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    • 8. 发明授权
    • Quad flat no lead (QFN) package
    • 四边形无铅(QFN)封装
    • US08148827B2
    • 2012-04-03
    • US12832223
    • 2010-07-08
    • Yu-Tang PanShih-Wen Chou
    • Yu-Tang PanShih-Wen Chou
    • H01L23/49
    • H01L24/49H01L23/3121H01L23/49838H01L23/49861H01L24/29H01L24/32H01L24/48H01L2224/32245H01L2224/48091H01L2224/48247H01L2224/48257H01L2224/49H01L2224/73265H01L2924/00014H01L2924/01033H01L2924/01082H01L2924/014H01L2924/078H01L2924/14H01L2924/181H01L2924/00H01L2224/45099H01L2224/05599H01L2924/00012
    • The present invention relates to a quad flat no lead (QFN) package is provided. In the invention, a plurality of first pads are disposed outside an extension area of a conductive circuit layer, and a plurality of second pads are disposed inside a die bonding area of the conductive circuit layer, wherein the extension area surrounds the die bonding area. First ends of a plurality of traces are connected to the second pads, and second ends of the traces are located in the extension area. An insulating layer fills at least the die bonding area and the extension area, and exposes top surfaces and bottom surfaces of the second pads. A chip is mounted at the die bonding area and a plurality of wires electrically connect the chip to the first pads and the second ends of the traces respectively. An encapsulation material is used to cover the conductive circuit layer, the chip and the wires. Whereby, the package of the invention can have more inputs/outputs terminals, and the insulating layer can prevent moisture permeation from corroding the joints between the wires and the first pads and the second ends of the traces, thus increasing the reliability of the package of the invention.
    • 本发明涉及一种四边形无铅(QFN)封装。 在本发明中,多个第一焊盘设置在导电电路层的延伸区域的外侧,并且多个第二焊盘设置在导电电路层的管芯接合区域的内部,其中延伸区域围绕管芯接合区域。 多个迹线的第一端连接到第二焊盘,并且迹线的第二端位于扩展区域中。 绝缘层至少填充芯片接合区域和延伸区域,并且暴露第二焊盘的顶表面和底表面。 芯片安装在管芯接合区域,并且多条电线分别将芯片电连接到第一焊盘和迹线的第二端。 封装材料用于覆盖导电电路层,芯片和电线。 由此,本发明的封装可以具有更多的输入/输出端子,并且绝缘层可以防止水分渗透腐蚀电线与第一焊盘和迹线的第二端之间的接合,从而增加封装的可靠性 本发明。