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    • 2. 发明申请
    • PROBE BLOCK
    • 探测块
    • WO2012099405A2
    • 2012-07-26
    • PCT/KR2012/000461
    • 2012-01-19
    • PRO-2000 Co. LTD.CHO, Jun SooPARK, Jong Hyun
    • CHO, Jun SooPARK, Jong Hyun
    • G01R1/067G01R31/28
    • G01R1/07342G01R1/06705
    • A probe block for testing a panel including one or more rows of pads is provided. The probe block includes a body block configured to be coupled to a bottom surface of a manipulator and vertically move by means of elasticity; a pressurizing block configured to be coupled to a bottom surface of the body block and have one or more pressurizing blocks protruding from a bottom surface; and a sheet configured to be coupled to a bottom surface of the pressurizing unit and have electrode lines arranged thereon so as to contact the pads for testing the panel, wherein each of the one or more pressurizing units is located at a position corresponding to a contacting portion between each of the electrode lines of the sheet and a corresponding row of pads of the panel.
    • 提供了用于测试包括一排或多排衬垫的面板的探针块。 探针块包括被构造成联接到操纵器的底表面并且通过弹性而垂直移动的主体块; 加压块,其构造成联接到所述主体块的底表面,并且具有从底表面突出的一个或多个加压块; 以及被配置为联接到所述加压单元的底表面并且具有布置在其上的电极线以与所述垫接触以测试所述面板的片材,其中所述一个或多个加压单元中的每一个位于对应于接触的位置 片材的每个电极线和面板的相应排的衬垫之间的部分。
    • 8. 发明申请
    • PROBE BLOCK
    • 探测块
    • WO2012099383A3
    • 2012-11-22
    • PCT/KR2012000415
    • 2012-01-18
    • PRO 2000 CO LTDCHO JUN SOOPARK JONG HYUN
    • CHO JUN SOOPARK JONG HYUN
    • G01R1/067G01R31/28
    • G01R1/06705G01R1/07342
    • A probe block for testing a panel including a plurality of rows of pads is provided. The probe block includes a body block configured to have a bottom surface inclined downward in a direction to contact the panel; a plurality of leaf springs configured to be stacked stepwise on the bottom surface of the body block, to have ends protruding outward more than an end of the body block 110 and having bottom surfaces located on the same plane and to have elasticity; and a sheet configured to be coupled to the leaf springs while enclosing ends of the leaf springs and to have electrode lines arranged on an insulating film so as to contact the pads for testing the panel, wherein each of the leaf springs exerts an elastic force and a pressure to a contacting portion between corresponding electrode lines of the sheet and a corresponding row of pads of the panel.
    • 提供了用于测试包括多排衬垫的面板的探针块。 所述探针块包括被构造成具有在与所述面板接触的方向上向下倾斜的底面的主体块; 多个板簧构造成在所述主体块的底面上逐步层叠,使得端部比所述主体块110的端部向外突出,并且具有位于同一平面上的底面并具有弹性; 以及片材,其构造成在包围板簧的端部时联接到板簧,并且具有布置在绝缘膜上的电极线,以便接触用于测试面板的焊盘,其中每个板簧施加弹性力,并且 对片材的相应电极线和面板的相应排的衬垫之间的接触部分的压力。
    • 9. 发明申请
    • PIN BOARD
    • WO2012105788A2
    • 2012-08-09
    • PCT/KR2012/000719
    • 2012-01-31
    • PRO-2000 CO. LTD.CHO, Jun SooPARK, Jong Hyun
    • CHO, Jun SooPARK, Jong Hyun
    • G02F1/1345
    • G09G3/006
    • A pin board is provided, comprising: a base block configured to have a lower portion on which a main flexible circuit board to be electrically connected to a main substrate is mounted; a flexible circuit board unit configured to be formed in a plate shape and have a predetermined elasticity; and a supporting unit configured to be coupled to the lower portion of the base block and support the flexible circuit board unit to be inclined downward at a predetermined angle of inclination such that a protruding upper end of the flexible circuit board unit can contact a contact point of the main flexible circuit board with a predetermined elasticity and a protruding lower end of the flexible circuit board can contact a contact pad of an external panel with a predetermined elasticity. Accordingly, the flexible circuit board unit can be supported as inclined and be easily replaced, and alignment of the flexible circuit board unit at a contact point can be visibly and easily identified.
    • 本发明提供一种针板,其包括:基座块,其被构造成具有下部,在该下部上安装有与主基板电连接的主柔性电路板; 柔性电路板单元,所述柔性电路板单元被构造成以板状形成并且具有预定的弹性; 以及支撑单元,所述支撑单元被构造成联接到所述基座的下部,并支撑所述柔性电路板单元以预定的倾斜角度向下倾斜,使得所述柔性电路板单元的突出的上端能够接触接触点 具有预定弹性并且柔性电路板的突出下端可以以预定弹性接触外部面板的接触垫。 因此,柔性电路板单元可以倾斜地支撑并容易地更换,并且柔性电路板单元在接触点处的对准可以明显且容易地识别。
    • 10. 发明申请
    • PROBE BLOCK
    • 探头块
    • WO2012099383A2
    • 2012-07-26
    • PCT/KR2012/000415
    • 2012-01-18
    • PRO-2000 Co. LTD.CHO, Jun SooPARK, Jong Hyun
    • CHO, Jun SooPARK, Jong Hyun
    • G01R1/067G01R31/28
    • G01R1/06705G01R1/07342
    • A probe block for testing a panel including a plurality of rows of pads is provided. The probe block includes a body block configured to have a bottom surface inclined downward in a direction to contact the panel; a plurality of leaf springs configured to be stacked stepwise on the bottom surface of the body block, to have ends protruding outward more than an end of the body block 110 and having bottom surfaces located on the same plane and to have elasticity; and a sheet configured to be coupled to the leaf springs while enclosing ends of the leaf springs and to have electrode lines arranged on an insulating film so as to contact the pads for testing the panel, wherein each of the leaf springs exerts an elastic force and a pressure to a contacting portion between corresponding electrode lines of the sheet and a corresponding row of pads of the panel.
    • 提供了用于测试包括多行焊盘的面板的探针块。 所述探针块包括主体块,所述主体块被构造成具有在与所述面板接触的方向上向下倾斜的底面; 多个片簧,所述多个片簧被构造成阶梯式堆叠在本体块的底表面上,以具有比本体块110的端部更向外突出并且具有位于同一平面上并具有弹性的底面的端部; 以及片材,所述片材被构造成在包围所述片簧的端部的同时联接到所述片簧并且具有布置在绝缘膜上的电极线以便接触用于测试所述面板的所述片,其中,每个所述片簧施加弹性力并且 施加到片材的相应电极线与面板的对应行垫之间的接触部分的压力。