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    • 1. 发明申请
    • REAL-TIME RADIATION SENSOR CALIBRATION
    • 实时辐射传感器校准
    • WO2005015261A3
    • 2005-09-22
    • PCT/US2004025637
    • 2004-08-05
    • BAE SYSTEMS INFORMATIONALLEN THOMAS PBUTLER NEAL R
    • ALLEN THOMAS PBUTLER NEAL R
    • G01J5/06H01L27/146G01J5/00H01L31/024
    • H04N5/3655G01J5/06G01J2005/068H01L27/146H04N5/33
    • One embodiment of the invention is directed to methods and apparatus for determining a variation of a calibration parameter of a pixel of the thermal sensor (32) during operation of the imaging apparatus, after an initial calibration procedure. Another embodiment of the invention is directed to methods and apparatus for calculating a gain calibration parameter using first and second ambient temperature values (36) and respective first and second resistance values for a pixel of a sensor (32). A further embodiment of the invention is directed to calculating an offset calibration parameter for at least one pixel using a gain of the at least one pixel between first and second times and an ambient temperature at a third time, wherein the pixel is exposed to both scene and ambient radiation at the third time.
    • 本发明的一个实施例涉及用于在初始校准程序之后确定成像装置操作期间热传感器(32)的像素的校准参数的变化的方法和装置。 本发明的另一个实施例涉及使用第一和第二环境温度值(36)和传感器(32)的像素的相应的第一和第二电阻值来计算增益校准参数的方法和装置。 本发明的另一实施例涉及使用第一次和第二次之间的至少一个像素的增益和第三次的环境温度来计算至少一个像素的偏移校准参数,其中该像素暴露于两个场景 和环境辐射。