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1. 发明申请

US20170343415A1 INTERFEROMETER WITH AN OSCILLATING REFLECTOR PROVIDED BY AN OUTER SURFACE OF A SONOTRODE AND FOURIER TRANSFORM INFRARED SPECTROMETER 审中-公开
公开(公告)号：US20170343415A1
公开(公告)日：2017-11-30
申请号：US15528575
申请日：2015-11-24
申请人： FREIE UNIVERSITAET BERLIN
发明人： Bjoern SUESS
IPC分类号： G01J3/28 , G01J3/02 , G01J3/453 , G02B26/00
CPC分类号： G01J3/2889 , G01J3/021 , G01J3/4532 , G01J3/4535 , G02B26/001
摘要： The present invention is directed to an Interferometer (100) comprising a source (110) of a primary energy beam (111), a first reflector (120) being provided static such that a first path length from the source (110) to the first reflector (120) is constant, a reflector (1) with an energy beam reflecting surface (20) being provided by an outer surface of a sonotrode (10), wherein the reflector (1) is provided to oscillate such that a second path length from the source (110) to the reflecting surface (20) is variable, a target (140), a means for splitting an energy beam (160) arranged such that it divides the primary beam (111) into a first energy beam (112) incident onto the first reflector (120), and a second energy beam (113) incident onto the reflector (1) adapted to oscillate, and a means for combining energy beams (170) arranged such that it combines a third energy beam (114) reflected from the first reflector (120) and a fourth energy beam (115) reflected from the reflector (1) adapted to oscillate incident onto the target (140). Further provided is an infrared Fourier transform spectrometer (200).

2. 发明申请

US20160084763A1 SYSTEM AND METHOD FOR EFFICIENT DETECTION OF THE PHASE AND AMPLITUDE OF A PERIODIC MODULATION ASSOCIATED WITH SELF-INTERFERING FLUORESCENCE 有权
标题翻译：有效检测与自干扰荧光相关的周期调制相位和幅度的系统和方法
公开(公告)号：US20160084763A1
公开(公告)日：2016-03-24
申请号：US14890530
申请日：2014-05-13
申请人： THE GENERAL HOSPITAL CORPORATION
发明人： Johannes F. de Boer , Mattijs De Groot
IPC分类号： G01N21/64
CPC分类号： G01N21/6458 , G01J3/0218 , G01J3/433 , G01J3/4406 , G01J3/453 , G01J3/4532 , G01J3/4537 , G01N21/4795 , G01N21/6486 , G01N2021/6463 , G01N2021/6484
摘要： Systems and methods according to exemplary embodiments of the present disclosure can be provided that can efficiently detect the amplitude and phase of a spectral modulation. Such exemplary scheme can be combined with self-interference fluorescence to facilitate a highly sensitive depth localization of self-interfering radiation generated within a sample. The exemplary system and method can facilitate a scan-free depth sensitivity within the focal depth range for microscopy, endoscopy and nanoscopy.
摘要翻译：可以提供根据本公开的示例性实施例的系统和方法，其可以有效地检测频谱调制的幅度和相位。这种示例性方案可以与自身干涉荧光结合，以促进在样品内产生的自干扰辐射的高度敏感的深度定位。示例性系统和方法可以在显微镜，内窥镜检查和纳米镜检查的焦深范围内促进无扫描深度灵敏度。

3. 发明申请

US20150085284A1 STATIC INTERFEROMETER WITH STEP-STYLE REFLECTIVE ELEMENT 有权
标题翻译：具有步态反射元件的静态干涉仪
公开(公告)号：US20150085284A1
公开(公告)日：2015-03-26
申请号：US14518588
申请日：2014-10-20
申请人： WAYNE STATE UNIVERSITY
发明人： Gregory W. Auner , Changhe Huang , Christopher M. Thrush , Michelle Brusatori
IPC分类号： G01J3/02 , G01J3/44 , G01J3/45
CPC分类号： G01J3/021 , G01J3/18 , G01J3/44 , G01J3/4412 , G01J3/45 , G01J3/4531 , G01J3/4532 , G02B5/1861
摘要： An apparatus for performing Raman spectral analysis of a sample is described, comprising a coherent light source, an first optical chain to direct the coherent light to impinge on the sample, a second optical chain to direct the scattered light onto a diffraction grating, and a third optical chain to direct the diffracted light onto detection array. The diffraction grating is a stairstep with a metalized surface, and a plurality of metalized stripes on a flat surface is disposed in a direction orthogonal to the long dimension of the stairsteps. The region between the flat surface and the stairstep is transparent. The zeroth-order fringe is selected by a slit and directed onto camera. The resultant interferogram is Fourier transformed to produce a representation of the Raman spectrum.
摘要翻译：描述了一种用于执行样本的拉曼光谱分析的装置，包括相干光源，用于引导相干光照射到样本上的第一光链，将散射光引导到衍射光栅上的第二光链，以及第三光链以将衍射光引导到检测阵列上。衍射光栅是具有金属化表面的阶梯，并且平坦表面上的多个金属化条纹沿着与步态的长尺寸正交的方向设置。平坦表面和阶梯之间的区域是透明的。零级条纹由狭缝选择并定向到相机上。所得干涉图被傅立叶变换以产生拉曼光谱的表示。

4. 发明授权

US08830475B1 Interferometer and spatial interference fourier transform spectrometer 有权
标题翻译：干涉仪和空间干涉傅里叶变换光谱仪
公开(公告)号：US08830475B1
公开(公告)日：2014-09-09
申请号：US13969634
申请日：2013-08-19
申请人： National Cheng Kung University
发明人： Wei-Chih Wang , Benjamin Estroff , Chih-Han Chang , Fong-Chin Su
IPC分类号： G01J3/45 , G01B9/02
CPC分类号： G01J3/45 , G01J3/021 , G01J3/4531 , G01J3/4532
摘要： Disclosed is an interferometer comprising a light source, a reflective element, and a photodetector. The light source is configured to emit a light beam, and an angle is formed by inclusion between a direction to which the light beam travels and the reflective element, the photodetector is configured to be substantially perpendicular to the reflective element. The light beam is halved into a first light beam propagating by the included angle, and a second light beam reflected off the reflective element, the first light beam and the second light beam interfere each other to form an interferogram on the photodetector, which detects the interferogram. By benefit of above, the interferometer does not need to reposition its parts in order to make adjustment to interferogram, thereby simplifying optical element setup and minimizing physical volume of the interferomger. Also disclosed is a spectrometer including the same interferometer and a Fourier-transform-capable analyzer.
摘要翻译：公开了一种包括光源，反射元件和光电检测器的干涉仪。光源被配置为发射光束，并且通过在光束行进的方向与反射元件之间包含形成角度，光电检测器被配置为基本上垂直于反射元件。光束被分成一个以夹角传播的第一光束，并且从反射元件反射的第二光束，第一光束和第二光束彼此相互干涉以在光电检测器上形成干涉图，该光检测器检测干涉图。受益于上述，干涉仪不需要重新定位其部件以便调整干涉图，从而简化了光学元件的设置并使干涉仪的体积最小化。还公开了包括相同干涉仪和具有傅里叶变换的分析仪的光谱仪。

5. 发明申请

US20140152993A1 INTERFEROMETER AND SPECTROMETER INCLUDING SAME 有权
标题翻译：干涉仪和测光仪包括相同
公开(公告)号：US20140152993A1
公开(公告)日：2014-06-05
申请号：US14131828
申请日：2012-06-14
申请人： Yusuke Hirao
发明人： Yusuke Hirao
IPC分类号： G01J3/453 , G01J9/02
CPC分类号： G01J3/4532 , G01J3/027 , G01J3/0289 , G01J3/45 , G01J3/4535 , G01J9/02
摘要： An optical path of measurement light emitted from a measurement light source is overlaid by a beam combiner on an optical path of reference light emitted from a reference light source. The measurement light emitted from the measurement light source includes light in the sensitivity wavelength range (S1) of a measurement light detector and light in the sensitivity wavelength range (S2) of a reference light detector. An interferometer includes a wavelength separation filter that cuts light in at least a part of the sensitivity wavelength range (S2) of the reference light detector, of light included in the wavelength range of the measurement light.
摘要翻译：从测量光源发射的测量光的光路由从参考光源发射的参考光的光路上的光束组合器重叠。从测量光源发射的测量光包括测量光检测器的灵敏度波长范围（S1）中的光和参考光检测器的灵敏度波长范围（S2）中的光。干涉仪包括：波长分离滤光器，其在包括在测量光的波长范围内的光中，在参考光检测器的灵敏度波长范围（S2）的至少一部分上切割光。

6. 发明申请

US20140125983A1 INTERFEROMETERY ON A PLANAR SUBSTRATE 审中-公开
标题翻译：平面基板上的干涉仪
公开(公告)号：US20140125983A1
公开(公告)日：2014-05-08
申请号：US14122773
申请日：2012-05-30
申请人： Arthur Nitkowski , Arsen Hajian
发明人： Arthur Nitkowski , Arsen Hajian
IPC分类号： G01J9/02
CPC分类号： G01J9/02 , A61B5/0066 , G01B9/02004 , G01B9/02044 , G01B9/02051 , G01B9/02091 , G01B2290/40 , G01J3/0218 , G01J3/0259 , G01J3/0291 , G01J3/4531 , G01J3/4532 , G01J2003/451
摘要： An interferometer comprising a planar substrate is provided. The interferometer has a splitter formed on the planar substrate to split a received optical signal, a sample arm formed on the planar substrate to receive a first portion of the split optical signal and direct the first portion toward a sample, a reference arm formed on the planar substrate to receive a second portion of the split optical signal, and a detector element to receive an interferogram generated by interfering the second portion of the split optical signal with a received sample signal generated by the first portion of the split signal interacting with the sample.
摘要翻译：提供了包括平面基板的干涉仪。所述干涉仪具有形成在所述平面基板上以分裂接收到的光信号的分离器，形成在所述平面基板上的样本臂，以接收所述分割光信号的第一部分并将所述第一部分引向样本，平面基板以接收分离光信号的第二部分，以及检测器元件，用于接收通过将分离光信号的第二部分与由样本相互作用的分离信号的第一部分产生的接收采样信号而产生的干涉图。

7. 发明授权

US08559011B2 Micro-spectral sensor 失效
标题翻译：微光谱传感器
公开(公告)号：US08559011B2
公开(公告)日：2013-10-15
申请号：US13296317
申请日：2011-11-15
申请人： Michael Wilson , Thomas G Giallorenzi
发明人： Michael Wilson , Thomas G Giallorenzi
IPC分类号： G01B9/02 , G01J3/45 , G01N21/25
CPC分类号： G01J3/26 , G01J3/2823 , G01J3/4532 , G01J2003/064
摘要： Micro-spectral sensors and methods are presented in which a Fizeau wedge interference filter is disposed between a focal plane array and a visible scene with an increasing wedge filter dimension varying along a scan direction, where the scene is scanned along the FPA to obtain light intensity measurements of a given scene location at different times using different FPA sensor elements through different wedge filter thicknesses, and the measurements correlated to the given scene location are Fourier transform to generate spectral data for the location.
摘要翻译：提出了微光谱传感器和方法，其中Fizeau楔形干涉滤光器设置在焦平面阵列和可见场景之间，其中沿着扫描方向变化的楔形滤波器尺寸增加，其中沿FPA扫描场景以获得光强度使用不同的FPA传感器元件通过不同的楔形滤波器厚度在不同时间对给定场景位置的测量以及与给定场景位置相关的测量进行傅立叶变换以产生位置的光谱数据。

8. 发明授权

US08406580B2 Planar lightwave fourier-transform spectrometer measurement including phase shifting for error correction 有权
标题翻译：平面光波傅里叶变换光谱仪测量包括用于纠错的相移
公开(公告)号：US08406580B2
公开(公告)日：2013-03-26
申请号：US13192577
申请日：2011-07-28
申请人： Kazumasa Takada , Katsunari Okamoto
发明人： Kazumasa Takada , Katsunari Okamoto
IPC分类号： G02B6/12 , G01J3/45
CPC分类号： G01J3/4531 , G01J3/45 , G01J3/4532
摘要： A transform spectrometer measurement apparatus and method for a planar waveguide circuit (PLC). The spectrometer typically includes an input optical signal waveguide carrying an input optical signal; a plurality of couplers, each connected to the input optical signal waveguide, and each including a coupler output for carrying a coupled optical signal related to the input optical signal; and an array of interleaved, waveguide Mach-Zehnder interferometers (MZI), each having at least one input MZI waveguide, each MZI input waveguide receiving a coupled optical signal from a respective coupler output. A phase shifting circuit is applied to at least one arm of the MZIs to induce an active phase shift on the arm to thereby measure phase error in the MZIs. Light output from the MZIs is measured under intrinsic phase error conditions and after an active phase shift by the phase shifting circuit.
摘要翻译：一种用于平面波导电路（PLC）的变换光谱仪测量装置和方法。光谱仪通常包括承载输入光信号的输入光信号波导; 多个耦合器，各自连接到输入光信号波导，并且每个耦合器包括耦合器输出，用于承载与输入光信号相关的耦合光信号; 以及每个具有至少一个输入MZI波导的交错的波导马赫 - 策德尔干涉仪阵列（MZI），每个MZI输入波导从相应的耦合器输出接收耦合的光信号。移相电路施加到MZI的至少一个臂，以引起臂上的有源相移，从而测量MZI中的相位误差。来自MZI的光输出在固有相位误差条件下测量，并在相移电路进行有源相移之后测量。

9. 发明申请

US20120250017A1 Interferometry-Based Downhole Analysis Tool 有权
标题翻译：基于干涉测井的井下分析工具
公开(公告)号：US20120250017A1
公开(公告)日：2012-10-04
申请号：US13147478
申请日：2009-12-23
申请人： Marian L. Morys , Steve Zannoni , Christopher M. Jones
发明人： Marian L. Morys , Steve Zannoni , Christopher M. Jones
IPC分类号： G01B9/02 , G01N21/84
CPC分类号： G01N21/31 , E21B49/088 , G01J3/021 , G01J3/4532 , G01J3/4535 , G01J2003/4534 , G01N21/33 , G01N21/35 , G01N21/3577 , G01N2021/3595
摘要： Various systems and methods for performing optical analysis downhole with an interferogram (a light beam having frequency components with a time variation that identifies those frequency components. The interferogram is produced by introducing an interferometer into the light path, with the two arms of the interferometer having a propagation time difference that varies as a function of time. Before or after the interferometer, the light encounters a material to be analyzed, such as a fluid sample from the formation, a borehole fluid sample, a core sample, or a portion of the borehole wall. The spectral characteristics of the material are imprinted on the light beam and can be readily analyzed by processing electronics that perform a Fourier Transform to obtain the spectrum or that enable a comparison with one or more templates. An interferometer designed to perform well in the hostile environments downhole is expected to enable laboratory-quality measurements.
摘要翻译：用干涉图进行井下光学分析的各种系统和方法（具有识别那些频率分量的具有时间变化的频率分量的光束）通过将干涉仪引入光路而产生干涉图，干涉仪的两个臂具有传播时间差随时间而变化在干涉仪之前或之后，光线遇到要分析的材料，例如来自地层的流体样品，井眼流体样品，核心样品或一部分材料的光谱特性被印在光束上，并且可以通过进行傅里叶变换的处理电子装置容易地进行分析，以获得光谱或使得能够与一个或多个模板进行比较。预计井下敌对环境将能够实现实验室质量测量。

10. 发明授权

US07995211B2 Contra-propagative wave spectograph 有权
标题翻译：对比传播波分析仪
公开(公告)号：US07995211B2
公开(公告)日：2011-08-09
申请号：US12063214
申请日：2006-08-04
申请人： Etienne Le Coarer , Pierre Benech , Pierre Kern , Gilles Lerondel , Sylvain Blaize , Alain Morand
发明人： Etienne Le Coarer , Pierre Benech , Pierre Kern , Gilles Lerondel , Sylvain Blaize , Alain Morand
IPC分类号： G01B9/02 , G01J3/45
CPC分类号： G01J3/4531 , G01J3/02 , G01J3/0218 , G01J3/0259 , G01J3/2803 , G01J3/4532
摘要： The invention relates to a spectrograph (11) comprising a waveguide (10) provided with accesses (10; 10b, 12), a means for injecting two guided contra-propagative waves by each accesses in such a way that a spatial interference is formed in the waveguide, means (19, 20, 14, 16) for detecting the energy of the evanescent wave of the guided field produced by the interference of said contra-propagative waves.
摘要翻译：本发明涉及一种包括设置有存取（10; 10b，12）的波导（10）的光谱仪（11），用于通过每次访问注入两个引导的反向传播波的装置，以便形成空间干扰波导，用于检测由所述反向传播波的干涉产生的引导场的ev逝波的能量的装置（19,20,14,16）。

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