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1. 发明申请

WO2021118773A1 MEASUREMENT OF METAL OR ALLOY COATING 审中-公开
公开(公告)号：WO2021118773A1
公开(公告)日：2021-06-17
申请号：PCT/US2020/060954
申请日：2020-11-18
申请人： SCHLUMBERGER TECHNOLOGY CORPORATION , SCHLUMBERGER CANADA LIMITED , SERVICES PETROLIERS SCHLUMBERGER , SCHLUMBERGER TECHNOLOGY B.V.
发明人： GEDDES, Jill, F. , HUGHES, Trevor, Lloyd , BARMATOV, Evgeny, Borisovich
IPC分类号： G01N23/207 , C23C2/06 , C21D9/52
摘要： A method for measuring average thickness of a metal or alloy coating on a metal or alloy substrate using an X-ray fluorescence (XRF) spectrometer is used when the coating has an uneven surface at different distances from a measurement window of the XRF spectrometer. The method includes measuring elemental composition of the coating or substrate using the XRF spectrometer and obtaining the average thickness of the coating using a calibration relationship between coating thickness and elemental composition of the coating or substrate. The metal or alloy coating may be a metal or alloy coating of a plurality of outer armor wires wrapped around a cable. The method may be used to analyze coating thickness changes over time or along the length of the cable, or to analyze a corrosive environment in order to choose optimal material for a metal or alloy coating.

2. 发明申请

WO2021007590A1 DEVICES AND METHODS FOR DETECTING ELEMENTS IN A SAMPLE 审中-公开
公开(公告)号：WO2021007590A1
公开(公告)日：2021-01-14
申请号：PCT/US2020/070243
申请日：2020-07-07
申请人： THERMO SCIENTIFIC PORTABLE ANALYTICAL INSTRUMENTS INC.
发明人： CARIA, Pietro , DUGAS, Michael , TULLY, Gregory , SHEFSKY, Stephen
IPC分类号： G01N15/02 , G01N23/223 , G01N23/207
摘要： Devices and methods are disclosed for identifying compounds using spectra generated by X-rays at two different voltage levels.

3. 发明申请

WO2020105726A1 単結晶Ｘ線構造解析装置用試料ホルダ、試料ホルダユニットおよび吸蔵方法审中-公开
公开(公告)号：WO2020105726A1
公开(公告)日：2020-05-28
申请号：PCT/JP2019/045700
申请日：2019-11-21
申请人：株式会社リガク
发明人：佐藤　孝
IPC分类号： G01N23/20025 , G01N23/205 , G01N23/207 , G01N1/28
摘要：結晶スポンジへの試料の吸蔵を迅速かつ容易に行うことで、単結晶Ｘ線構造解析を迅速、かつ正確に行うことができる試料ホルダ、試料ホルダユニットおよび吸蔵方法を提供する。単結晶Ｘ線構造解析装置において使用する試料ホルダであって、前記単結晶Ｘ線構造解析装置のゴニオメータに取り付けられる基台部と、前記基台部に形成され、内部に形成された複数の微細孔に前記試料を吸蔵可能な細孔性錯体結晶を保持する試料保持部と、前記基台部に形成され、前記細孔性錯体結晶に吸蔵させるための前記試料を導入する試料導入構造と、を備える。

4. 发明申请

WO2019006102A1 SYSTEM AND METHOD FOR IN-SITU X-RAY DIFFRACTION-BASED REAL-TIME MONITORING OF MICROSTRUCTURE PROPERTIES OF PRINTING OBJECTS 审中-公开
公开(公告)号：WO2019006102A1
公开(公告)日：2019-01-03
申请号：PCT/US2018/039969
申请日：2018-06-28
申请人： UNIVERSITY OF MARYLAND COLLEGE PARK , ADVANCED ANALYZER LABS, INC.
发明人： ZAVALIJ, Peter , HUANG, Huapeng , SCHULTHEIS, Lester, W.
IPC分类号： G01N23/207 , G01N23/02 , G01N23/205 , G01N23/2055 , G01N23/223 , H01Q15/02
CPC分类号： G01N23/2055 , G01N23/20008 , G01N2223/611
摘要： The system for in-situ real-time measurements of micro structure properties of 3D-printing objects during 3-D printing processes. An intensive parallel X-ray beam (with an adjustable beam size) impinges on a printing object and is diffracted on a crystal lattice of the printing material. The diffracted radiation impinges on a reflector formed with an array of reflector crystals mounted on an arcuated substrate. The diffracted beams reflected from the reflector crystals correspond to the diffraction intensity peaks produced by interaction of the crystal lattice of the printing material with the impinging X-ray beam. The intensities of the diffraction peaks are observed by detectors which produce corresponding output signals, which are processed to provide critical information on the crystal phase composition, which is closely related to the defects and performance of the printing objects. The subject in-situ technology provides an effective and efficient way to monitor, in real-time, the quality of 3D-printing parts during the 3-D printing process, with a significant potential for effective process control based on the reliable micro structure feedback.

5. 发明申请

WO2018221929A1 이차 전지용 전극의 기공 분포 측정 방법 审中-公开
公开(公告)号：WO2018221929A1
公开(公告)日：2018-12-06
申请号：PCT/KR2018/006076
申请日：2018-05-29
申请人： 주식회사 엘지화학
发明人： 한정훈
IPC分类号： G01N23/207 , G01N1/30 , G01N1/04 , H01M4/13 , H01M4/02 , G01N1/28
摘要： 본 발명은 이차 전지용 전극 내부의 기공 분포를 용이하게 측정할 수 있는 이차 전지용 전극의 기공 분포 측정 방법을 제공한다.

6. 发明申请

WO2018217793A1 3D PRINTED MICROFLUIDIC MIXERS AND NOZZLES FOR CRYSTALLOGRAPHY 审中-公开
公开(公告)号：WO2018217793A1
公开(公告)日：2018-11-29
申请号：PCT/US2018/033944
申请日：2018-05-22
申请人： ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
发明人： ROS, Alexandra , BREHM, Gerrit , NELSON, Garrett , SPENCE, John , WEIERSTALL, Uwe , ECHELMEIER, Austin
IPC分类号： G01N23/20008 , G01N23/20025 , G01N23/2005 , G01N23/207 , B01L3/00
摘要： A 3D printed hybrid nozzle device combining a microfluidic mixer with a liquid jet injector that addresses the bottleneck of investigating substrate-initiated biological reaction paths employing serial crystallography with XFELs. The hybrid nozzle provides for injecting aqueous protein crystal jets after fast mixing (

7. 发明申请

WO2018211664A1 Ｘ線分光分析装置审中-公开
公开(公告)号：WO2018211664A1
公开(公告)日：2018-11-22
申请号：PCT/JP2017/018701
申请日：2017-05-18
申请人：株式会社島津製作所
发明人：佐藤　賢治 , 和泉　拓朗
IPC分类号： G01N23/223 , G01N23/207
摘要：試料Ｓの照射領域Ａに励起線を照射する励起源１２と、照射領域Ａに面して設けられた回折部材１４と、照射領域Ａと回折部材１４の間に設けられた、照射領域Ａ及び回折部材１４の所定の面に平行なスリットを有するスリット部材１３と、スリットの長手方向に垂直な方向に複数の検出素子が配列されてなる光入射面を有するＸ線リニアセンサ１５と前記長手方向に垂直な面内で前記回折部材を移動させることにより、前記試料表面と前記所定の面の成す角度、又は／及び前記試料表面と前記所定の面の間の距離を変更する第１移動機構と、前記長手方向に垂直な面内で前記Ｘ線リニアセンサを移動させることにより、前記スリットを通過して前記所定の面で回折された特性Ｘ線の経路上に該Ｘ線リニアセンサを位置させる第２移動機構とを備えるＸ線分光分析装置。

8. 发明申请

WO2018209381A1 METHOD AND APPARATUS FOR ANALYSING PARTICULATE MATERIAL 审中-公开
公开(公告)号：WO2018209381A1
公开(公告)日：2018-11-22
申请号：PCT/AU2018/050447
申请日：2018-05-11
申请人： FCT ACTECH PTY LTD
发明人： STORER, Peter, J. , ABSALOM, Nick, P. , RAPSON, David, S. , IANCU, Bogdan, A. , MARSCHALL, Simon, G.
IPC分类号： G01N23/207
摘要： A method and apparatus for analysing particulate material having one or more crystalline substances, the apparatus including: a grinder for receiving a sample extracted from the particulate material and grinding the sample into powdered material having a designated particle size; a measurement station including an X-ray generator for illuminating the powdered material with an X-ray beam and an X-ray detector for detecting X-ray diffraction patterns from the powdered material; a carrier for receiving the powdered material from the grinder and conveying the powdered material through the measurement station; and a processor configured to: receive the X-ray diffraction patterns of the powdered material from the X-ray detector; analyse the X-ray diffraction patterns to determine a series of sequential composition determinations of one or more crystalline substances in the powdered material as the carrier conveys the powdered material through the measurement station; and determine composition of the one or more crystalline substances in the sample from the series of sequential composition determinations.

9. 发明申请

WO2018128988A1 X-RAY ZOOM LENS FOR SMALL ANGLE X-RAY SCATTEROMETRY 审中-公开
公开(公告)号：WO2018128988A1
公开(公告)日：2018-07-12
申请号：PCT/US2018/012086
申请日：2018-01-02
申请人： KLA-TENCOR CORPORATION
发明人： ARTEMIEV, Nikolay , FRIEDMANN, Michael
IPC分类号： G01N23/207 , G01B15/00
摘要： Methods and systems for controlling illumination beam spot size for Transmission, Small-Angle X-ray Scatterometry (T-SAXS) measurements of different sized metrology targets are described herein. An X-ray illumination optics subsystem includes one or more focusing optical elements with object and image planes at fixed locations and one or more illumination apertures or slits that independently control magnification and beam divergence. In a further aspect, the illumination source size and shape is controlled, along with magnification and beam divergence. In this manner, beam divergence and illumination, spot size on a specimen are independently controlled, while maintaining constant illumination flux.

10. 发明申请

WO2018101133A1 蛍光Ｘ線分析装置审中-公开
公开(公告)号：WO2018101133A1
公开(公告)日：2018-06-07
申请号：PCT/JP2017/041896
申请日：2017-11-21
申请人：株式会社リガク
发明人：迫　幸雄
IPC分类号： G01N23/223 , G01N23/207
摘要：本発明は、簡素な構造を有し、高精度な分析を迅速に行うことが可能な蛍光Ｘ線分析装置を提供することを目的とする。本発明の蛍光Ｘ線分析装置は、試料（１０３）に１次Ｘ線を照射するＸ線源（１００）と、試料（１０３）から発生した２次Ｘ線を分光する分光素子（１２０）と、２次Ｘ線の強度を測定するエネルギー分散型の検出器（１１０）と、分光素子（１２０）を２次Ｘ線の経路から退避する退避機構（１０８）と、分光素子（１２０）が退避された状態で２次Ｘ線を測定する副測定領域（１２４）と、分光された２次Ｘ線を測定する主測定領域（１２２）との間で検出器（１１０）を連続的に移動する走査機構（１１４）と、副測定領域（１２４）で測定されたバックグラウンド強度と主測定領域（１２２）で測定されたバックグラウンド強度との比率を予め記憶する記憶装置（１１６）と、主測定領域（１２２）での測定強度から副測定領域（１２４）でのバックグラウンド強度に前記比率を乗じた値を差し引く補正をし、定量分析を行う演算装置（１１８）とを有する。

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