the crystal, the presence of a secondary crystal, etc. Real-time, visual monitoring of the detected diffraction patterns is also provided. Turbine blade crystal structure measurement examples are disclosed.
摘要翻译：用于从大样品区域测量晶体结构的x射线衍射技术（装置，方法和程序产品）。使用大尺寸准直光学元件（直径高达25mm或更大或相应的横截面）以及二维x射线图像检测器进行测量。多毛细管准直光学器件的独特特征使得能够有效的x射线衍射系统（低功率或高功率）测量样品的大部分（或甚至整个样品表面积）以获得关键的晶体结构信息，例如整个样品的取向，晶体缺陷，二次晶体的存在等。还提供对所检测的衍射图案的实时，可视化监测。公开了涡轮叶片晶体结构测量实例。

4. 发明申请

WO2009111454A1 XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNED PACKAGE 审中-公开
标题翻译：具有多个激活能量的XRF系统在高度对齐的包装
公开(公告)号：WO2009111454A1
公开(公告)日：2009-09-11
申请号：PCT/US2009/035847
申请日：2009-03-03
申请人： X-RAY OPTICAL SYSTEMS, INC , CHEN, Zewu , GIBSON, David M. , GIBSON, Walter M. , BURDETT, John H. Jr. , BAILEY, Adam , SEMKEN, R. Scott , XIN, Kai
发明人： CHEN, Zewu , GIBSON, David M. , GIBSON, Walter M. , BURDETT, John H. Jr. , BAILEY, Adam , SEMKEN, R. Scott , XIN, Kai
IPC分类号： H01J37/252 , G01N23/225
CPC分类号： G21K1/06 , G01N23/20008 , G01N23/223 , G01N2223/076 , G01N2223/1003 , G01N2223/315 , G01N2223/423 , G21K2201/062 , G21K2201/064 , H05G1/04
摘要： An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
摘要翻译：一种用X射线束照射样品斑点的X射线分析装置。提供具有源极点的X射线管，从该源点产生具有特征的第一能量和bre致辐射能量的发散X射线束; 第一x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时对光束进行单色; 并且第二x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时将光束单色为第二能量。第一个X射线光学元件可以对来自源点的特征能量进行单色化，而第二个X射线光学元件可以从源点单色bre致辐射能量。 x射线光学元件可以是弯曲的衍射光学器件，用于从X射线管接收发散的X射线束并将光束聚焦在样品点。还提供检测以检测和测量例如包括玩具和电子产品在内的制造产品中的各种毒素。

5. 发明申请

WO2005010512A1 METHOD AND SYSTEM FOR X-RAY DIFFRACTION MEASUREMENTS USING AN ALIGNED SOURCE AND DETECTOR ROTATING AROUND A SAMPLE SURFACE 审中-公开
标题翻译：使用对准源和检测器在样品表面旋转的X射线衍射测量的方法和系统
公开(公告)号：WO2005010512A1
公开(公告)日：2005-02-03
申请号：PCT/US2004/023774
申请日：2004-07-16
申请人： X-RAY OPTICAL SYSTEMS, INC. , SUPERPOWER, INC. , GIBSON, David M. , GIBSON, Walter M. , HUANG, Huapeng , REEVES, Jodi, Lynn
发明人： GIBSON, David M. , GIBSON, Walter M. , HUANG, Huapeng , REEVES, Jodi, Lynn
IPC分类号： G01N23/207
CPC分类号： G01N23/207
摘要： An x-ray diffraction measurement apparatus for measuring a sample, having an x-ray source and detector coupled together in a combination for coordinated rotation around the sample, such that x-ray diffraction data can be taken at multiple phi angles. The apparatus may provide a pole figure representation of crystal orientation of the sample, wherein the pole figure represents the crystal alignment, and a full width half maximum value is calculated from the pole figure for crystal alignment quantification. Data may be taken at discrete positions along a length of the sample, and the sample is in a fixed position during measuring; or data may be taken continuously along a length of the article, as the sample continuously moves along its length in a movement path between the source and detector. The sample may be in the form of a tape, linearly passing through a measurement zone.
摘要翻译：一种用于测量样品的x射线衍射测量装置，其具有以组合的方式耦合在一起的x射线源和检测器，以便围绕样品进行协调旋转，使得可以以多个角度拍摄X射线衍射数据。该装置可以提供样品的晶体取向的极图表示，其中极图表示晶体对准，并且从用于晶体取向定量的极数计算全宽半最大值。数据可以沿着样品长度的离散位置进行，并且样品在测量期间处于固定位置; 或者随着样品在源和检测器之间的运动路径中连续地沿其长度移动，可以沿物品的长度连续地取走数据。样品可以是带状的，线性地通过测量区域的形式。

6. 发明申请

WO2002103710A3 WAVELENGTH DISPERSIVE XRF SYSTEM USING FOCUSING OPTIC FOR EXCITATION AND A FOCUSING MONOCHROMATOR FOR COLLECTION 审中-公开
公开(公告)号：WO2002103710A3
公开(公告)日：2002-12-27
申请号：PCT/US2002/019272
申请日：2002-06-18
申请人： X-RAY OPTICAL SYSTEMS, INC. , CHEN, Zewu , GIBSON, David, M.
发明人： CHEN, Zewu , GIBSON, David, M.
IPC分类号： G21K1/06
摘要： X-ray fluorescence (XRF) spectroscopy systems and methods are provided. One system (100) includes a source (110) of x-ray radiation and an excitation optic (120) disposed between the x-ray radiation source (110) and the sample (130) for collecting x-ray radiation from the source and focusing the x-ray radiation to a focal point on the sample to incite at least one analyte in the sample to fluoresce. The system (100) further includes an x-ray fluorescence detector (150) and a collection optic (140) comprising a doubly curved diffracting optic disposed between the sample and the x-ray fluorescence detector for collecting x-ray fluorescence from the focal point on the sample and focusing the fluorescent x-rays towards the x-ray fluorescence detector.

7. 发明申请

WO2008097345A2 WIDE PARALLEL BEAM DIFFRACTION IMAGING METHOD AND SYSTEM 审中-公开
标题翻译：宽光束衍射成像方法及系统
公开(公告)号：WO2008097345A2
公开(公告)日：2008-08-14
申请号：PCT/US2007/075682
申请日：2007-08-10
申请人： X-RAY OPTICAL SYSTEMS, INC. , HUANG, Huapeng , GIBSON, David, M.
发明人： HUANG, Huapeng , GIBSON, David, M.
IPC分类号： G01N23/207
CPC分类号： G01N23/20
摘要： An x-ray diffraction technique (apparatus, method and program products) for measuring crystal structure from a large sample area. The measurements are carried out using a large size collimating optic (up to 25 mm or more in diameter or corresponding cross-section) along with a 2-dimensional x-ray image detector. The unique characteristics of polycapillary collimating optics enable an efficient x-ray diffraction system (either low power or high power) to measure a large portion (or even the whole sample surface area) of the sample to obtain critical crystal structure information, such as the orientation of the whole sample, defects in the crystal, the presence of a secondary crystal, etc. Real-time, visual monitoring of the detected diffraction patterns is also provided. Turbine blade crystal structure measurement examples are disclosed.
摘要翻译：用于从大样品区域测量晶体结构的X射线衍射技术（设备，方法和程序产品）。使用大尺寸准直光学器件（直径高达25mm或更多，或相应的横截面）以及2维X射线图像检测器进行测量。多毛细管准直光学器件的独特特性使得能够有效的X射线衍射系统（低功率或高功率）来测量样品的大部分（或者甚至整个样品表面积）以获得关键的晶体结构信息，例如整个样品的取向，晶体中的缺陷，次级晶体的存在等。还提供了对检测到的衍射图案的实时视觉监测。披露了涡轮叶片晶体结构测量实例。

8. 发明申请

WO2003081222A1 SCREENING OF COMBINATORIAL LIBRARY USING X-RAY ANALYSIS 审中-公开
标题翻译：使用X射线分析筛选组合图书馆
公开(公告)号：WO2003081222A1
公开(公告)日：2003-10-02
申请号：PCT/US2002/008434
申请日：2002-03-19
申请人： X-RAY OPTICAL SYSTEMS, INC. , NICOLICH, Jeffrey, P. , GIBSON, David, M.
发明人： NICOLICH, Jeffrey, P. , GIBSON, David, M.
IPC分类号： G01N23/207
CPC分类号： G01N23/223 , G01N23/207 , G01N2223/076 , G21K1/06
摘要： An x-ray apparatus and method are presented for controlling x-rays to analyze combinatorial libraries for the rapid screening of different materials and different conditions. The apparatus includes a laboratory x-ray source, one or more x-ray optics, a combinatorial library, and a detector such as an x-ray detector or an electron energy detector. The apparatus can be used to perform analytical measurements on individual members of the library, where the measurements may comprise x-ray fluorescence, x-ray diffraction, total reflection x-ray fluorescent spectrometry, and/or extended x-ray absorption fine structure.
摘要翻译：提出了一种用于控制x射线以分析组合文库用于快速筛选不同材料和不同条件的X射线装置和方法。该装置包括实验室X射线源，一个或多个x射线光学器件，组合库和诸如x射线检测器或电子能量检测器的检测器。该装置可以用于对文库的各个成员进行分析测量，其中测量可以包括x射线荧光，x射线衍射，全反射x射线荧光光谱法和/或扩展的x射线吸收精细结构。

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