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    • 1. 发明申请
    • METHOD AND DEVICE FOR MEASURING DEPOSIT THICKNESS
    • 用于测量沉积厚度的方法和装置
    • US20110308548A1
    • 2011-12-22
    • US13147075
    • 2010-01-29
    • Lene AmundsenRainer HoffmannReidar Schüller
    • Lene AmundsenRainer HoffmannReidar Schüller
    • B08B7/00G01B21/08
    • G01B21/085
    • The present invention concerns a method for measuring the thickness of any deposit of material on the inner wall of a structure conducting a fluid stream of hydrocarbons, the method comprising the steps of: applying a first heat pulse or continuous heating to at least one first section of the structure removing deposits on the inner wall of the first section of the structure; applying a second heat pulse to both the first section of the structure and at least one second section of the structure, the first and second sections being spaced apart, which heat pulse does not loosen any deposit of material in the second section; measuring the temperature of the wall of the structure or the fluid during the second heat pulse at both the first and second sections; and determining the thickness of any deposit of material on the inner wall of the structure at the second section based on the measured temperatures. The present invention also relates to a corresponding device and arrangement.
    • 本发明涉及一种用于测量导致烃的流体流的结构的内壁上的材料沉积物的厚度的方法,所述方法包括以下步骤:将第一加热脉冲或连续加热施加到至少一个第一部分 的结构去除结构的第一部分的内壁上的沉积物; 对所述结构的第一部分和所述结构的至少一个第二部分施加第二加热脉冲,所述第一和第二部分间隔开,所述加热脉冲不会松开所述第二部分中材料的沉积物; 在第一和第二部分的第二加热脉冲期间测量结构的壁或流体的温度; 并且基于测量的温度确定在第二部分处的结构内壁上的材料沉积物的厚度。 本发明还涉及相应的装置和装置。
    • 2. 发明授权
    • Method and device for measuring deposit thickness
    • 测量沉积物厚度的方法和装置
    • US09011608B2
    • 2015-04-21
    • US13147075
    • 2010-01-29
    • Lene AmundsenRainer HoffmannReidar Schüller
    • Lene AmundsenRainer HoffmannReidar Schüller
    • B08B9/027G01B21/08
    • G01B21/085
    • The present invention concerns a method for measuring the thickness of any deposit of material on the inner wall of a structure conducting a fluid stream of hydrocarbons, the method comprising the steps of: applying a first heat pulse or continuous heating to at least one first section of the structure removing deposits on the inner wall of the first section of the structure; applying a second heat pulse to both the first section of the structure and at least one second section of the structure, the first and second sections being spaced apart, which heat pulse does not loosen any deposit of material in the second section; measuring the temperature of the wall of the structure or the fluid during the second heat pulse at both the first and second sections; and determining the thickness of any deposit of material on the inner wall of the structure at the second section based on the measured temperatures. The present invention also relates to a corresponding device and arrangement.
    • 本发明涉及一种用于测量导致烃的流体流的结构的内壁上的材料沉积物的厚度的方法,所述方法包括以下步骤:将第一加热脉冲或连续加热施加到至少一个第一部分 的结构去除结构的第一部分的内壁上的沉积物; 对所述结构的第一部分和所述结构的至少一个第二部分施加第二加热脉冲,所述第一和第二部分间隔开,所述加热脉冲不会松开所述第二部分中材料的沉积物; 在第一和第二部分的第二加热脉冲期间测量结构的壁或流体的温度; 并且基于测量的温度确定在第二部分处的结构内壁上的材料沉积物的厚度。 本发明还涉及相应的装置和装置。