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1. 发明公开

US20230376019A1 INFORMATION MANAGEMENT SYSTEM AND INFORMATION MANAGEMENT METHOD 审中-公开
公开(公告)号：US20230376019A1
公开(公告)日：2023-11-23
申请号：US18138838
申请日：2023-04-25
申请人： OMRON Corporation
发明人： Kenichiro MORI
IPC分类号： G05B19/418
CPC分类号： G05B19/41875 , G05B19/4183 , G05B2219/32196 , G05B2219/32177
摘要： An information management method includes acquiring a component serial number identifying an individual of a target component used in each process and a unit serial number (or a product serial number) identifying an individual of an intermediate product (or a product) manufactured by the process according to work order of the process. The information management method includes registering the component serial number in a hierarchy of the target component in the acquired order in a BOM database, and registering the unit serial number (or the product serial number) in a hierarchy of the process in the acquired order in a BOP database.

2. 发明申请

US20180197714A1 Diagnostic Methods for the Classifiers and the Defects Captured by Optical Tools 审中-公开
公开(公告)号：US20180197714A1
公开(公告)日：2018-07-12
申请号：US15835399
申请日：2017-12-07
申请人： KLA-Tencor Corporation
发明人： Martin Plihal , Erfan Soltanmohammadi , Saravanan Paramasivam , Sairam Ravu , Ankit Jain , Prasanti Uppaluri , Vijay Ramachandran
IPC分类号： H01J37/22 , G01N23/04 , H01J37/28 , H01L21/67
CPC分类号： H01J37/222 , G01N23/04 , G05B19/41875 , G05B2219/32186 , G05B2219/32196 , H01J37/28 , H01J2237/22 , H01J2237/2817 , H01L21/67288
摘要： Wafer inspection with stable nuisance rates and defect of interest capture rates are disclosed. This technique can be used for discovery of newly appearing defects that occur during the manufacturing process. Based on a first wafer, defects of interest are identified based on the classified filtered inspection results. For each remaining wafer, the defect classifier is updated and defects of interest in the next wafer are identified based on the classified filtered inspection results.

3. 发明申请

US20170146975A1 OPERATOR AND MANUFACTURING QUALITY TRACEABILITY 审中-公开
公开(公告)号：US20170146975A1
公开(公告)日：2017-05-25
申请号：US14949748
申请日：2015-11-23
申请人： Toyota Motor Engineering & Manufacturing North America, Inc.
发明人： Frederick Joseph Clark
IPC分类号： G05B19/406
CPC分类号： G05B19/41875 , G05B2219/32196 , G05B2219/32368 , Y02P90/10 , Y02P90/22 , Y02P90/26
摘要： Operator and quality information can be traced during manufacturing processes. It can be determined whether an operator requesting access to the manufacturing process is authorized. If authorized, the operator can be granted access to the manufacturing process. Quality information including one or more quality checks associated with the operator can be received. It can be determined whether the one or more quality checks pass predetermined quality requirements. If the quality checks pass the predetermined quality requirements, identification information can be generated. The identification information can be used to apply a traceable output on a part associated with the manufacturing process. Traceability reports can be generated that include the operator identification and the quality information and that can be reviewed by external computing systems.

4. 发明申请

US20140189520A1 DIGITAL CHECKLIST 审中-公开
标题翻译：数字清单
公开(公告)号：US20140189520A1
公开(公告)日：2014-07-03
申请号：US13837888
申请日：2013-03-15
申请人： FLUKE CORPORATION
发明人： Robert C. Crepps , David C. Dyck , Nikola Mrvaljevic
IPC分类号： G06F3/0484
CPC分类号： G06F3/0484 , G05B19/41875 , G05B23/0216 , G05B2219/32196 , G05B2219/36159 , G06Q10/06 , Y02P90/18 , Y02P90/22
摘要： A digital checklist system includes an electronic calibration and measurement device and a computer-readable medium having computer-executable instructions stored thereon that, if executed by one or more processors of a computing device, cause the computing device to perform actions for managing a digital checklist The actions include creating a digital checklist having at least one unique prompt, selecting the digital checklist for uploading onto the electronic calibration and measurement device, and downloading data input into the electronic calibration and measurement device in response to the at least one unique prompt. The system further includes a network location for facilitating communication between the electronic calibration and measurement device and the computing device.
摘要翻译：数字清单系统包括电子校准和测量设备以及其上存储有计算机可执行指令的计算机可读介质，如果由计算设备的一个或多个处理器执行，则使计算设备执行用于管理数字检查表的动作所述动作包括创建具有至少一个唯一提示的数字检查表，选择用于上传到电子校准和测量装置的数字检查表，以及响应于至少一个唯一提示将数据输入电子校准和测量装置。该系统还包括用于促进电子校准和测量装置与计算装置之间的通信的网络位置。

5. 发明申请

US20120078409A1 Electronic Supervisor 有权
标题翻译：电子主管
公开(公告)号：US20120078409A1
公开(公告)日：2012-03-29
申请号：US13308573
申请日：2011-12-01
申请人： Jackie McGuinn , Tom Stephens , Steve Wilson , Stephen Logan , Mike Crumpler , Alon Stewart , Hugh Butler
发明人： Jackie McGuinn , Tom Stephens , Steve Wilson , Stephen Logan , Mike Crumpler , Alon Stewart , Hugh Butler
IPC分类号： G06Q10/00 , G06F7/00
CPC分类号： G05B19/41875 , G05B2219/32196 , G06Q10/087 , Y02P90/18 , Y02P90/22
摘要： Electronic supervision may be provided. First, a stock number may be sent to a database server. The stock number may correspond to a product comprising, for example, an electrical cable. In response to sending the database server the stock number, specification information corresponding to the product may be received from a database stored on the database server. The specification information may comprise, for an electrical cable, a number of wires, a weight per thousand feet, and a diameter. Next, product production may be monitored to determine faults occurring during production. Monitoring the production may comprise displaying a data monitoring screen to production personnel. The data monitoring screen may provide data regarding the product and product comparison against a standard maintained within the database for the product. Fault data corresponding to the determined faults occurring during the production may be saved to the database.
摘要翻译：可以提供电子监督。首先，可以将库存号码发送到数据库服务器。库存号可以对应于包括例如电缆的产品。响应于发送数据库服务器的库存号，可以从存储在数据库服务器上的数据库接收对应于产品的规格信息。对于电缆，规格信息可以包括多条电线，每千英尺的重量和直径。接下来，可以监视产品生产以确定生产期间发生的故障。监视生产可能包括向生产人员显示数据监控画面。数据监视屏幕可以提供关于产品和产品比较的数据与产品数据库内维护的标准。与生产期间发生的确定故障相对应的故障数据可以保存到数据库。

6. 发明授权

US07689313B2 Electronic device history record and product release system 有权
标题翻译：电子设备历史记录和产品发布系统
公开(公告)号：US07689313B2
公开(公告)日：2010-03-30
申请号：US11416026
申请日：2006-05-02
申请人： Ravi Sanka , John Lepper , Washington Candido , H. Lamar Walker , J. Mark Jones
发明人： Ravi Sanka , John Lepper , Washington Candido , H. Lamar Walker , J. Mark Jones
IPC分类号： G06F19/00 , G01N37/00 , G06F17/40 , G02C7/02 , G06F17/30
CPC分类号： G05B19/41875 , G05B2219/32196 , G05B2219/32212 , Y02P90/22
摘要： A method for monitoring the manufacture of molded ophthalmic lenses is disclosed. The method monitors the occurrence of predetermined events and records such events in a device history record and a shadow table.
摘要翻译：公开了一种用于监测模制眼镜片的制造的方法。该方法监视预定事件的发生并将这些事件记录在设备历史记录和影子表中。

7. 发明申请

US20100042232A1 Method for operating an industrial plant 审中-公开
标题翻译：操作工厂的方法
公开(公告)号：US20100042232A1
公开(公告)日：2010-02-18
申请号：US11919092
申请日：2006-04-21
申请人： Andreas Hildebrand , Thomas Helm , Oliver Seydell , Andreas Pirsing
发明人： Andreas Hildebrand , Thomas Helm , Oliver Seydell , Andreas Pirsing
IPC分类号： G06F19/00
CPC分类号： G05B19/41875 , G05B2219/31455 , G05B2219/32196 , Y02P90/14 , Y02P90/22
摘要： A process is disclosed for operating an industrial plant by means of a guidance system that controls processes in the industrial plant, in which process operation-relevant data such as states, malfunctions and/or degradation of devices of the industrial plant are acquired by an operator; the operation-relevant data are acquired in an operation monitoring system and stored in electronic, preferably standardized form, and operation-relevant data on events which can affect process control, such as malfunctions of devices, are electronically transmitted to the guidance system. Operation-relevant data and events can thus be reliably archived, documented and made available to the operators of the industrial plant, it being ensured that process-relevant data are taken into account in the guidance system even when said data relate to devices which are not connected to the guidance system
摘要翻译：公开了一种用于通过控制工业设备中的过程的引导系统来操作工业设备的过程，其中操作相关数据例如工厂的设备的状态，故障和/或劣化由操作者获取 ; 操作相关数据在操作监视系统中获取并以电子，优选标准化形式存储，并且可以将影响过程控制（例如设备故障）的事件的操作相关数据电子传送到引导系统。因此，操作相关的数据和事件可以被可靠地存档，记录并提供给工厂的操作者，确保在引导系统中考虑过程相关数据，即使所述数据与不是的设备相关连接到引导系统

8. 发明授权

US07424336B2 Test data analyzing system and test data analyzing program 失效
标题翻译：测试数据分析系统和测试数据分析程序
公开(公告)号：US07424336B2
公开(公告)日：2008-09-09
申请号：US11483740
申请日：2006-07-11
申请人： Makoto Ono , Junko Konishi
发明人： Makoto Ono , Junko Konishi
IPC分类号： G06F19/00
CPC分类号： G05B19/41875 , G05B23/024 , G05B2219/32196 , G05B2219/32206 , Y02P90/22 , Y02P90/86
摘要： Disclosed is a test data analyzing method and system for use in estimation of a defect cause of a product, such as, an integrated circuit, a liquid crystal display, an optical transceiver, a thin film magnetic head, etc., which is fabricated through plural processes. The estimation of a defect cause is achieved by selecting a wafer number to be analyzed, reading test data, reading fabrication line data, counting frequency of machine codes by wafers, grouping test data by machine codes or frequencies, comparing test data distributions between groups by machine codes, and comparing results between machine codes.
摘要翻译：公开了一种用于估计产品的缺陷原因的测试数据分析方法和系统，例如集成电路，液晶显示器，光收发器，薄膜磁头等，其通过多个过程。缺陷原因的估计是通过选择要分析的晶片数量，读取测试数据，读取制造线数据，通过晶片对机器代码的计数频率，通过机器代码或频率分组测试数据来实现的，比较组之间的测试数据分布，通过机器代码，并比较机器代码之间的结果。

9. 发明申请

US20080191004A1 Quality Management Method For Aerospace Machine Element Product and Aerospace Bearing 有权
标题翻译：航空航天机器元件产品和航空轴承质量管理方法
公开(公告)号：US20080191004A1
公开(公告)日：2008-08-14
申请号：US11659814
申请日：2005-02-24
申请人： Shouhei Nakamura
发明人： Shouhei Nakamura
IPC分类号： G06F7/00
CPC分类号： F16C41/008 , F16C2326/43 , G05B19/4183 , G05B2219/31034 , G05B2219/31304 , G05B2219/32196 , Y02P90/04 , Y02P90/10 , Y02P90/22
摘要： A aerospace machine element product (1) to be managed comprises a plurality of assembled components (2) ((1) to (3)). Each of the plurality of components (2) ((1) to (3)) is manufactured through a material purchase process (S1), a forging process (S2), a heat treatment process (S3), a grinding process (S4), surface treatment process (S5), and inspection process (S6). The information of the processes (S1) to (S2) is recorded on an IC tag (4) together with the lot numbers of the processes. After the components (2) have been assembled in the aerospace machine element product (1), the recorded information regarding the components (2) on the IC tag (4) is recorded in a management computer system (11) so as to be related to a manufacturing number or a manufacturing lot number. Another IC tag (10) is attached to the aerospace machine element product (1) and the manufacturing number or the lot number is recorded on the IC tag (10). In addition, processing condition information about the forging, heat treatment, grinding, surface treatment processes is recorded on this IC tag (10).
摘要翻译：待管理的航空航天机器元件产品（1）包括多个组装部件（2）（（1）至（3））。多个组件（2）（（1）至（3））中的每一个通过材料购买过程（S1），锻造工艺（S 2），热处理工艺（S 3），研磨工艺（S 4），表面处理工序（S 5）和检查工序（S6）。处理（S 1）〜（S 2）的信息与处理的批号一起记录在IC标签（4）上。在组件（2）已经组装在航空航天机器元件产品（1）中之后，关于IC标签（4）上的部件（2）的记录信息被记录在管理计算机系统（11）中，以便相关到制造编号或制造批号。另外，IC卡（10）与航空航天机器元件（1）连接，制造编号或批号被记录在IC标签（10）上。此外，在该IC标签（10）上记录关于锻造，热处理，研磨，表面处理处理的处理条件信息。

10. 发明授权

US07403871B2 Extraction of imperfection features through spectral analysis 有权
标题翻译：通过光谱分析提取不完美特征
公开(公告)号：US07403871B2
公开(公告)日：2008-07-22
申请号：US11743550
申请日：2007-05-02
申请人： Wanda G. Papadimitriou , Stylianos Papadimitriou
发明人： Wanda G. Papadimitriou , Stylianos Papadimitriou
IPC分类号： G01B5/28 , G06F17/40
CPC分类号： G01R33/072 , G01N27/9046 , G05B19/41875 , G05B2219/32196 , Y02P80/40 , Y02P90/22
摘要： Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection system may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.
摘要翻译：自动无损检测设备可自动和/或连续检查和评估被检查材料。检查设备优选地包括用于计算机的至少一个检测传感器和至少一个检测传感器接口。自主的非破坏性检测系统也可以通过频谱分析和传感器补偿提取相关特征并利用自主无损检测系统中的特征，将其改造成传统检测系统。

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