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    • 40. 发明申请
    • MEMORY KINK CHECKING
    • WO2011031302A3
    • 2011-03-17
    • PCT/US2010/002378
    • 2010-08-31
    • MICRON TECHNOLOGY, INC.CHANDRASEKHAR, UdayHELM, Mark
    • CHANDRASEKHAR, UdayHELM, Mark
    • G11C16/10
    • This disclosure concerns memory kink checking. One embodiment includes selectively applying one of a plurality of voltages to a first data line according to a programming status of a first memory cell, wherein the first memory cell is coupled to the first data line and to a selected access line. An effect on a second data line is determined, due at least in part to the voltage applied to the first data line and a capacitive coupling between at least the first data line and the second data line, wherein the second data line is coupled to a second memory cell, the second memory cell is adjacent to the first memory cell, and the second memory cell is coupled to the selected access line. A kink correction is applied to the second data line, responsive to the determined effect, during a subsequent programming pulse applied to the second memory cell.
    • 本公开涉及存储器扭结检查。 一个实施例包括根据第一存储器单元的编程状态将多个电压中的一个选择性地施加到第一数据线,其中第一存储器单元耦合到第一数据线并耦合到选定的存取线。 至少部分由于施加到第一数据线的电压以及至少第一数据线和第二数据线之间的电容耦合而确定对第二数据线的影响,其中第二数据线耦合到第 第二存储器单元,第二存储器单元与第一存储器单元相邻,并且第二存储器单元耦合到选择的存取线。 在施加到第二存储器单元的后续编程脉冲期间,扭曲校正响应于所确定的效果被施加到第二数据线。