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    • 5. 发明授权
    • Method and circuit for testing accuracy of delay circuitry
    • 用于测试延迟电路精度的方法和电路
    • US08633722B1
    • 2014-01-21
    • US12894026
    • 2010-09-29
    • Andrew W. Lai
    • Andrew W. Lai
    • G01R31/3187G01R31/20H03K25/00G01R31/28
    • G01R31/2882G01R31/31725H03K19/17764H03K23/425
    • In one embodiment a circuit for testing delays is provided. A test signal generator circuit toggles a plurality of output signals 1 through N in sequential order, separating the toggles by a delay period. Each output signal is coupled to an input of a respective one of a plurality of delay circuits. A phase detector circuit is coupled to the delay circuits and is configured to determine the order in which signals output from delay circuits X−1, X, and X+1 are toggled for each delay circuit X. In response to the output signals being toggled in the order X−1 followed by X followed by X+1, the phase comparator circuit is configured to output a first signal indicating correct operation. Otherwise, the phase comparator circuit is configured to output a second signal indicating incorrect operation.
    • 在一个实施例中,提供了用于测试延迟的电路。 测试信号发生器电路按顺序切换多个输出信号1至N,将切换分开延迟时间。 每个输出信号耦合到多个延迟电路中的相应一个的输入。 相位检测器电路被耦合到延迟电路,并且被配置为确定从延迟电路X-1,X和X + 1输出的信号针对每个延迟电路X切换的顺序。响应于输出信号被切换 按照X-1之后的X,随后是X + 1,相位比较器电路被配置为输出指示正确操作的第一信号。 否则,相位比较器电路被配置为输出指示不正确操作的第二信号。
    • 6. 发明授权
    • CMOS-inverter-type frequency divider circuit, and mobile phone including the CMOS-inverter-type frequency divider circuit
    • CMOS逆变型分频电路,以及手机包括CMOS逆变型分频电路
    • US08531213B2
    • 2013-09-10
    • US13321009
    • 2010-04-08
    • Masakatsu MaedaMikihiro Shimada
    • Masakatsu MaedaMikihiro Shimada
    • H03K21/00H03K23/00H03K25/00
    • H03K23/68G06F7/68H03K23/667
    • The present invention provides a CMOS-inverter-type frequency divider circuit that can further reduce power consumption.The CMOS-inverter-type frequency divider circuit includes: a plurality of CMOS inverters that contribute to realizing a frequency division function; a frequency division control section for performing control such that some or all of the plurality of CMOS inverters are intermittently driven at the respective different timings in accordance with an input signal; and a drive power supplying section for supplying powers for driving the plurality of CMOS inverters, and for, based on state information indicating whether VCO sub band selection or normal transmission is performed, switching some or all of the powers for the plurality of CMOS inverters between the VCO sub band selection and the normal transmission.
    • 本发明提供一种可以进一步降低功耗的CMOS反相器型分频器电路。 CMOS反相器型分频器电路包括:有助于实现分频功能的多个CMOS反相器; 分频控制部分,用于执行控制,使得多个CMOS反相器中的一些或全部根据输入信号在各个不同的定时被间歇地驱动; 以及用于提供用于驱动多个CMOS反相器的电力的驱动电力供应部分,并且基于指示是否执行VCO子带选择还是正常传输的状态信息,将多个CMOS反相器的部分或全部功率切换到 VCO子频段选择和正常传输。
    • 9. 发明授权
    • Divider circuit
    • 分频电路
    • US07656204B2
    • 2010-02-02
    • US11713544
    • 2007-03-02
    • Stephan HenzlerSiegmar Koeppe
    • Stephan HenzlerSiegmar Koeppe
    • H03K21/00H03K23/00H03K25/00
    • H03K3/356191H03K3/012H03K5/00006H03K5/15013H03K2005/00286
    • A divider circuit comprises at least two clock edge controlled differential buffer store elements, each being clocked by complementary input clock signals, each comprising internal storage nodes which are pre-chargeable to a pre-charge potential, and each comprising a differential data input. The internal storage nodes of the buffer store elements are either pre-charged at the pre-charge potential or store a logic level, depending on the relevant input clock signals. The differential data inputs of one of the buffer store elements is connected to the internal storage nodes of the other buffer store element and pulsed signals can be tapped off at the internal differential storage node.
    • 分频器电路包括至少两个时钟沿控制的差分缓冲器存储器元件,每个元件由互补的输入时钟信号计时,每个时钟信号包括可预充电到预充电电位的内部存储节点,并且每个包括差分数据输入。 缓冲存储器元件的内部存储节点或者是以预充电电位预充电,或根据相关的输入时钟信号存储逻辑电平。 缓冲存储元件之一的差分数据输入连接到另一个缓冲存储元件的内部存储节点,并且脉冲信号可以在内部差分存储节点被分接。
    • 10. 发明授权
    • Flip-flop, shift register, and scan test circuit
    • 触发器,移位寄存器和扫描测试电路
    • US07600167B2
    • 2009-10-06
    • US11727451
    • 2007-03-27
    • Hiroaki Shoda
    • Hiroaki Shoda
    • G01R31/28G01R31/26G06F1/00G11C29/00H03K3/289H03K3/00H03K5/13H03H11/16H03K19/00H03K21/00H03K23/00H03K25/00H03K3/02
    • G01R31/318541
    • A flip-flop has a first latch and a second latch. The first latch has a first feedback circuit and a first selecting circuit which selects one of a first data input signal and an output signal of the first feedback circuit, based on the logic level of a first clock signal. The second latch has a second feedback circuit and a second selecting circuit which selects an output signal of the first latch and an output signal of the second feedback circuit based on the inverted logic level in case of the first latch. The first feedback circuit has a third selecting circuit which selects one of an output signal of the first latch and a second data input signal based on the logic level of a second clock signal, and outputs a signal selected by the third selecting circuit to the first selecting circuit.
    • 触发器具有第一锁存器和第二锁存器。 第一锁存器具有基于第一时钟信号的逻辑电平的第一反馈电路和第一选择电路,其选择第一反馈电路的第一数据输入信号和输出信号之一。 第二锁存器具有第二反馈电路和第二选择电路,其在第一锁存器的情况下基于反相逻辑电平选择第一锁存器的输出信号和第二反馈电路的输出信号。 第一反馈电路具有第三选择电路,其基于第二时钟信号的逻辑电平选择第一锁存器的输出信号和第二数据输入信号中的一个,并将由第三选择电路选择的信号输出到第一 选择电路。