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1. 发明申请

US20180202954A1 METHOD FOR COATING A SURFACE OF A METAL STRIP AND A METAL STRIP-COATING DEVICE 审中-公开
公开(公告)号：US20180202954A1
公开(公告)日：2018-07-19
申请号：US15736706
申请日：2016-06-23
申请人： THYSSENKRUPP STEEL EUROPE AG , thyssenkrupp AG
发明人： Thomas MÖLLER , Arno NEERFRIES , Ingo ROGNER
IPC分类号： G01N25/72 , B05C11/10 , B05C1/02 , B05C13/00 , G01B21/08 , B05D1/28 , B05D7/14
CPC分类号： G01N25/72 , B05C1/025 , B05C1/0826 , B05C5/0245 , B05C11/1005 , B05C13/00 , B05D1/28 , B05D7/14 , B05D2252/02 , G01B21/085 , G01N21/00 , G01N21/8914 , G01N2021/8918
摘要： A method for coating a surface of a substrate may involve coating the surface of the substrate with a wet coating by way of a coating station, conveying the substrate by way of a conveying device, and detecting the surface coated with the wet coating by producing a thermal image of a detection region that comprises part of the surface. The thermal image may be recorded in a spectral range that includes a wavelength between 1 micrometer and 20 micrometers. Further, the detection region may be located directly downstream of the coating station, or the detection region may at least partially include the coating station.

2. 发明申请

US20180171467A1 Method of Manufacturing Semiconductor Device, Substrate Processing Apparatus and Non-Transitory Computer-Readable Recording Medium 审中-公开
公开(公告)号：US20180171467A1
公开(公告)日：2018-06-21
申请号：US15849271
申请日：2017-12-20
申请人： Hitachi Kokusai Electric Inc.
发明人： Hiroki HATTA , Hideki HORITA
IPC分类号： C23C14/54 , G01B21/08 , C23C16/52 , H01L21/02 , H01L21/66 , B05D1/00 , C23C16/34
CPC分类号： C23C14/542 , B05D1/60 , C23C16/345 , C23C16/45502 , C23C16/45548 , C23C16/52 , G01B21/085 , G06F17/50 , H01L21/0217 , H01L21/022 , H01L21/02211 , H01L21/0228 , H01L21/02334 , H01L22/12
摘要： A technique capable of controlling a film thickness distribution formed on a surface of a substrate includes: forming a film on a substrate by performing a cycle a predetermined number of times, the cycle including: (a) supplying a source to the substrate accommodated in a process chamber; (b) exhausting the source from the process chamber; (c) supplying a reactant to the substrate accommodated in the process chamber; and (d) exhausting the reactant from the process chamber, wherein (a) through (d) are performed non-simultaneously, and the cycle further includes at least one of: (e) starting a next step with the source remaining in a center portion of a substrate surface after a first predetermined time elapses from a start of (b); and (f) starting a next step with the reactant remaining in the center portion of the substrate's surface after a second predetermined time elapses from a start of (d).

3. 发明授权

US09778031B2 Method for thermally monitoring process for forming plastic blow-molded containers 有权
公开(公告)号：US09778031B2
公开(公告)日：2017-10-03
申请号：US14824904
申请日：2015-08-12
申请人： GRAHAM PACKAGING COMPANY, L.P.
发明人： Patrick M. O'Connell , Garrett R. Pennington , Russell Varone
IPC分类号： G01B21/08 , B29C49/28 , B29C49/04 , B29C49/42 , B29C49/78 , B29L31/00 , B29C49/36
CPC分类号： G01B21/085 , B29C49/04 , B29C49/28 , B29C49/36 , B29C49/42 , B29C49/78 , B29C2949/78151 , B29C2949/78168 , B29C2949/7821 , B29C2949/7826 , B29C2949/78512 , B29C2949/78563 , B29C2949/78605 , B29C2949/78663 , B29C2949/78722 , B29L2031/7158
摘要： The present invention provides a method of measuring the placement of material forming a blow-molded plastic container after the container is released from a mold of a blow molder having a plurality of molds, wherein each plastic container comprises a continuous sidewall and a base, the method comprising the steps of: detecting with an infrared camera infrared light emitted from the container after the container is released from a mold; converting the detected infrared light into corresponding electrical signals; transmitting the electrical signals to a microprocessor; comparing in the microprocessor the electrical signals with stored data regarding desired material distribution forming the plastic container; and producing output information regarding the placement of material forming the container.

4. 发明申请

US20170067128A1 CONVERTER SLAGGING MONITORING METHOD AND SYSTEM 审中-公开
标题翻译：转换器SLAGGING监控方法与系统
公开(公告)号：US20170067128A1
公开(公告)日：2017-03-09
申请号：US15120486
申请日：2014-10-20
申请人： HUNAN RAMON SCIENCE & TECHNOLOGY CO., LTD.
发明人： Lu TIAN , Taotao HE
IPC分类号： C21C5/46 , G01B21/08
CPC分类号： C21C5/4673 , C21C2005/5288 , C21C2300/02 , C21C2300/06 , F27D19/00 , F27D21/00 , F27D21/0028 , G01B21/08 , G01B21/085 , Y02P10/216 , Y02P10/286
摘要： A converter slagging monitoring method and device. The method comprises: acquiring converter smelting data containing converter noise data and oxygen lance vibration data in real time; based on a pre-established slagging monitoring model, calculating the thickness of slags in a converter molten bath by virtue of the acquired converter smelting data; comparing the calculated thickness of slags with a splashing threshold value and a drying threshold value which are contained in the slagging monitoring model, judging whether a comparison result characterizes the occurrence of splashing or drying, and when the comparison result characterizes the occurrence of splashing or drying, acquiring corresponding splashing information or drying information; and finally, according to the splashing information or drying information, making a corresponding splashing control scheme or drying control scheme to guide a subsequent slagging operation so as to achieve the smooth control of the lance position.
摘要翻译： A转炉排渣监测方法及装置。该方法包括：实时获取包含转换器噪声数据和氧枪振动数据的转炉熔炼数据; 基于预先确定的造渣监测模型，通过获得的转炉冶炼数据计算转炉熔池中炉渣的厚度; 将计算出的炉渣厚度与排渣监测模型中包含的飞溅阈值和干燥阈值进行比较，判断比较结果是否表征飞溅或干燥的发生，以及比较结果是否表示飞溅或干燥的发生获取相应的飞溅信息或干燥信息; 最后，根据飞溅信息或干燥信息，制作相应的飞溅控制方案或干燥控制方案以引导随后的排渣操作，以实现喷枪位置的平稳控制。

5. 发明申请

US20120288616A1 MEASUREMENT METHOD AND DEVICE FOR MEASURING LAYER THICKNESSES AS WELL AS PRODUCTION METHOD AND COATING SYSTEM 有权
标题翻译：用于测量层厚度的测量方法和装置作为生产方法和涂层系统
公开(公告)号：US20120288616A1
公开(公告)日：2012-11-15
申请号：US13468639
申请日：2012-05-10
申请人： Jochen Zierhut , Susanne Hogger
发明人： Jochen Zierhut , Susanne Hogger
IPC分类号： G01B21/10 , B05D3/12
CPC分类号： G01B11/0683 , G01B5/0014 , G01B21/085
摘要： A method for measuring the thickness of a coating on a component section of a rotating component, wherein a heat expansion of the component section is determined by detecting a component core temperature and an actual coating thickness is produced, a device for conducting a method of this type having a temperature detecting system and having an evaluating device, as well as a production process and a coating system, are disclosed.
摘要翻译：一种用于测量旋转部件的部件上的涂层的厚度的方法，其中通过检测部件芯温度并且产生实际涂层厚度来确定部件的热膨胀，用于执行该方法的装置具有温度检测系统并具有评估装置的类型以及生产过程和涂覆系统。

6. 发明授权

US08195420B2 Device for measuring alignment of adjoining structures 有权
标题翻译：用于测量相邻结构的对准的装置
公开(公告)号：US08195420B2
公开(公告)日：2012-06-05
申请号：US12545383
申请日：2009-08-21
申请人： Francois De Crecy
发明人： Francois De Crecy
IPC分类号： G01B21/00
CPC分类号： G01B21/085 , B81C3/004 , B81C2203/051 , G01B21/16 , G01M99/002 , H01L21/67242
摘要： The invention relates to the field of micro- and nanotechnologies. In these techniques, it is sometimes necessary to glue several structures face to face and it is important to be able to check the alignment of the structures. A new method for measuring alignment, which comprises the following operations, is proposed for this purpose: activation of a heating element placed on the surface of the first structure, generation of electronic signals representative of a distribution of temperatures, on the basis of an array of temperature sensitive elements placed on the surface of the second structure, determination of a relative position of the heating element with respect to the array of sensitive elements, therefore of the first structure with respect to the second, on the basis of the distribution of temperatures, in a calculation circuit receiving the electronic signals engendered in the array of sensitive elements.
摘要翻译：本发明涉及微纳米技术领域。在这些技术中，有时需要面对面地粘合几个结构，并且能够检查结构的对准是重要的。提出了一种用于测量对准的新方法，其包括以下操作：基于阵列激活放置在第一结构的表面上的加热元件，产生代表温度分布的电子信号温度敏感元件放置在第二结构的表面上，基于温度分布来确定加热元件相对于敏感元件阵列的相对位置，因此第一结构相对于第二结构相对于第二结构在计算电路中接收产生在敏感元件阵列中的电子信号。

7. 发明申请

US20110085582A1 METHOD FOR STUDYING THE SURFACE COMPOSITION OF PLANAR STRUCTURES 审中-公开
标题翻译：研究平面结构表面组成的方法
公开(公告)号：US20110085582A1
公开(公告)日：2011-04-14
申请号：US12734700
申请日：2008-11-19
申请人： Bernhard Zagar , Florian Maier
发明人： Bernhard Zagar , Florian Maier
IPC分类号： G01N25/00
CPC分类号： G01B21/085 , G01N25/72
摘要： The invention relates to a method for studying the surface composition of planar structures (1), wherein specific surface areas are first heated continuously in a controlled way by a heat source (2), which is moved along the surface, and a temperature measurement is performed after a predetermined time, in order to determine the cooling behavior. High precision can be achieved in that the surface areas which are heated by the heat source (2) are detected at multiple moments by a thermal imaging camera (3), in order to prepare a temperature profile of individual surface points. Furthermore, the present invention relates to a device for performing the method.
摘要翻译：本发明涉及一种用于研究平面结构（1）的表面组成的方法，其中比表面积首先通过沿着表面移动的热源（2）以受控的方式连续地加热，并且温度测量是在预定时间之后执行，以便确定冷却行为。可以通过热成像相机（3）在多个时刻检测由热源（2）加热的表面积，从而准备各个表面点的温度分布，可以实现高精度。此外，本发明涉及一种用于执行该方法的装置。

8. 发明申请

US20090262777A1 HEAT FLUX MEASUREMENT DEVICE FOR ESTIMATING FOULING THICKNESS 有权
标题翻译：用于估算加热厚度的热通量测量装置
公开(公告)号：US20090262777A1
公开(公告)日：2009-10-22
申请号：US12105320
申请日：2008-04-18
申请人： Mohamed Sakami , James Michael Storey , Shobhana Mani , Fulton Jose Lopez
发明人： Mohamed Sakami , James Michael Storey , Shobhana Mani , Fulton Jose Lopez
IPC分类号： G01B7/06 , G01K7/06 , G01K17/00 , G01N25/20
CPC分类号： G01B21/085 , G01K17/20 , G01N17/008
摘要： A heat flux measurement device includes at least two thermocouples disposed within a front portion of the device at different axial distances from a front wall of the device. A correlation between the measured heat fluxes from the device over a period of time is used to estimate a fouling thickness on a wall, for example, a water wall of a radiant syngas cooler (RSC).
摘要翻译：热通量测量装置包括至少两个热电偶，其设置在与装置的前壁不同的轴向距离处的装置的前部内。使用在一段时间内来自装置的测量的热通量之间的相关性来估计壁上的结垢厚度，例如辐射合成气冷却器（RSC）的水壁。

9. 发明授权

US07581875B2 Method and apparatus for thin metal film thickness measurement 有权
标题翻译：薄金属薄膜厚度测量方法和设备
公开(公告)号：US07581875B2
公开(公告)日：2009-09-01
申请号：US11713233
申请日：2007-02-28
申请人： Yehiel Gotkis , Mikhail Korolik
发明人： Yehiel Gotkis , Mikhail Korolik
IPC分类号： G01N25/00 , G01K1/00
CPC分类号： G01B21/085
摘要： A method for measuring a metal film thickness is provided. The method initiates with heating a region of interest of a metal film with a defined amount of heat energy. Then, a temperature of the metal film is measured. Next, a thickness of the metal film is calculated based upon the temperature and the defined amount of heat energy. A chemical mechanical planarization system capable of detecting a thin metal film through the detection of heat transfer dynamics is also provided.
摘要翻译：提供了一种用于测量金属膜厚度的方法。该方法通过以限定量的热能加热金属膜的感兴趣区域来开始。然后，测量金属膜的温度。接下来，基于温度和限定的热能量计算金属膜的厚度。还提供了能够通过检测传热动力学来检测薄金属膜的化学机械平面化系统。

10. 发明申请

US20070109540A1 Method for measuring thin films 审中-公开
标题翻译：薄膜测量方法
公开(公告)号：US20070109540A1
公开(公告)日：2007-05-17
申请号：US10553146
申请日：2004-04-12
申请人： Alexei Maznev
发明人： Alexei Maznev
IPC分类号： G01N21/00 , G01B11/14
CPC分类号： G01N29/4418 , G01B11/0666 , G01B21/085 , G01N21/1717 , G01N21/8422 , G01N29/2418 , G01N29/4427 , G01N29/449 , G01N29/46 , G01N2291/015 , G01N2291/0237 , G01N2291/0423
摘要： The present invention provides a new method of laser-based metrology of very thin solid films (22) based on the generation of the refractive index grating in the gas or liquid medium in contact with the film (22). In a primary embodiment, excited acoustic waves (25) in the gas or liquid medium modulate an intensity of the diffracted probe beam resulting in a low-frequency component of the signal compared to the frequencies of the acoustic modes excited in the solid sample. Amplitude of this low-frequency component is correlated with the amount of energy absorbed by the film (22), and, consequently, with the film thickness, which provides a method for film thickness measurement as well as for a detection of a metal film on a dielectric underlayer.
摘要翻译：本发明提供了一种基于在与膜（22）接触的气体或液体介质中产生折射率光栅的非常薄的固体膜（22）的基于激光的计量的新方法。在主要实施例中，与固体样品中激发的声学模式的频率相比，气体或液体介质中的激发声波（25）调制衍射探针光束的强度，导致信号的低频分量。该低频分量的幅度与膜（22）吸收的能量的量相关，并且因此与膜厚度相关，膜厚度提供了用于膜厚度测量的方法以及金属膜的检测电介质底层。

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