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    • 1. 发明授权
    • Method and system for determining shape in plane to be determined in
atmosphere of scattering materials
    • 用于确定散射材料大气中待确定的平面形状的方法和系统
    • US4492472A
    • 1985-01-08
    • US399847
    • 1982-07-19
    • Yuichiro AsanoAkira HirahashiSuehisa OhgaTadashi YabeKunio KuritaAtsushi Momose
    • Yuichiro AsanoAkira HirahashiSuehisa OhgaTadashi YabeKunio KuritaAtsushi Momose
    • G01B11/02G01B11/24C21B7/24
    • G01B11/24G01B11/022
    • The invention relates to a method for determining the shape in a plane to be determined in atmosphere of scattering materials. The method includes comprising the steps of irradiating light on a first line to be determined being imagined on the plane to be determined in the atmosphere of scattering materials to extract a first picture signal at the time of picking up the first line to be determined; at the same time, irradiating light on a second line to be determined being imagined at a position with a prescribed distance apart from the first line to be determined to extract a second picture signal at the time of picking up the second line to be determined; then, subtracting the second picture signal from the first picture signal to extract a fresh picture signal; and operating two-dimensional position coordinates of a first image of line to be determined on the picture in which the first line to be determined has been picked up on the basis of the fresh picture signal to extract three-dimensional position coordinates of the first line to be determined in the plane to be determined through coordinate conversion of the two-dimensional position coordinates. Further, the invention relates to a system in which the scattering materials are cleared away by jetting gas into the atmosphere of scatttering materials prior to picking up of the lines to be determined.
    • 本发明涉及一种用于确定在散射材料的大气中确定的平面中的形状的方法。 该方法包括以下步骤:在要在散射材料的气氛中确定的平面上想象的第一行上照射光,以在拾取要确定的第一行时提取第一图像信号; 同时,在要确定的第二行上照射光线,以在要被确定的距离第一行的规定距离的位置处被想象,以在拾取要确定的第二行时提取第二图像信号; 然后从第一图像信号中减去第二图像信号以提取新鲜的图像信号; 并且基于新鲜图像信号对要确定的第一行被确定的图像上要确定的行的第一图像的二维位置坐标进行操作,以提取第一行的三维位置坐标 在通过二维位置坐标的坐标转换来确定的平面中被确定。 此外,本发明涉及一种系统,其中通过在拾取要确定的管线之前将气体喷射到散射材料的气氛中而将散射材料清除。
    • 2. 发明授权
    • Method and system for determining shape in plane to be determined in
atmosphere of scattering materials
    • 用于确定散射材料大气中待确定的平面形状的方法和系统
    • US4480919A
    • 1984-11-06
    • US399844
    • 1982-07-19
    • Yuichiro AsanoTaira SuzukiTadashi YabeKunio KuritaSuehisa OhgaAkira HirahashiAtsushi Momose
    • Yuichiro AsanoTaira SuzukiTadashi YabeKunio KuritaSuehisa OhgaAkira HirahashiAtsushi Momose
    • C21B7/24G01B11/02G01B11/24G01N21/84
    • G01B11/24G01B11/022
    • The invention relates to a method for determining the shape in a plane to be determined in atmosphere of scattering materials. The method includes the steps of irradiating light on a first line to be determined being imagined on the plane to be determined in the atmosphere of scattering materials to extract a first picture signal at the time of picking up the first line to be determined; at the same time, irradiating light on a second line to be determined being imagined at a position with a prescribed distance apart from the first line to be determined to extract a second picture signal at the time of picking up the second line to be determined; then, subtracting the second picture signal from the first picture signal to extract a fresh picture signal; and operating two-dimensional position coordinates of a first image of line to be determined on the picture in which the first line to be determined has been picked up on the basis of the fresh picture signal to extract three-dimensional position coordinates of the first line to be determined in the plane to be determined through coordinate conversion of the two-dimensional position coordinates. Further, the invention relates to a system in which the scattering materials are cleared away by jetting gas into the atmosphere of scattering materials prior to picking up of the lines to be determined.
    • 本发明涉及一种用于确定在散射材料的大气中确定的平面中的形状的方法。 该方法包括以下步骤:在要在散射材料的气氛中确定的平面上想象的待测定的第一线照射光,以在拾取要确定的第一行时提取第一图像信号; 同时,在要被确定的第二线上照射光,在要被确定的距离第一行的规定距离的位置处被想象,以在拾取要确定的第二行时提取第二图像信号; 然后从第一图像信号中减去第二图像信号以提取新鲜的图像信号; 并且基于新鲜图像信号对要确定的第一行被确定的图像上要确定的行的第一图像的二维位置坐标进行操作,以提取第一行的三维位置坐标 在通过二维位置坐标的坐标转换来确定的平面中被确定。 此外,本发明涉及一种系统,其中通过在拾取待确定的线之前将气体喷射到散射材料的大气中而将散射材料清除。
    • 6. 发明授权
    • X-ray imaging system and imaging method
    • X射线成像系统及成像方法
    • US07180979B2
    • 2007-02-20
    • US11159568
    • 2005-06-22
    • Atsushi Momose
    • Atsushi Momose
    • G01N23/04
    • A61B6/484A61B6/06A61B6/4092A61B6/4291A61B6/483G01N23/20075G21K1/06G21K2207/005
    • The present invention provides an apparatus capable of X-ray imaging utilizing phase of X-rays. An X-ray imaging apparatus equipped with first and second diffraction gratings and an X-ray image detector are described. The first diffraction grating generates a Talbot effect and a second diffraction grating diffracts X-rays diffracted by the first diffraction grating. An image detector is provided to detect the X-rays diffracted by the second diffraction grating. In this manner, image contrasts caused by changes in phase of X-rays due to a subject arranged in front of the first diffraction grating or between the first diffraction grating and the second diffraction grating can be achieved.
    • 本发明提供能够利用X射线相位进行X射线成像的装置。 描述了配备有第一和第二衍射光栅的X射线成像装置和X射线图像检测器。 第一衍射光栅产生Talbot效应,第二衍射光栅衍射由第一衍射光栅衍射的X射线。 提供图像检测器来检测由第二衍射光栅衍射的X射线。 以这种方式,可以实现由于布置在第一衍射光栅前面的对象或第一衍射光栅和第二衍射光栅之间的对象的X射线的相位变化引起的图像对比度。
    • 8. 发明申请
    • X-ray imaging system and imaging method
    • X射线成像系统及成像方法
    • US20050286680A1
    • 2005-12-29
    • US11159568
    • 2005-06-22
    • Atsushi Momose
    • Atsushi Momose
    • G01N23/20G21K1/06G01N23/04
    • A61B6/484A61B6/06A61B6/4092A61B6/4291A61B6/483G01N23/20075G21K1/06G21K2207/005
    • The object of the present invention is to provide an apparatus capable of X-ray imaging utilizing phase of X-rays with a simple construction. The X-ray imaging apparatus of the present invention is equipped with first and second diffraction gratings and an X-ray image detector. The first diffraction grating is constructed to generate the Talbot effect using X-rays irradiated at the first diffraction grating. The second diffraction grating is configured so as to diffract the X-rays diffracted by the first diffraction grating. The X-ray image detector is configured so as to detect the X-rays diffracted by the second diffraction grating. By diffracting X-rays diffracted by the first diffraction grating, the second diffraction grating is capable of forming image contrast caused by changes in phase of X-rays due to the subject arranged in front of the front surface of the first diffraction grating or between the first diffraction grating and the second diffraction grating. The X-ray image detector is capable of detecting X-rays creating image contrast.
    • 本发明的目的是提供能够以简单的结构利用X射线相位进行X射线成像的装置。 本发明的X射线成像装置配备有第一和第二衍射光栅以及X射线图像检测器。 第一衍射光栅被构造成使用在第一衍射光栅处照射的X射线产生Talbot效应。 第二衍射光栅被配置为衍射由第一衍射光栅衍射的X射线。 X射线图像检测器被配置为检测由第二衍射光栅衍射的X射线。 通过衍射由第一衍射光栅衍射的X射线,第二衍射光栅能够形成由于被布置在第一衍射光栅的前表面前面的被摄体或者在第一衍射光栅的前表面之间的X射线的相位变化引起的图像对比度 第一衍射光栅和第二衍射光栅。 X射线图像检测器能够检测产生图像对比度的X射线。
    • 9. 发明授权
    • Phase contrast X ray imaging system
    • 相位X射线成像系统
    • US5881126A
    • 1999-03-09
    • US827535
    • 1997-03-28
    • Atsushi Momose
    • Atsushi Momose
    • A61B6/00G01N23/04G01N23/201G01N23/06
    • A61B6/484A61B6/502G01N23/04G01N23/201G21K2207/005
    • A phase-contrast X-ray imaging system according to the present invention comprises an X-ray interferometer, wherein X-ray interfering beams thicker than 2 cm.times.2 cm are formed enabling observation of comparatively large objects. The X-ray interferometer is constituted by two crystal blocks which each are monolithically cut out from ingots of crystal and have two wafers which function as X-ray half mirrors. Optical equipment, a chamber, and a feedback system are incorporated to adjust and stabilize the crystal blocks. A device is also incorporated to obtain an image showing the distribution of the X-ray phase shift with which diagnosis become easier and reliable.
    • 根据本发明的相差X射线成像系统包括X射线干涉仪,其中形成的厚度大于2cm×2cm的X射线干涉光束能够观察比较大的物体。 X射线干涉仪由两个晶体块组成,每个晶体块从晶体晶圆单片切割并具有两个用作X射线半反射镜的晶片。 引入光学设备,室和反馈系统来调节和稳定晶体块。 还结合了一种装置以获得显示X射线相移分布的图像,诊断变得更容易和可靠。
    • 10. 发明授权
    • Phase-contrast x-ray imaging system
    • 相位对比X射线成像系统
    • US5930325A
    • 1999-07-27
    • US204154
    • 1998-12-03
    • Atsushi Momose
    • Atsushi Momose
    • A61B6/00G01N23/04G01N23/201G03H5/00
    • A61B6/484A61B6/502G01N23/04G01N23/201G21K2207/005
    • A phase-contrast X-ray imaging system according to the present invention comprises an X-ray interferometer, wherein X-ray interfering beams thicker than 2 cm.times.2 cm are formed enabling observation of comparatively large objects. The X-ray interferometer is constituted by two crystal blocks which each are monolithically cut out from ingots of crystal and have two wafers which function as X-ray half mirrors. An optical equipment, a chamber, and a feedback system are incorporated to adjust and stabilize the crystal blocks. A device is also incorporated to obtain an image showing the distribution of the X-ray phase shift with which diagnosis become easier and reliable.
    • 根据本发明的相差X射线成像系统包括X射线干涉仪,其中形成的厚度大于2cm×2cm的X射线干涉光束能够观察比较大的物体。 X射线干涉仪由两个晶体块组成,每个晶体块从晶体晶圆单片切割并具有两个用作X射线半反射镜的晶片。 结合光学设备,室和反馈系统来调节和稳定晶体块。 还结合了一种装置以获得显示X射线相移分布的图像,诊断变得更容易和可靠。