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    • 6. 发明授权
    • Optical disk inspection device and inspection method
    • 光盘检查装置及检查方法
    • US08270274B2
    • 2012-09-18
    • US12580095
    • 2009-10-15
    • Keishi Ueno
    • Keishi Ueno
    • G11B20/18
    • G11B20/1816G11B2020/1823G11B2220/2537
    • There is provided an optical disk device which quickly inspects the presence or absence of a defect in an optical disk in order to ensure that it can be played back on various types of optical disk devices. A detection unit uses signals supplied from a playback unit to detect defects from each of an RF signal, a focus error signal, and a tracking error signal. A CPU stores positions of the defects in a memory. The playback unit plays back data while degrading playback conditions at the positions of the defects . The detection unit detects an error rate of the played-back data, and finally determines whether the optical disk is “OK” or “NG”.
    • 提供了一种光盘装置,其可以快速检查光盘中是否存在缺陷,以确保可以在各种类型的光盘装置上重放。 检测单元使用从重放单元提供的信号来检测RF信号,聚焦误差信号和跟踪误差信号中的每一个的缺陷。 CPU将缺陷的位置存储在存储器中。 播放单元在缺陷的位置降低重放条件的同时回放数据。 检测单元检测重放数据的错误率,最后确定光盘是“OK”还是“NG”。
    • 10. 发明申请
    • DISK SURFACE DEFECT INSPECTION METHOD AND APPARATUS
    • 磁盘表面缺陷检查方法和装置
    • US20110141598A1
    • 2011-06-16
    • US12967095
    • 2010-12-14
    • Hideki MOCHIZUKI
    • Hideki MOCHIZUKI
    • G11B5/02
    • G11B20/10527G11B19/048G11B20/18G11B2020/1823G11B2220/2516G11B2220/2537
    • There is provided a detect inspection method and apparatus capable of performing a quick process of determining whether defects on a disk form an annular scratch defect or an island defect, by detecting an annular scratch defect in sum track areas with a deviation exceeding the standard deviation of an amount of defects detected in radius, in the histogram data containing the number of defects in radius, or by detecting an island defect in sum angle areas with a deviation exceeding the standard deviation of an amount of defects detected in angle, in the histogram data containing the number of defects in angle. Thus, the defect detection process can be performed step by step, by separating the annular scratch defect or the island defect from the other detects. As a result, a process load on the data processor can be reduced even if the number of detected defects increases.
    • 提供一种检测检查方法和装置,其能够通过以超过标准偏差的偏差检测到和轨道区域中的环状划痕缺陷来执行确定盘上的缺陷是否形成环状划痕缺陷或岛缺陷的快速过程 在包含半径缺陷数的直方图数据中,或者通过在直方图数据中检测到具有偏离超过检测到的缺陷量的标准偏差的和角区域中的岛缺陷来检测半径的缺陷量 包含角度缺陷的数量。 因此,可以通过分离环境划痕缺陷或岛状缺陷来进行缺陷检测处理。 结果,即使检测到的缺陷的数量增加,也可以减少数据处理器上的处理负荷。