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    • 4. 发明申请
    • MEASURING CIRCUIT
    • 测量电路
    • US20020008527A1
    • 2002-01-24
    • US09420280
    • 1999-10-18
    • BERNARD BROILLET
    • G01R029/22
    • G01L23/225G01H11/08G01P21/00
    • A measuring circuit comprising a symmetric transmission line connecting a transducer to a measurement amplifier and to a fault indicating signal amplifier, the transducer delivering symmetric input signals to said amplifiers, the first amplifier delivering a measuring signal representing the difference of its input signals and the fault indicating signal amplifier delivering a fault indicating signal representing the sum of the input signals. An auxiliary signal injected to the terminals of the transducer the invention enables the measuring circuit to evaluate the quality of the measuring circuit during operation of the tested machine and also when the machine is at rest.
    • 一种测量电路,包括将换能器连接到测量放大器和故障指示信号放大器的对称传输线,所述换能器将对称输入信号传送到所述放大器,所述第一放大器传送表示其输入信号和故障的差异的测量信号 指示信号放大器传递表示输入信号之和的故障指示信号。 注射到本发明换能器的端子的辅助信号使得测量电路能够在被测试机器的操作期间以及当机器静止时评估测量电路的质量。
    • 5. 发明申请
    • Mechanical-electrical transducer
    • 机电传感器
    • US20030112023A1
    • 2003-06-19
    • US10293930
    • 2002-11-14
    • Heiko JauselErich MattmannUwe Neumann-Henneberg
    • G01R029/22
    • G01L1/2287
    • The invention relates to a mechanical-electrical transducer having a bridge circuit formed on an insulation layer through an electrical interconnection of expansion-sensitive thick-film resistors by means of conductor tracks. The insulation layer is arranged directly on a metallic component that is to be mechanically loaded, and being intimately connected to said component by means of a thermal process. In this case, in the event of mechanical stressing of the component, an electrical signal corresponding to the expansion of the thick-film resistors can be tapped off. In order that the mechanical-electrical transducer exhibits a small electrical offset in the output signal in the event of mechanical loading, the metallic component to be loaded comprises a thermally post-hardening metal or a thermally post-hardening metal alloy.
    • 本发明涉及一种具有桥接电路的机械电传感器,桥接电路通过导体轨迹通过膨胀敏感厚膜电阻器的电互连形成在绝缘层上。 绝缘层直接布置在待机械加载的金属部件上,并通过热处理紧密地连接到所述部件上。 在这种情况下,在组件的机械应力的情况下,与厚膜电阻器的膨胀相对应的电信号可以被分接。 为了在机械负载的情况下机械 - 电传感器在输出信号中表现出小的电偏移,待加载的金属部件包括热后固化金属或热后固化金属合金。
    • 6. 发明申请
    • Polarization method of a multi-layered piezoelectric body
    • 多层压电体极化方法
    • US20030062912A1
    • 2003-04-03
    • US09996575
    • 2001-11-30
    • Murata Manufacturing Co., Ltd.
    • Mikio Nakajima
    • G01R029/22G01R027/04
    • H01L41/273H01L41/257Y10T29/42
    • In a polarization method of the multi-layered piezoelectric body in which a plurality of piezoelectric layers and a plurality of internal electrodes are alternately laminated and adjacent piezoelectric layers are polarized in the thickness direction such that the polarized directions thereof are in opposite directions, a first polarization process in which an electric field in one direction is applied in the thickness direction to the multi-layered piezoelectric body and a polarization is uniformly performed in the thickness direction, and a secondary polarization process in which an electric field in the opposite direction is applied to the piezoelectric layers on both sides of one of the internal electrodes and the direction of polarization of only one of the piezoelectric layers on one side of the internal electrode is reversed are provided. The secondary polarization is performed in the range such that the remaining polarization degree Pr2 that exists after the secondary polarization in the piezoelectric layer 1b in which the direction of polarization is reversed does not exceed the remaining polarization degree of Pr1 that exists after the first polarization.
    • 在多层压电体的极化方法中,多个压电层和多个内部电极交替层叠,相邻的压电体层在厚度方向上偏振,使得其偏振方向相反,第一 在厚度方向上向多层压电体施加一个方向的电场,在厚度方向上均匀地进行极化的极化处理,施加相反方向的电场的二次极化处理 提供了内电极一侧的压电层和内电极一侧的一个压电层的极化方向相反的压电层。 在使极化方向的压电体层1b中的二次极化后存在的剩余极化度Pr2不超过存在于第一极化后的Pr1剩余极化度的范围内进行二次偏振。
    • 7. 发明申请
    • Method for evaluating piezoelectric fields
    • 压电场评估方法
    • US20040155194A1
    • 2004-08-12
    • US10768163
    • 2004-02-02
    • Mitsubishi Denki Kabushiki Kaisha
    • Hideo TakeuchiYoshitsugu YamamotoTakahide Ishikawa
    • G01R029/22
    • G01N21/35
    • In a method of evaluating a piezoelectric field, a non-destructive spectrometry of piezoelectric fields is performed in a semiconductor heterojunction using a technique different from PR spectroscopy. In the method, at first, first and second absorption spectra are measured by irradiating infrared light to a sample with first and second angles, respectively. Then, a peak position of an absorption band having incident-angle dependent intensity is specified based on the first and second absorption spectra. Thus, the piezoelectric field strength is obtained based on an equation of energy level. The equation represents a relationship between the piezoelectric field and an electron energy level corresponding to the peak position.
    • 在评估压电场的方法中,使用不同于PR光谱的技术在半导体异质结中进行压电场的非破坏性光谱测定。 在该方法中,首先,通过将红外光分别以第一和第二角度照射到样品来测量第一和第二吸收光谱。 然后,基于第一吸收光谱和第二吸收光谱来确定具有入射角依赖强度的吸收带的峰值位置。 因此,基于能级方程获得压电场强。 该方程式表示压电场与对应于峰值位置的电子能级之间的关系。
    • 10. 发明申请
    • Peizoelectric microactuator and sensor failure detection in disk drives
    • Peizoelectric微型致动器和磁盘驱动器中的传感器故障检测
    • US20030076121A1
    • 2003-04-24
    • US10218953
    • 2002-08-13
    • Wei GuoMichael R. Hatch
    • G01R029/22
    • G11B20/1816G01R31/2829G11B27/36G11B2220/20
    • A test device and method for testing one of a disk drive microactuator and a disk drive sensor that includes two piezoelectric elements. The test device includes a signal generator, signal analyzer, and a user interface. The test device is operational to provide a reference signal (e.g. an electrical signal) to one of the piezoelectric elements in the microactuator and obtain a test measure from the other one of the piezoelectric elements. The test measure is then utilized to assess a performance parameter for the microactuator. The test measure is generated by the other one of the piezoelectric elements in response to the reference signal provided to the first one of the piezoelectric elements. In one embodiment of the invention, the test measure is a signal generated in response to the reference signal that may be compared to a known response signal of an operational microactuator to determine operational characteristics of a subject microactuator such as circuitry operation and/or damage to the microactuator.
    • 一种用于测试包括两个压电元件的磁盘驱动器微型致动器和磁盘驱动器传感器之一的测试装置和方法。 测试装置包括信号发生器,信号分析器和用户界面。 测试装置可操作以向微致动器中的一个压电元件提供参考信号(例如电信号),并从另一个压电元件获得测试测量。 然后使用测试措施来评估微致动器的性能参数。 响应于提供给第一压电元件的参考信号,测试措施由另一个压电元件产生。 在本发明的一个实施例中,测试测量是响应于参考信号产生的信号,其可以与操作微致动器的已知响应信号进行比较,以确定对象微致动器的操作特性,例如电路操作和/或损坏 微致动器。