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    • 3. 发明授权
    • Write data preservation for non-volatile storage
    • 为非易失性存储写入数据保存
    • US09135989B2
    • 2015-09-15
    • US13605583
    • 2012-09-06
    • Manabu SakaiToru MiwaTien-chien Kuo
    • Manabu SakaiToru MiwaTien-chien Kuo
    • G11C11/34G11C11/56
    • G11C11/5628G11C2211/5621
    • Methods and non-volatile storage systems are provided for recovering data during a programming of non-volatile storage. Program data that was originally stored in one set of latches may be preserved with a combination of two sets of latches. These two sets of latches may also be used to store verify status during programming of that program data. The original program data may be recovered by performing a logical operation on the data in the two sets of latches. For example, upper page data could be initially stored in one set of latches. While the upper page data is being programmed, that set of latches and another set of latches are used to store verify status with respect to the upper page data. If a program error occurs while the upper page data is being preserved, it may be recovered by performing a logical operation on the two sets of latches.
    • 提供方法和非易失性存储系统用于在非易失性存储器的编程期间恢复数据。 最初存储在一组锁存器中的程序数据可以通过两组锁存器的组合来保存。 这两组锁存器也可用于在该程序数据的编程期间存储验证状态。 可以通过对两组锁存器中的数据执行逻辑运算来恢复原始程序数据。 例如,上页数据可以最初存储在一组锁存器中。 当上位数据被编程时,该组锁存器和另一组锁存器用于存储相对于上位数据的验证状态。 如果在保留上位页数据时发生程序错误,则可以通过对两组锁存器执行逻辑运算来恢复程序错误。
    • 4. 发明授权
    • Defective word line detection
    • 字线检测不良
    • US08630118B2
    • 2014-01-14
    • US13292556
    • 2011-11-09
    • Manabu SakaiToru Miwa
    • Manabu SakaiToru Miwa
    • G11C16/04
    • G11C29/025G11C11/5628G11C16/0483G11C2029/1202G11C2211/5621
    • Methods and non-volatile storage systems are provided for detecting defects in word lines. A “broken” word line defect may be detected. Information may be maintained as to which storage elements were intended to be programmed to a tracked state. Then, after programming is complete, the storage elements are read to determine which storage elements have a threshold voltage below a reference voltage level associated with the tracked state. By tracking which storage elements are in the tracked state, elements associated with other states may be filtered out such that an accurate assessment may be made as to which storage elements were under-programmed. From this information, a determination may be made whether the word line is defective. For example, if too many storage elements are under-programmed, this may indicate a broken word line.
    • 提供了用于检测字线中的缺陷的方法和非易失性存储系统。 可能检测到“破碎”的字线缺陷。 可以保持关于哪些存储元件被编程为跟踪状态的信息。 然后,在完成编程之后,读取存储元件以确定哪些存储元件具有低于与跟踪状态相关联的参考电压电平的阈值电压。 通过跟踪哪些存储元件处于跟踪状态,可以滤除与其他状态相关联的元件,使得可以对哪些存储元件被编程不正确进行准确的评估。 根据该信息,可以确定字线是否有缺陷。 例如,如果存储元素太多被编程不当,则这可能表示一个破损的字线。
    • 9. 发明申请
    • DEFECTIVE WORD LINE DETECTION
    • 有缺陷的字线检测
    • US20130114342A1
    • 2013-05-09
    • US13292556
    • 2011-11-09
    • Manabu SakaiToru Miwa
    • Manabu SakaiToru Miwa
    • G11C16/10G11C16/04G11C16/06
    • G11C29/025G11C11/5628G11C16/0483G11C2029/1202G11C2211/5621
    • Methods and non-volatile storage systems are provided for detecting defects in word lines. A “broken” word line defect may be detected. Information may be maintained as to which storage elements were intended to be programmed to a tracked state. Then, after programming is complete, the storage elements are read to determine which storage elements have a threshold voltage below a reference voltage level associated with the tracked state. By tracking which storage elements are in the tracked state, elements associated with other states may be filtered out such that an accurate assessment may be made as to which storage elements were under-programmed. From this information, a determination may be made whether the word line is defective. For example, if too many storage elements are under-programmed, this may indicate a broken word line.
    • 提供了用于检测字线中的缺陷的方法和非易失性存储系统。 可能检测到“破碎”的字线缺陷。 可以保持关于哪些存储元件被编程为跟踪状态的信息。 然后,在完成编程之后,读取存储元件以确定哪些存储元件具有低于与跟踪状态相关联的参考电压电平的阈值电压。 通过跟踪哪些存储元件处于跟踪状态,可以滤除与其他状态相关联的元件,使得可以对哪些存储元件被编程不正确进行准确的评估。 根据该信息,可以确定字线是否有缺陷。 例如,如果存储元素太多被编程不当,则这可能表示一个破损的字线。