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1. 发明授权

US12123710B2 Method for measuring the wall thickness of a hollow glass article 有权
公开(公告)号：US12123710B2
公开(公告)日：2024-10-22
申请号：US16984833
申请日：2020-08-04
申请人： Heye International GmbH
发明人： Dirk Pörtner
IPC分类号： G01B21/08 , C03B9/41 , C03B35/04 , C03B35/06 , G01N21/90
CPC分类号： G01B21/085 , C03B9/41 , C03B35/04 , C03B35/06 , G01N21/90 , G01N2021/9063
摘要： A method is provided for measuring the wall thickness of hollow glass articles in a hollow glass production system, wherein the IR radiation emitted by each hollow glass article exiting the hot end of a glass forming machine is detected at least in areas mapped by a function, the same hollow glass article, after having passed through an annealing lehr, being measured in the circumferential direction with respect to a wall thickness distribution, and the detected wall thickness distribution being mapped by a function. Using correlation methods, it is checked whether the progression of the function is contained in the function, wherein if so, measured values of the wall thickness can be associated with the measured values of the IR radiation at the hot end, so that the wall thickness distribution of the hollow glass article is already known at the hot end and implementable for monitoring purposes.

2. 发明公开

US20230400298A1 INTERNAL OXIDE LAYER THICKNESS ESTIMATION DEVICE, INTERNAL OXIDE LAYER THICKNESS ESTIMATION METHOD, AND PROGRAM 审中-公开
公开(公告)号：US20230400298A1
公开(公告)日：2023-12-14
申请号：US18033387
申请日：2021-11-02
申请人： NIPPON STEEL CORPORATION
发明人： Tooru AKASHI , Keita IKEDA , Yasumitsu KONDO , Naoki INOUE , Akinobu MINAMI
IPC分类号： G01B21/08
CPC分类号： G01B21/085
摘要： This internal oxide layer thickness estimation device estimates a thickness of an internal oxide layer formed in a hot-rolled steel sheet. The internal oxide layer thickness estimation device includes: a first temperature definition unit that defines a temperature of a portion to be estimated, in which the thickness of the internal oxide layer is to be estimated, in the hot-rolled steel sheet; a second temperature definition unit that defines an internal oxidation starting temperature at which internal oxidation of the hot-rolled steel sheet starts; a cumulative temperature calculation unit that calculates a cumulative temperature on the basis of the temperatures defined by the first temperature definition unit and the second temperature definition unit and a predetermined period of time from an estimation start time at which estimation of the thickness of the internal oxide layer is started to an estimation evaluation time; a first correlation expression derivation unit that derives a first correlation expression indicating a correlation between the cumulative temperature calculated by the cumulative temperature calculation unit and an estimated value of the thickness of the internal oxide layer; and an internal oxide layer thickness estimation unit that estimates the thickness of the internal oxide layer on the basis of the first correlation expression.

3. 发明申请

US20180073996A1 DEPOSIT MONITOR 审中-公开
公开(公告)号：US20180073996A1
公开(公告)日：2018-03-15
申请号：US15262807
申请日：2016-09-12
申请人： Ecolab USA Inc.
发明人： Mita Chattoraj , Michael J. Murcia , Aseet Mukherjee
IPC分类号： G01N25/14 , G01K7/18
CPC分类号： G01N25/14 , G01B21/085 , G01K7/18 , G01K13/02 , G01N17/008
摘要： Fluid flow systems can include one or more resistance temperature detectors (RTDs) in contact with the fluid flowing through the system. One or more RTDs can be operated in a heating mode and a measurement mode. Thermal behavior of the one or more RTDs can be analyzed to characterize a level of deposit formed on the RTD(s) from the fluid flowing through the system. Characterizations of deposition on RTDs operated at different temperatures can be used to establish a temperature-dependent deposition profile. The deposition profile can be used to determine if depositions are likely to form at certain locations in the fluid flow system, such as at a use device. Detected deposit conditions can initiate one or more corrective actions that can be taken to prevent or minimize deposit formation before deposits negatively impact operation of the fluid flow system.

4. 发明申请

US20170343342A1 METHOD AND SYSTEM FOR THERMALLY MONITORING PROCESS FOR FORMING PLASTIC BLOW-MOLDED CONTAINERS 审中-公开
公开(公告)号：US20170343342A1
公开(公告)日：2017-11-30
申请号：US15678767
申请日：2017-08-16
申请人： GRAHAM PACKAGING COMPANY, L.P.
发明人： Patrick M. O'Connell , Garrett R. Pennington , Russell Varone
IPC分类号： G01B21/08 , B29C49/04 , B29C49/78 , B29C49/28 , B29C49/42 , B29L31/00 , B29C49/36
CPC分类号： G01B21/085 , B29C49/04 , B29C49/28 , B29C49/36 , B29C49/42 , B29C49/78 , B29C2949/78151 , B29C2949/78168 , B29C2949/7821 , B29C2949/7826 , B29C2949/78512 , B29C2949/78563 , B29C2949/78605 , B29C2949/78663 , B29C2949/78722 , B29L2031/7158
摘要： The present invention provides a method of measuring the placement of material forming a blow-molded plastic container after the container is released from a mold of a blow molder having a plurality of molds, wherein each plastic container comprises a continuous sidewall and a base, the method comprising the steps of: detecting with an infrared camera infrared light emitted from the container after the container is released from a mold; converting the detected infrared light into corresponding electrical signals; transmitting the electrical signals to a microprocessor; comparing in the microprocessor the electrical signals with stored data regarding desired material distribution forming the plastic container; and producing output information regarding the placement of material forming the container.

5. 发明授权

US09797709B2 Method for measuring the thickness of a layer of material, galvanizing method and related measuring device 有权
公开(公告)号：US09797709B2
公开(公告)日：2017-10-24
申请号：US14902217
申请日：2014-06-03
申请人： ENOVASENSE
发明人： Jean Inard-Charvin , Geoffrey Bruno
IPC分类号： C23C2/00 , G01B11/06 , G01B21/08 , C23C2/06 , C23C2/14
CPC分类号： G01B11/0658 , C23C2/06 , C23C2/14 , G01B11/06 , G01B21/085
摘要： Method of measuring the thickness of a layer by a light source irradiating the layer with a light beam, which light source is controlled by a sinusoidal control signal having a modulation frequency fm so that the light beam presents optical power that is sinusoidally modulated at the modulation frequency, the measurement method consisting in: using detector elements to determine a calibration phase shift (Δφcal) between the optical power and the control signal; heating the layer with the light beam; using the detector elements to detect a sinusoidal component of a heat flux radiated by the layer; calculating a phase shift (Δφth/opt) between the sinusoidal component of the radiated heat flux and the optical power of the light beam while taking account of the calibration phase shift; and determining the thickness of the layer of material as a function of the phase shift (Δφth/opt).

6. 发明申请

US20160161247A1 METHOD FOR MEASURING THE THICKNESS OF A LAYER OF MATERIAL, GALVANIZING METHOD AND RELATED MEASURING DEVICE 有权
标题翻译：用于测量材料层厚度，加压方法和相关测量装置的方法
公开(公告)号：US20160161247A1
公开(公告)日：2016-06-09
申请号：US14902217
申请日：2014-06-03
申请人： ENOVASENSE
发明人： Jean INARD-CHARVIN , Geoffrey BRUNO
IPC分类号： G01B11/06 , C23C2/06 , C23C2/14 , G01B21/08
CPC分类号： G01B11/0658 , C23C2/06 , C23C2/14 , G01B11/06 , G01B21/085
摘要： Method of measuring the thickness of a layer by a light source irradiating the layer with a light beam, which light source is controlled by a sinusoidal control signal having a modulation frequency fm so that the light beam presents optical power that is sinusoidally modulated at the modulation frequency, the measurement method consisting in: using detector elements to determine a calibration phase shift (Δφcal) between the optical power and the control signal; heating the layer with the light beam; using the detector elements to detect a sinusoidal component of a heat flux radiated by the layer; calculating a phase shift (Δφth/opt) between the sinusoidal component of the radiated heat flux and the optical power of the light beam while taking account of the calibration phase shift; and determining the thickness of the layer of material as a function of the phase shift (Δφth/opt).
摘要翻译：通过用光束照射该层的光源测量层的厚度的方法，该光源由具有调制频率fm的正弦控制信号控制，使得光束呈现在调制时正弦调制的光功率频率，测量方法包括：使用检测器元件确定光功率和控制信号之间的校准相移（＆Dgr＆amp; Cal）; 用光束加热层; 使用检测器元件来检测由该层辐射的热通量的正弦分量; 计算辐射热通量的正弦分量与光束的光功率之间的相移（＆Dgr;＆phgr; th / opt），同时考虑校准相移; 并且确定材料层的厚度作为相移的函数（＆Dgr＆amp; th / opt）。

7. 发明授权

US09176067B2 Apparatus and method for determining the effective cementation or nitriding depth of steel components, in particular gears 有权
标题翻译：用于确定钢部件，特别是齿轮的有效胶结或渗氮深度的装置和方法
公开(公告)号：US09176067B2
公开(公告)日：2015-11-03
申请号：US14146368
申请日：2014-01-02
申请人： GE AVIO S.r.l.
发明人： Salvatore Milletari , Salvatore Giunta
IPC分类号： G01J5/52 , G01J5/54 , G01N21/84 , G01J9/00 , G01B21/08 , C21D9/32 , G01J5/00 , G01N25/72
CPC分类号： G01N21/84 , C21D9/32 , G01B21/085 , G01J5/52 , G01J9/00 , G01J2005/0048 , G01N25/72
摘要： An apparatus for determining the effective case-hardening or nitriding depth of a steel component comprises a measuring head, including a laser source generating a variable frequency radiation for the scanning of pre-determined portions of the component to be measured; an infrared detector, configured so as to detect infrared radiation generated by the component to be measured; and computing means of spectra of the infrared radiation received; and an evolventimeter, connected to the measuring head and including first computing means suitable for computing a hardness profile of the component to be measured on the basis of a launch profile and spectra of the infrared radiation received and second computing means suitable for computing the effective case-hardening depth from the hardness profile computed.
摘要翻译：用于确定钢部件的有效表面硬化或渗氮深度的装置包括测量头，包括产生用于扫描被测量部件的预定部分的可变频率辐射的激光源; 红外检测器，其被配置为检测由待测量的部件产生的红外辐射; 以及接收的红外辐射的光谱计算装置; 以及连接到测量头的演进计量器，并且包括适于基于所接收的红外辐射的发射曲线和光谱计算要测量的部件的硬度分布的第一计算装置和适于计算有效情况的第二计算装置 - 硬度从计算硬度剖面的深度。

8. 发明授权

US09146099B2 Method and system for thermally monitoring process for forming plastic blow-molded containers 有权
标题翻译：用于形成塑料吹塑容器的热监测过程的方法和系统
公开(公告)号：US09146099B2
公开(公告)日：2015-09-29
申请号：US13176850
申请日：2011-07-06
申请人： Patrick M. O'Connell , Garrett R. Pennington , Russell Varone
发明人： Patrick M. O'Connell , Garrett R. Pennington , Russell Varone
IPC分类号： G01B21/08 , B29C49/42 , B29C49/78 , B29C49/04 , B29C49/36
CPC分类号： G01B21/085 , B29C49/04 , B29C49/28 , B29C49/36 , B29C49/42 , B29C49/78 , B29C2949/78151 , B29C2949/78168 , B29C2949/7821 , B29C2949/7826 , B29C2949/78512 , B29C2949/78563 , B29C2949/78605 , B29C2949/78663 , B29C2949/78722 , B29L2031/7158
摘要： The present invention provides a method of measuring the placement of material forming a blow-molded plastic container after the container is released from a mold of a blow molder having a plurality of molds, wherein each plastic container comprises a continuous sidewall and a base, the method comprising the steps of: detecting with an infrared camera infrared light emitted from the container after the container is released from a mold; converting the detected infrared light into corresponding electrical signals; transmitting the electrical signals to a microprocessor; comparing in the microprocessor the electrical signals with stored data regarding desired material distribution forming the plastic container; and producing output information regarding the placement of material forming the container.
摘要翻译：本发明提供了一种在容器从具有多个模具的吹塑机的模具中释放之后测量形成吹塑塑料容器的材料的放置方法，其中每个塑料容器包括连续的侧壁和底座，方法包括以下步骤：在容器从模具中释放之后，用红外线照相机检测从容器发射的红外光; 将检测到的红外光转换成相应的电信号; 将电信号发送到微处理器; 在微处理器中将电信号与存储的数据相关联，形成塑料容器的所需材料分布; 并且产生关于形成容器的材料的放置的输出信息。

9. 发明授权

US09011608B2 Method and device for measuring deposit thickness 有权
标题翻译：测量沉积物厚度的方法和装置
公开(公告)号：US09011608B2
公开(公告)日：2015-04-21
申请号：US13147075
申请日：2010-01-29
申请人： Lene Amundsen , Rainer Hoffmann , Reidar Schüller
发明人： Lene Amundsen , Rainer Hoffmann , Reidar Schüller
IPC分类号： B08B9/027 , G01B21/08
CPC分类号： G01B21/085
摘要： The present invention concerns a method for measuring the thickness of any deposit of material on the inner wall of a structure conducting a fluid stream of hydrocarbons, the method comprising the steps of: applying a first heat pulse or continuous heating to at least one first section of the structure removing deposits on the inner wall of the first section of the structure; applying a second heat pulse to both the first section of the structure and at least one second section of the structure, the first and second sections being spaced apart, which heat pulse does not loosen any deposit of material in the second section; measuring the temperature of the wall of the structure or the fluid during the second heat pulse at both the first and second sections; and determining the thickness of any deposit of material on the inner wall of the structure at the second section based on the measured temperatures. The present invention also relates to a corresponding device and arrangement.
摘要翻译：本发明涉及一种用于测量导致烃的流体流的结构的内壁上的材料沉积物的厚度的方法，所述方法包括以下步骤：将第一加热脉冲或连续加热施加到至少一个第一部分的结构去除结构的第一部分的内壁上的沉积物; 对所述结构的第一部分和所述结构的至少一个第二部分施加第二加热脉冲，所述第一和第二部分间隔开，所述加热脉冲不会松开所述第二部分中材料的沉积物; 在第一和第二部分的第二加热脉冲期间测量结构的壁或流体的温度; 并且基于测量的温度确定在第二部分处的结构内壁上的材料沉积物的厚度。本发明还涉及相应的装置和装置。

10. 发明申请

US20140352443A1 PIPE WALL THICKNESS MEASUREMENT 审中-公开
标题翻译：管壁厚度测量
公开(公告)号：US20140352443A1
公开(公告)日：2014-12-04
申请号：US13908824
申请日：2013-06-03
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： Laurence J. ABNEY , Paul NICHOLLS
IPC分类号： G01B17/02
CPC分类号： G01B17/02 , G01B11/06 , G01B21/08 , G01B21/085
摘要： A method of measuring a wall thickness of a pipe can include optically detecting vibration of the pipe, and computing the wall thickness of the pipe, the computing being based at least partially on the optically detected vibration. Another method of measuring a wall thickness of a pipe can include optically detecting temperature of the pipe, and computing the wall thickness of the pipe, the computing being based at least partially on the optically detected temperature. Another method of measuring a wall thickness of a pipe can include optically detecting vibration and temperature of the pipe, and computing the wall thickness of the pipe, the computing being based at least partially on the optically detected vibration and temperature.
摘要翻译：一种测量管壁厚度的方法可包括光学检测管道的振动，以及计算管道的壁厚，该计算至少部分地基于光学检测的振动。测量管道壁厚的另一种方法可以包括光学地检测管道的温度，以及计算管道的壁厚，该计算至少部分地基于光学检测的温度。测量管道壁厚的另一种方法可以包括光学地检测管道的振动和温度，以及计算管道的壁厚，该计算至少部分地基于光学检测的振动和温度。

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