专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US08340248B2 X-ray diffraction method and X-ray diffraction apparatus 有权
$X-ray diffraction method and X-ray diffraction apparatus$
标题翻译： X射线衍射法和X射线衍射装置
公开(公告)号：US08340248B2
公开(公告)日：2012-12-25
申请号：US12729375
申请日：2010-03-23
申请人： Hideo Toraya , Hisashi Konaka
发明人： Hideo Toraya , Hisashi Konaka
IPC分类号： G01N23/20
CPC分类号： G01N23/207 , B82Y10/00 , G21K2201/061 , G21K2201/062
摘要： In an X-ray diffraction method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror is a combination of plural flat reflective surfaces, the respective centers of which are located on an equiangular spiral having a center that is located on a surface of the sample. The X-ray detector is one-dimensional position-sensitive in a plane parallel to the diffraction plane. X-rays that have been reflected at different flat reflective surfaces reach different points on the X-ray detector respectively. A correction is performed for separately recognizing different reflected X-rays that may have been reflected at the different flat reflective surfaces, and might be mixed with each other on the same detecting region of the X-ray detector.
摘要翻译：在X射线衍射方法中，将X射线平行光束入射到样品上，并将衍射的X射线从样品反射，然后用X射线检测器检测。反射镜的反射表面是多个平坦反射表面的组合，其各自的中心位于具有位于样品表面上的中心的等角螺旋上。 X射线检测器在与衍射平面平行的平面中是一维位置敏感的。已经在不同平面反射表面反射的X射线分别到达X射线探测器的不同点。执行用于分别识别可能在不同平面反射表面处反射的不同反射X射线的校正，并且可以在X射线检测器的相同检测区域上彼此混合。

2. 发明申请

US20100246768A1 X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS 有权
标题翻译： X射线衍射方法和X射线衍射装置
公开(公告)号：US20100246768A1
公开(公告)日：2010-09-30
申请号：US12729375
申请日：2010-03-23
申请人： Hideo TORAYA , Hisashi Konaka
发明人： Hideo TORAYA , Hisashi Konaka
IPC分类号： G01T1/36
CPC分类号： G01N23/207 , B82Y10/00 , G21K2201/061 , G21K2201/062
摘要： In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror consists of a combination of plural flat reflective surfaces. The respective centers of the flat reflective surfaces are located on an equiangular spiral having a center that is located on a surface of the sample. The X-ray detector is one-dimensional position-sensitive in a plane parallel to the diffraction plane. X-rays that have been reflected at different flat reflective surfaces reach different points on the X-ray detector respectively. A corrective operation is performed for separately recognizing the different reflected X-rays on the assumption that the different reflected X-rays that have been reflected at the different flat reflective surfaces might be unfortunately mixed each other on the same detecting region of the X-ray detector. This X-ray diffraction method is superior in angular resolution, and is small in X-ray intensity reduction, and is simple in structure.
摘要翻译：在使用平行光束法的X射线衍射方法中，X射线平行光束入射到样品上，并且来自样品的X射线衍射被反射，然后通过X射线检测器检测。反射镜的反射表面由多个平面反射表面的组合组成。平面反射表面的各个中心位于具有位于样品表面上的中心的等角螺旋上。 X射线检测器在与衍射平面平行的平面中是一维位置敏感的。已经在不同平面反射表面反射的X射线分别到达X射线探测器的不同点。假设在不同的平面反射面上反射的不同的反射的X射线可能不幸地在X射线的相同检测区域上彼此混合，进行用于单独识别不同的反射X射线的校正操作探测器。该X射线衍射法的角分辨率优异，X射线强度降低小，结构简单。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式