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51. 发明申请

WO2009088693A1 TIMING SIGNAL GENERATOR PROVIDING SYNCHRONIZED TIMING SIGNALS AT NON-INTEGER CLOCK MULTIPLES ADJUSTABLE BY MORE THAN ONE PERIOD 审中-公开
标题翻译：定时信号发生器在非整数时钟信号中提供同步时序信号可调整超过一个周期
公开(公告)号：WO2009088693A1
公开(公告)日：2009-07-16
申请号：PCT/US2008/087363
申请日：2008-12-18
申请人： TERADYNE, INC. , JONES, Christopher, C. , MCGOLDRICK, Michael, F.
发明人： JONES, Christopher, C. , MCGOLDRICK, Michael, F.
IPC分类号： G06F1/08
CPC分类号： G06F1/08 , G01R31/31726
摘要： A system for providing a plurality of synchronous timing signals having period values that are not even multiples of the clock period including a plurality of local edge generators receiving the clock signals, each local generator including local programmable means to record an absolute time at which to generate a timing signal in the current or future period and the means to generate that timing signal at a synchronous even sub¬ division of the clock period resolution. A separate time value is maintained allowing generated timing signals to be delayed by more than one period. An output delay circuit generates the timing signal responsive to a future time value and a phase offset. The phase offset can be provided using a clock multiplier and serial parallel converter to simplify hardware realizations.
摘要翻译：一种用于提供多个同步定时信号的系统，其具有不包括接收时钟信号的多个本地边缘发生器的时钟周期的偶数倍的周期值，每个本地生成器包括本地可编程装置，以记录产生的绝对时间在当前或未来周期中的定时信号以及在时钟周期分辨率的同步偶分割时产生该定时信号的装置。保持单独的时间值，允许产生的定时信号延迟多于一个周期。输出延迟电路响应于未来时间值和相位偏移产生定时信号。可以使用时钟乘法器和串行并行转换器来提供相位偏移，以简化硬件实现。

52. 发明申请

WO2009079448A2 DISK DRIVE TESTING 审中-公开
标题翻译：磁盘驱动器测试
公开(公告)号：WO2009079448A2
公开(公告)日：2009-06-25
申请号：PCT/US2008086809
申请日：2008-12-15
申请人： TERADYNE INC , GARCIA EDWARD , MERROW BRIAN S , POLYAKOV EVGENY , VAHEY WALTER , TRUEBENBACH ERIC L
发明人： GARCIA EDWARD , MERROW BRIAN S , POLYAKOV EVGENY , VAHEY WALTER , TRUEBENBACH ERIC L
IPC分类号： G11B27/36 , G11B5/455 , G11B33/12
CPC分类号： G11B33/128 , G11B5/455 , G11B5/4555 , G11B17/22 , G11B19/048
摘要： A disk drive testing system (100) includes at least one robotic arm (200) defining a first axis (205) substantially normal to a floor surface (10). The robotic arm is operable to rotate through a predetermined arc about and extend radially from the first axis. Multiple racks (300) are arranged around the robotic arm for servicing by the robotic arm. Each rack houses multiple test slots (310) that are each configured to receive a disk drive transporter (550) configured to carry a disk drive (500) for testing. A transfer station (400) is arranged for servicing by the robotic arm. The transfer station includes multiple tote receptacles (420) that are each configured to receive a disk drive tote (450).
摘要翻译：磁盘驱动器测试系统（100）包括至少一个机器人臂（200），所述机器人臂限定基本垂直于地板表面（10）的第一轴（205）。机器人臂可操作以围绕第一轴线旋转通过预定弧线并从第一轴线径向延伸。多个机架（300）围绕机器人臂布置以用于机器人手臂的维修。每个机架容纳多个测试槽（310），每个测试槽配置成接收配置成承载用于测试的磁盘驱动器（500）的磁盘驱动器运送器（550）。中转站（400）布置成由机器人手臂进行维修。转运站包括多个托运箱接收器（420），每个托箱接收器（420）被配置为接收盘驱动器储箱（450）。

53. 发明申请

WO2009058932A2 A METHOD FOR TESTING IN A RECONFIGURABLE TESTER 审中-公开
标题翻译：一种在可重复测试仪中测试的方法
公开(公告)号：WO2009058932A2
公开(公告)日：2009-05-07
申请号：PCT/US2008081686
申请日：2008-10-30
申请人： TERADYNE INC , CONNER GEORGE W
发明人： CONNER GEORGE W
IPC分类号： G06F11/22 , G06F11/30 , G06F12/00
CPC分类号： G06F11/263 , G01R31/31917 , G06F11/261
摘要： In some implementations, a method for testing is provided, which includes simulating a functional operational environment for a first type device-under-test with a tester. This includes recognizing a non-deterministic response signal having a predetermined protocol, receiving the non-deterministic response signal from the first type device-under-test, ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on the predetermined protocol, and initiating transmission of the expected stimulus signal to the first type device-under-test. The method further includes simulating a functional operational environment for a second type device-under-test with the tester after testing the first type device-under-test.
摘要翻译：在一些实施方式中，提供了一种用于测试的方法，其包括模拟用于测试者的第一类测试装置的功能操作环境。这包括识别具有预定协议的非确定性响应信号，从第一类型测试中接收非确定性响应信号，确定要从第一类型测试中传送到第一类型测试中的预期激励信号基于所述预定协议的非确定性响应信号，以及启动所述预期刺激信号到所述第一类待测器件的传输。该方法还包括在测试第一类型被测器件之后，用测试仪模拟第二类型的被测器件的功能操作环境。

54. 发明申请

WO2008127972A1 COST EFFECTIVE LOW NOISE SINGLE LOOP SYNTHESIZER 审中-公开
标题翻译：成本有效的低噪声单环合成器
公开(公告)号：WO2008127972A1
公开(公告)日：2008-10-23
申请号：PCT/US2008/059878
申请日：2008-04-10
申请人： TERADYNE, INC. , CHOW, Colin, Ka, Ho , O'BRIEN, David, E.
发明人： CHOW, Colin, Ka, Ho , O'BRIEN, David, E.
IPC分类号： H03L7/16 , H03B28/00
CPC分类号： H03L7/10 , H03L7/18 , H03L2207/06 , H03L2207/12
摘要： A low cost, low phase noise microwave synthesizer includes a DDS modulation circuit and a phase-locked loop. The DDS modulation circuit modulates the output of a DDS to a high frequency. The phase-locked loop downconverts the DDS output and locks the downconverted signal to a relatively low frequency, fixed reference.
摘要翻译：低成本低相位噪声微波合成器包括DDS调制电路和锁相环。 DDS调制电路将DDS的输出调制到高频。锁相环下变频DDS输出，并将下变频信号锁定到相对较低频率的固定参考。

55. 发明申请

WO2008091550B1 ROTATIONAL POSITIONER AND METHODS FOR SEMICONDUCTOR WAFER TEST SYSTEMS 审中-公开
标题翻译：旋转定位器和半导体波形测试系统的方法
公开(公告)号：WO2008091550B1
公开(公告)日：2008-10-02
申请号：PCT/US2008000708
申请日：2008-01-18
申请人： TERADYNE INC , PARRISH FRANK
发明人： PARRISH FRANK
IPC分类号： G01R31/28 , G01R1/04 , G01R1/073
CPC分类号： G01R1/07342 , G01R1/0491 , G01R31/2887
摘要： A semiconductor wafer prober is configured to rotate a semiconductor wafer into relative alignment with a wafer-interface probe adapted to simultaneously probe a number of integrated circuits within a sector of the semiconductor wafer. The wafer can include integrated circuits having different orientations, such that all of the integrated circuits within a given sector being tested have the same orientation. For example, a semiconductor wafer can include two semicircular sectors, with the integrated circuits on either sector having a common orientation rotated 180 degrees from a common orientation of the integrated circuits of the other sector. A wafer- interface probe, or probe card, adapted to test the entire semicircular sector during a single touch down is able to test the entire wafer with one rotational translation between testing.
摘要翻译：半导体晶片探测器被配置为使半导体晶片与适于同时探测半导体晶片的扇区内的多个集成电路的晶片接口探头相对对准。晶片可以包括具有不同取向的集成电路，使得被测试的给定扇区内的所有集成电路具有相同的取向。例如，半导体晶片可以包括两个半圆形扇区，其中两个扇区上的集成电路具有从另一扇区的集成电路的共同定向旋转180度的共同定向。适用于在单次触摸下测试整个半圆形扇区的晶圆接口探针或探针卡能够在测试之间以一个旋转平移进行测试。

56. 发明申请

WO2008097751A1 DISTRIBUTING DATA AMONG TEST BOARDS TO DETERMINE TEST PARAMETERS 审中-公开
标题翻译：在测试板上分配数据以确定测试参数
公开(公告)号：WO2008097751A1
公开(公告)日：2008-08-14
申请号：PCT/US2008/052243
申请日：2008-01-29
申请人： TERADYNE, INC. , ZELLNER, Alexander , BENAGH, Jeffrey S.
发明人： ZELLNER, Alexander , BENAGH, Jeffrey S.
IPC分类号： G01R31/319 , G09G3/00
CPC分类号： G01R31/31907 , G01R31/02 , G01R31/31905 , G09G3/006 , G09G3/3611
摘要： A system for testing a liquid crystal display (LCD) driver includes multiple test boards, each which includes multiple channels that correspond to data channels of the LCD driver, a device interface board that acts as an interface between the multiple test boards and the LCD driver, a computing device configured to communicate with the multiple test boards, and one or more communications buses over which the computing device communicates with the multiple test boards. Each of the multiple test boards receives partial test data from data channels of the LCD driver, and processes the partial test data to obtain a partial result; and each of the multiple test boards shares a partial result determined from corresponding partial test data with one or more others of the multiple test boards.
摘要翻译：用于测试液晶显示器（LCD）驱动器的系统包括多个测试板，每个测试板包括对应于LCD驱动器的数据通道的多个通道，用作多个测试板和LCD驱动器之间的接口的设备接口板，被配置为与所述多个测试板通信的计算设备，以及所述计算设备通过所述通信总线与所述多个测试板通信的一个或多个通信总线。多个测试板中的每一个从LCD驱动器的数据通道接收部分测试数据，并处理部分测试数据以获得部分结果; 并且所述多个测试板中的每一个与所述多个测试板中的一个或多个其他部分共享由相应的部分测试数据确定的部分结果。

57. 发明申请

WO2008042113A3 NETWORKED TEST SYSTEM 审中-公开
标题翻译：联网测试系统
公开(公告)号：WO2008042113A3
公开(公告)日：2008-08-07
申请号：PCT/US2007020297
申请日：2007-09-19
申请人： TERADYNE INC , FAIRBANKS STEPHEN R , TRUEBENBACH ERIC L
发明人： FAIRBANKS STEPHEN R , TRUEBENBACH ERIC L
IPC分类号： G01R31/319 , G06F11/273
CPC分类号： G01R31/31907 , G06F11/2294
摘要： An automatic test system that can be configured to perform any of a number of test processes. The test system contains multiple functional modules that are interconnected by a network. By using software to configure data flow between functional modules, combinations of modules can be made, thereby creating virtual instruments. As test requirements change, the test system can be reconfigured to contain other virtual instruments, eliminating or reducing the need to add instruments to meet changing test requirements. To ensure adequate performance of the test system, a proposed configuration may be simulated, and if a virtual instrument does not provide a required level of performance, the test system may be reconfigured.
摘要翻译：自动测试系统，可配置为执行多种测试过程中的任意一种。测试系统包含多个由网络互连的功能模块。通过使用软件配置功能模块之间的数据流，可以组合模块，从而创建虚拟仪器。随着测试要求的变化，测试系统可以重新配置为包含其他虚拟仪器，消除或减少添加仪器以满足不断变化的测试要求的需要。为确保测试系统具有足够的性能，可以模拟建议的配置，并且如果虚拟仪器不提供所需的性能水平，则可以重新配置测试系统。

58. 发明申请

WO2008073115A1 CONDUCTIVE SHIELDING DEVICE 审中-公开
标题翻译：导电屏蔽装置
公开(公告)号：WO2008073115A1
公开(公告)日：2008-06-19
申请号：PCT/US2006/049301
申请日：2006-12-27
申请人： TERADYNE, INC. , EMMONS, Thomas, R. , OTTO, Kenneth, G.
发明人： EMMONS, Thomas, R. , OTTO, Kenneth, G.
IPC分类号： H01L29/82 , H05K9/00
CPC分类号： H01F27/292 , H01F27/2847 , H01F27/362
摘要： Devices and methods for reducing stray magnetic fields from an inductor are disclosed. In some aspects, a device includes a substantially U-shaped component configured to attach to a conductive surface of a printed circuit board and configured to substantially surround a lengthwise portion of an inductor on three sides of the inductor.
摘要翻译：公开了用于减少来自电感器的杂散磁场的装置和方法。在一些方面，设备包括基本上U形的部件，其被配置为附接到印刷电路板的导电表面并且被配置为基本上围绕电感器三侧的电感器的纵向部分。

59. 发明申请

WO2008042940A1 STRUCTURE FOR HOLDING A PRINTED CIRCUIT BOARD ASSEMBLY 审中-公开
标题翻译：用于保存印刷电路板组件的结构
公开(公告)号：WO2008042940A1
公开(公告)日：2008-04-10
申请号：PCT/US2007/080268
申请日：2007-10-03
申请人： TERADYNE, INC. , AMIRALI, Muhammad H. , GUMPRECHT, Lee C. , PHAM, The , KITZMANN, Frits E. , COLEMAN, Robert K. , TOO, Heng-kit
发明人： AMIRALI, Muhammad H. , GUMPRECHT, Lee C. , PHAM, The , KITZMANN, Frits E. , COLEMAN, Robert K. , TOO, Heng-kit
IPC分类号： H05K13/00
CPC分类号： H05K13/0069
摘要： An apparatus is for holding a circuit board having components attached to a top surface and to a bottom surface of the circuit board. The apparatus includes a structure having at least two sides, each of which has a ledge that protrudes from a side of the structure for supporting the circuit board. The ledge has a height that exceeds a distance between the circuit board and a bottom of a first component mounted on the bottom surface of the circuit board such that structure suspends the first component above a surface holding the structure.
摘要翻译：一种用于保持具有附接到电路板的顶表面和底表面的部件的电路板的装置。该装置包括具有至少两个侧面的结构，每个侧面具有从用于支撑电路板的结构的侧面突出的凸缘。凸缘具有超过电路板和安装在电路板的底面上的第一部件的底部之间的距离的高度，使得结构将第一部件悬挂在保持结构的表面上方。

60. 发明申请

WO2008042129A3 LIQUID IMMERSION COOLED MULTICHIP MODULE 审中-公开
公开(公告)号：WO2008042129A3
公开(公告)日：2008-04-10
申请号：PCT/US2007/020515
申请日：2007-09-20
申请人： TERADYNE, INC. , CEPEDA-RIZO, Juan , ESMAILPOUR, Mohsen , TENEKETGES, Nicholas
发明人： CEPEDA-RIZO, Juan , ESMAILPOUR, Mohsen , TENEKETGES, Nicholas
IPC分类号： H05K7/20 , H01L23/473
摘要： In one embodiment, a liquid immersion cooled multichip module is provided which includes a substrate having chips mounted thereon and which is adapted to mount with a printed circuit board. A lid is adapted to secure to the printed circuit board so as to mount with the substrate to form a fluid chamber between the lid and the substrate, and to cause the substrate to mate with the printed circuit board. In one embodiment, a cambered bolster plate is located on a side of the printed circuit board opposite the lid and the lid is fastened to the bolster plate to secure the lid to the printed circuit board. A baffle, which may be removable in some embodiments, is located within the lid and directs coolant flow through the fluid chamber.

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