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    • 3. 发明申请
    • METHOD AND SYSTEM FOR FASTENING COMPONENTS USED IN PLASMA PROCESSING
    • 用于压缩等离子体加工中使用的组分的方法和系统
    • WO2005103507A1
    • 2005-11-03
    • PCT/US2005/003023
    • 2005-01-27
    • TOKYO ELECTRON LIMITEDFINK, Steven, T.
    • FINK, Steven, T.
    • F16B21/00
    • F16B21/02F16B5/10
    • A fastening component for fastening together a first component and a second component used in a plasma processing tool. The fastening component includes a first surface configured to be exposed to plasma processing performed in the plasma processing tool, and a second surface configured to contact the first component. Also included is a stem extending from the second surface and configured to at least partially protrude through the first component and the second component. The fastening component further includes a locking pin extending from at least one side of the stem and configured to contact the second component. The first surface, the second surface, the stem, and/or locking pin are made of or coated with a material that is highly resistant to erosion resulting from plasma processing.
    • 用于将第一部件和用于等离子体处理工具中的第二部件紧固在一起的紧固部件。 紧固部件包括构造成暴露于等离子体处理工具中执行的等离子体处理的第一表面和被配置为接触第一部件的第二表面。 还包括从第二表面延伸并构造成至少部分地突出穿过第一部件和第二部件的杆。 紧固部件还包括从杆的至少一侧延伸并构造成接触第二部件的锁定销。 第一表面,第二表面,杆和/或锁定销由对等离子体处理产生的侵蚀高度抵抗的材料制成或涂覆。
    • 6. 发明申请
    • PLASMA PROCESSING SYSTEM AND METHOD
    • 等离子体处理系统和方法
    • WO2004095502A2
    • 2004-11-04
    • PCT/US2004/001406
    • 2004-01-21
    • TOKYO ELECTRON LIMITEDFINK, Steven, T.MOROZ, PaulSTRANG, Eric, J.MITROVIC, Andrej, S.
    • FINK, Steven, T.MOROZ, PaulSTRANG, Eric, J.MITROVIC, Andrej, S.
    • H01J37/00
    • H01J37/3244H01J2237/022
    • A plasma processing system includes a chamber containing a plasma processing region and a chuck constructed and arranged to support a substrate within the chamber in the processing region. The plasma processing system further includes at least one gas injection passage in communication with the chamber and configured to facilitate removal of particles from the chamber by passing purge gas therethrough. In one embodiment, the plasma processing system can include an electrode configured to attract or repel particles in the chamber by electrostatic force when the electrode is biased with DC or RF power. A method of processing a substrate in a plasma processing system includes removing particles in a chamber of the plasma processing system by supplying purge gas through at least one gas injection passage in communication with the chamber.
    • 等离子体处理系统包括包含等离子体处理区域的腔室和构造和布置成在处理区域内的腔室内支撑衬底的卡盘。 等离子体处理系统还包括至少一个与室连通的气体注入通道,并且构造成便于通过吹扫气体从腔室中除去颗粒。 在一个实施例中,等离子体处理系统可以包括电极,其被配置为当电极用DC或RF功率偏置时通过静电力吸引或排斥腔室中的颗粒。 一种在等离子体处理系统中处理衬底的方法,包括通过与室连通的至少一个气体注入通道供应净化气体来去除等离子体处理系统的腔室中的颗粒。
    • 10. 发明申请
    • VERTICALLY TRANSLATABLE CHUCK ASSEMBLY AND METHOD FOR A PLASMA REACTOR SYSTEM
    • 垂直翻转卡盘组件及等离子体反应器系统的方法
    • WO2002059933A2
    • 2002-08-01
    • PCT/US2001/048851
    • 2001-12-20
    • TOKYO ELECTRON LIMITEDJOHNSON, Wayne, L.FINK, Steven, T.BROWNING, JeffJEVTIC, Jovan
    • JOHNSON, Wayne, L.FINK, Steven, T.BROWNING, JeffJEVTIC, Jovan
    • H01J37/00
    • H01L21/67069H01J37/32082H01J37/32174
    • A chuck assembly (110) for supporting a workpiece (116) within a plasma reactor chamber (60) having sidewalls (64) surrounding an interior region (65) capable of supporting a plasma. The assembly includes a chuck base (130) and a plurality of support arms (150A-150C) extending outwardly from the chuck base perimeter to the chamber sidewalls. The support arms are adapted to support the chuck base within the interior region, while also being adapted to provide a path for mechanically, electrically, pneumatically and/or fluidly communicating with the chuck assembly from outside the chamber. The chuck assembly includes a workpiece support member (160) arranged above the chuck base, capable of supporting the workpiece and serving as a chuck electrode. The workpiece support member is supported by one or more vertical translation member (168) arranged between and operatively connected to the chuck base and the workpiece support member. The chuck assembly includes a match network (180MN), wherein at least a portion of the match network is mounted directly to the workpiece support member. The use of the support arms allows for the positioning of a vacuum pump system (250) directly beneath the chuck assembly.
    • 一种用于在等离子体反应室(60)内支撑工件(116)的卡盘组件(110),其具有围绕能够支撑等离子体的内部区域(65)的侧壁(64)。 该组件包括卡盘基部(130)和从卡盘基部周边向腔室侧壁向外延伸的多个支撑臂(150A-150C)。 支撑臂适于在内部区域内支撑卡盘基座,同时还适于提供从腔室外部与卡盘组件机械地,电气地,气动地和/或流体地连通的路径。 卡盘组件包括布置在卡盘基座上方的工件支撑构件(160),其能够支撑工件并用作卡盘电极。 工件支撑构件由一个或多个垂直移动构件(168)支撑,垂直移动构件(168)布置在卡盘基部和工件支撑构件之间并且可操作地连接至卡盘基部和工件支撑构件 卡盘组件包括匹配网络(180MN),其中匹配网络的至少一部分直接安装到工件支撑构件。 支撑臂的使用允许将真空泵系统(250)定位在卡盘组件的正下方。