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1. 发明授权

US12062465B2 System and method for bending crystal wafers for use in high resolution analyzers 有权
公开(公告)号：US12062465B2
公开(公告)日：2024-08-13
申请号：US17892020
申请日：2022-08-19
申请人： UCHICAGO ARGONNE, LLC
发明人： Ayman H. Said , Thomas Gog , Jung Ho Kim , Emily K. Aran
IPC分类号： G21K1/06
CPC分类号： G21K1/06 , G21K2201/062 , G21K2201/064 , G21K2201/067
摘要： The invention provides a method for fabricating analyzers, the method comprising providing a radiation manipulating material on a first surface of a flexible support; contacting a second surface of the flexible support to a permeable mold, wherein the mold has a first flexible support contact surface and a second surface; and applying negative pressure to the second side of the flexible support to cause the flexible support to conform to the first flexible support contact surface of the mold. Also provided is a system for fabricating crystal analyzers, the system comprising crystal structures reversibly attached to a flexible support; a porous mold reversibly contacting the flexible support, wherein the mold defines a topography; and a negative pressure applied to the flexible support to cause the crystal structures to conform to the topography.

2. 发明授权

US11710579B2 Neutral atom quantum information processor 有权
公开(公告)号：US11710579B2
公开(公告)日：2023-07-25
申请号：US17830609
申请日：2022-06-02
申请人： President and Fellows of Harvard College , Massachusetts Institute of Technology , California Institute of Technology
发明人： Alexander Keesling Contreras , Hannes Bernien , Sylvain Schwartz , Harry Jay Levine , Ahmed Omran , Mikhail D. Lukin , Vladan Vuletic , Manuel Endres , Markus Greiner , Hannes Pichler , Leo Zhou , Shengtao Wang , Soonwon Choi , Donggyu Kim , Alexander S. Zibrov
IPC分类号： G21K1/06 , G06N10/00 , G21K1/00 , G21K1/093 , G02F1/33 , B82Y10/00
CPC分类号： G21K1/06 , G02F1/33 , G06N10/00 , G21K1/006 , G21K1/093 , B82Y10/00 , G21K2201/062
摘要： Systems and methods relate to arranging atoms into 1D and/or 2D arrays; exciting the atoms into Rydberg states and evolving the array of atoms, for example, using laser manipulation techniques and high-fidelity laser systems described herein; and observing the resulting final state. In addition, refinements can be made, such as providing high fidelity and coherent control of the assembled array of atoms. Exemplary problems can be solved using the systems and methods for arrangement and control of atoms.

3. 发明授权

US09575017B2 High performance Kratky assembly 有权
标题翻译：高性能Kratky装配
公开(公告)号：US09575017B2
公开(公告)日：2017-02-21
申请号：US14187832
申请日：2014-02-24
申请人： Rigaku Innovative Technologies, Inc.
发明人： Licai Jiang , Paul Ulrich Pennartz
IPC分类号： G21K1/02 , G01N23/201 , G21K1/04
CPC分类号： G01N23/201 , G21K1/02 , G21K1/025 , G21K1/04 , G21K2201/062
摘要： An assembly for Kratky collimator is provided. The assembly may be used for a small angle x-ray camera or system requiring such filtering. The assembly may include a first block with a first working surface and a second block with a second working surface. The first and second blocks may be aligned with the first working surface pointing an opposite direction of the second working surface and the first working surface being aligned in a common plane with the second working surface. In some implementations, the first block may comprise a crystal material. In some implementations, an extension may of the first block may be configured position a beamstop.
摘要翻译：提供了Kratky准直器的组件。组件可用于需要这种过滤的小角度X射线摄像机或系统。组件可以包括具有第一工作表面的第一块和具有第二工作表面的第二块。第一和第二块可以与第一工作表面对准，其指向第二工作表面的相反方向，并且第一工作表面与第二工作表面在公共平面中对准。在一些实施方案中，第一块可以包括晶体材料。在一些实施方案中，第一块的延伸部可以被配置为定位梁挡。

4. 发明授权

US09312039B2 Confocal double crystal monochromator 有权
标题翻译：共焦双晶单色仪
公开(公告)号：US09312039B2
公开(公告)日：2016-04-12
申请号：US13512210
申请日：2010-11-24
申请人： Joseph P Lidestri
发明人： Joseph P Lidestri
IPC分类号： G21K1/06
CPC分类号： G21K1/06 , G21K2201/062 , G21K2201/064
摘要： A monochromator is adapted to select at least one band of wavelengths from diverging incident radiation. The apparatus includes a first crystal and a second crystal. A band of emitted wavelengths of the first crystal is adapted to the at least one band of wavelengths. A surface curvature of the first crystal is adapted to focus emitted radiation in a first plane. A band of emitted wavelengths of the second crystal also is adapted to the at least one band of wavelengths. Parallel faces of a lattice structure of the second crystal are oriented at a first predetermined angle from a surface of the second crystal. In another embodiment, an apparatus is adapted to select at least one band of wavelengths from diverging incident synchrotron radiation in a given range of wavelengths with an energy resolution finer than about five parts in 10000 and optical efficiency greater than about 50 percent.
摘要翻译：单色器适于从发散的入射辐射中选择至少一个波长带。该装置包括第一晶体和第二晶体。第一晶体的发射波长带适应于至少一个波长带。第一晶体的表面曲率适于将发射的辐射聚焦在第一平面中。第二晶体的发射波长带还适于至少一个波长带。第二晶体的晶格结构的平行面从第二晶体的表面以第一预定角度取向。在另一个实施例中，一种装置适用于在给定波长范围内从发散的入射同步加速器辐射中选择至少一个波段，其能量分辨率优于约10000，光学效率大于约50％。

5. 发明授权

US09001968B2 Method for characterization of a spherically bent crystal for Kα X-ray imaging of laser plasmas using a focusing monochromator geometry 有权
标题翻译：用于使用聚焦单色仪几何形状的激光等离子体的KαX射线成像的球形弯曲晶体的表征方法
公开(公告)号：US09001968B2
公开(公告)日：2015-04-07
申请号：US13662038
申请日：2012-10-26
申请人： Lawrence Livermore National Security, LLC
发明人： Nathan Kugland , Tilo Doeppner , Siegfried Glenzer , Carmen Constantin , Chris Niemann , Paul Neumayer
IPC分类号： G21K1/06 , G01N23/207 , G21B1/23
CPC分类号： G21K1/06 , G01N23/2076 , G01N2223/331 , G21B1/23 , G21K2201/062 , G21K2201/064
摘要： A method is provided for characterizing spectrometric properties (e.g., peak reflectivity, reflection curve width, and Bragg angle offset) of the Kα emission line reflected narrowly off angle of the direct reflection of a bent crystal and in particular of a spherically bent quartz 200 crystal by analyzing the off-angle x-ray emission from a stronger emission line reflected at angles far from normal incidence. The bent quartz crystal can therefore accurately image argon Kα x-rays at near-normal incidence (Bragg angle of approximately 81 degrees). The method is useful for in-situ calibration of instruments employing the crystal as a grating by first operating the crystal as a high throughput focusing monochromator on the Rowland circle at angles far from normal incidence (Bragg angle approximately 68 degrees) to make a reflection curve with the He-like x-rays such as the He-α emission line observed from a laser-excited plasma.
摘要翻译：提供了一种用于表征Kα发射线的光谱特性（例如，峰值反射率，反射曲线宽度和布拉格角偏移）的方法，其反映了弯曲晶体的直接反射的狭窄偏角，特别是反射曲线的石英200晶体通过分析从远离正常入射角度反射的较强发射线的偏角x射线发射。因此，弯曲的石英晶体可以以近似法线入射（布拉格角约81度）精确地成像氩气Kαx射线。该方法对于使用晶体作为光栅的仪器的原位校准是有用的，首先将晶体作为高通量聚焦单色仪在Rowland圆上以远离法向入射角度（布拉格角约68度）进行操作，以形成反射曲线具有He-like x射线，例如从激光激发等离子体观察到的He-α发射线。

6. 发明申请

US20140105363A1 XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNED PACKAGE 有权
标题翻译：具有多个激活能量的XRF系统在高度对齐的包装
公开(公告)号：US20140105363A1
公开(公告)日：2014-04-17
申请号：US14052078
申请日：2013-10-11
申请人： X-RAY OPTICAL SYSTEMS, INC.
发明人： Zewu CHEN , David M. GIBSON , Walter M. GIBSON , Adam BAILEY , R. Scott SEMKEN , Kai XIN , John H. BURDETT, JR.
IPC分类号： G21K1/06 , G01N23/20
CPC分类号： G21K1/06 , G01N23/20008 , G01N23/223 , G01N2223/076 , G01N2223/1003 , G01N2223/315 , G01N2223/423 , G21K2201/062 , G21K2201/064 , H05G1/04
摘要： An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
摘要翻译：一种用X射线束照射样品斑点的X射线分析装置。提供具有源极点的X射线管，从该源点产生具有特征的第一能量和bre致辐射能量的发散X射线束; 第一x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时对光束进行单色; 并且第二x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时将光束单色化为第二能量。第一个X射线光学元件可以对来自源光斑的特征能量进行单色化，第二个X射线光学元件可以从源光点单色bre致辐射能量。 x射线光学元件可以是弯曲衍射光学器件，用于从X射线管接收发散的X射线束并将光束聚焦在样品点。还提供检测以检测和测量例如包括玩具和电子产品在内的制造产品中的各种毒素。

7. 发明授权

US08340248B2 X-ray diffraction method and X-ray diffraction apparatus 有权
$X-ray diffraction method and X-ray diffraction apparatus$
标题翻译： X射线衍射法和X射线衍射装置
公开(公告)号：US08340248B2
公开(公告)日：2012-12-25
申请号：US12729375
申请日：2010-03-23
申请人： Hideo Toraya , Hisashi Konaka
发明人： Hideo Toraya , Hisashi Konaka
IPC分类号： G01N23/20
CPC分类号： G01N23/207 , B82Y10/00 , G21K2201/061 , G21K2201/062
摘要： In an X-ray diffraction method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror is a combination of plural flat reflective surfaces, the respective centers of which are located on an equiangular spiral having a center that is located on a surface of the sample. The X-ray detector is one-dimensional position-sensitive in a plane parallel to the diffraction plane. X-rays that have been reflected at different flat reflective surfaces reach different points on the X-ray detector respectively. A correction is performed for separately recognizing different reflected X-rays that may have been reflected at the different flat reflective surfaces, and might be mixed with each other on the same detecting region of the X-ray detector.
摘要翻译：在X射线衍射方法中，将X射线平行光束入射到样品上，并将衍射的X射线从样品反射，然后用X射线检测器检测。反射镜的反射表面是多个平坦反射表面的组合，其各自的中心位于具有位于样品表面上的中心的等角螺旋上。 X射线检测器在与衍射平面平行的平面中是一维位置敏感的。已经在不同平面反射表面反射的X射线分别到达X射线探测器的不同点。执行用于分别识别可能在不同平面反射表面处反射的不同反射X射线的校正，并且可以在X射线检测器的相同检测区域上彼此混合。

8. 发明授权

US08204174B2 Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals 有权
标题翻译：通过使用由多个小区域源产生的X射线束和通过使用相邻单色器晶体的面对侧来检测物体的图像的系统和方法
公开(公告)号：US08204174B2
公开(公告)日：2012-06-19
申请号：US12708579
申请日：2010-02-19
申请人： Dean Connor , Christopher Parham , Etta Pisano , Waldo S. Hinshaw , Zhong Zhong , Brian P. Wilfley
发明人： Dean Connor , Christopher Parham , Etta Pisano , Waldo S. Hinshaw , Zhong Zhong , Brian P. Wilfley
IPC分类号： G01N23/087 , G01N23/20 , G01N23/207 , G21K1/06
CPC分类号： A61B6/4035 , A61B6/032 , A61B6/06 , A61B6/482 , A61B6/502 , A61B6/5282 , A61B6/542 , G21K2201/062 , G21K2207/005 , H01J2235/068 , H01J2235/08
摘要： Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources are disclosed. A plurality of monochromator crystals may be positioned to intercept the plurality of first X-ray beams such that a plurality of second X-ray beams each having predetermined energy levels is produced. Further, an object to be imaged may be positioned in paths of the second x-ray beams for transmission of the second X-ray beams through the object and emitting from the object a plurality of transmission X-ray beams. The X-ray beams may be directed at angles of incidence upon a plurality of analyzer crystals for detecting an image of the object.
摘要翻译：公开了通过使用由多个小区域源产生的X射线束来检测物体的图像的系统和方法。可以将多个单色器晶体定位成截取多个第一X射线束，使得产生多个具有预定能级的第二X射线束。此外，要成像的物体可以位于第二X射线束的路径中，用于透过物体传输第二X射线束，并从物体发射多个透射X射线束。 X射线束可以以多个分析器晶体的入射角定向，以检测物体的图像。

9. 发明授权

US08030629B2 Adaptive X-ray optics 失效
标题翻译：自适应X射线光学
公开(公告)号：US08030629B2
公开(公告)日：2011-10-04
申请号：US12520551
申请日：2007-12-06
申请人： Zacharias Helmut , Martin Silles
发明人： Zacharias Helmut , Martin Silles
IPC分类号： G21K1/06 , H01L31/0232 , G01N23/20
CPC分类号： G21K1/06 , G02B26/0825 , G21K2201/062
摘要： The invention relates to an adaptive optical device for the reflection of impinging radiation, the adaptive optical device comprising at least one actuator and at least one partially reflective volume. The at least one partially reflective volume has a first surface that is oriented to the impinging radiation. The at least one partially reflective volume is at least partially deformable by said at least one actuator such that the impinging radiation is reflected at the at least one partially reflective volume substantially in accordance with Bragg's law. Further, the invention relates to a method and apparatus for controlling the shape of an adaptive optical device.
摘要翻译：本发明涉及用于反射入射辐射的自适应光学装置，所述自适应光学装置包括至少一个致动器和至少一个部分反射体积。至少一个部分反射体积具有被定向到入射辐射的第一表面。所述至少一个部分反射体积可由所述至少一个致动器至少部分地变形，使得所述入射辐射基本上根据布拉格定律在所述至少一个部分反射体积处反射。此外，本发明涉及一种用于控制自适应光学装置的形状的方法和装置。

10. 发明申请

US20110058652A1 SHORT WORKING DISTANCE SPECTROMETER AND ASSOCIATED DEVICES, SYSTEMS, AND METHODS 失效
标题翻译：短距离光谱仪和相关设备，系统和方法
公开(公告)号：US20110058652A1
公开(公告)日：2011-03-10
申请号：US12879922
申请日：2010-09-10
申请人： Gerald Todd Seidler
发明人： Gerald Todd Seidler
IPC分类号： G01T1/36 , G01N23/00 , G02B5/18
CPC分类号： G21K1/062 , B33Y80/00 , B82Y10/00 , G01N23/2076 , G02B5/0891 , G21K2201/061 , G21K2201/062 , G21K2201/064
摘要： A spectrometer includes a rigid body having a first planar face with an orientation and a second planar face with a different orientation than the first planar face. The first and second planar faces are configured to position Bragg diffraction elements, and the orientation of the first planar face and the different orientation of the second planar face are arranged to convey a predetermined spectral range of the electromagnetic radiation to non-overlapping regions of the sensor location via the diffraction elements.
摘要翻译：光谱仪包括具有具有取向的第一平面和具有不同于第一平面的取向的第二平面的刚体。第一和第二平面被配置为布置布拉格衍射元件，并且第一平面的取向和第二平面的不同取向被布置成将电磁辐射的预定光谱范围传送到非重叠区域通过衍射元件的传感器位置。

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