会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Write data preservation for non-volatile storage
    • 为非易失性存储写入数据保存
    • US09135989B2
    • 2015-09-15
    • US13605583
    • 2012-09-06
    • Manabu SakaiToru MiwaTien-chien Kuo
    • Manabu SakaiToru MiwaTien-chien Kuo
    • G11C11/34G11C11/56
    • G11C11/5628G11C2211/5621
    • Methods and non-volatile storage systems are provided for recovering data during a programming of non-volatile storage. Program data that was originally stored in one set of latches may be preserved with a combination of two sets of latches. These two sets of latches may also be used to store verify status during programming of that program data. The original program data may be recovered by performing a logical operation on the data in the two sets of latches. For example, upper page data could be initially stored in one set of latches. While the upper page data is being programmed, that set of latches and another set of latches are used to store verify status with respect to the upper page data. If a program error occurs while the upper page data is being preserved, it may be recovered by performing a logical operation on the two sets of latches.
    • 提供方法和非易失性存储系统用于在非易失性存储器的编程期间恢复数据。 最初存储在一组锁存器中的程序数据可以通过两组锁存器的组合来保存。 这两组锁存器也可用于在该程序数据的编程期间存储验证状态。 可以通过对两组锁存器中的数据执行逻辑运算来恢复原始程序数据。 例如,上页数据可以最初存储在一组锁存器中。 当上位数据被编程时,该组锁存器和另一组锁存器用于存储相对于上位数据的验证状态。 如果在保留上位页数据时发生程序错误,则可以通过对两组锁存器执行逻辑运算来恢复程序错误。
    • 2. 发明授权
    • Defective word line detection
    • 字线检测不良
    • US08630118B2
    • 2014-01-14
    • US13292556
    • 2011-11-09
    • Manabu SakaiToru Miwa
    • Manabu SakaiToru Miwa
    • G11C16/04
    • G11C29/025G11C11/5628G11C16/0483G11C2029/1202G11C2211/5621
    • Methods and non-volatile storage systems are provided for detecting defects in word lines. A “broken” word line defect may be detected. Information may be maintained as to which storage elements were intended to be programmed to a tracked state. Then, after programming is complete, the storage elements are read to determine which storage elements have a threshold voltage below a reference voltage level associated with the tracked state. By tracking which storage elements are in the tracked state, elements associated with other states may be filtered out such that an accurate assessment may be made as to which storage elements were under-programmed. From this information, a determination may be made whether the word line is defective. For example, if too many storage elements are under-programmed, this may indicate a broken word line.
    • 提供了用于检测字线中的缺陷的方法和非易失性存储系统。 可能检测到“破碎”的字线缺陷。 可以保持关于哪些存储元件被编程为跟踪状态的信息。 然后,在完成编程之后,读取存储元件以确定哪些存储元件具有低于与跟踪状态相关联的参考电压电平的阈值电压。 通过跟踪哪些存储元件处于跟踪状态,可以滤除与其他状态相关联的元件,使得可以对哪些存储元件被编程不正确进行准确的评估。 根据该信息,可以确定字线是否有缺陷。 例如,如果存储元素太多被编程不当,则这可能表示一个破损的字线。
    • 3. 发明申请
    • ERRATIC PROGRAM DETECTION FOR NON-VOLATILE STORAGE
    • 用于非易失性存储的ERRATIC PROGRAM检测
    • US20130114344A1
    • 2013-05-09
    • US13292569
    • 2011-11-09
    • Manabu SakaiToru Miwa
    • Manabu SakaiToru Miwa
    • G11C16/10
    • G11C11/5628G11C16/0483G11C16/08G11C16/26G11C16/3454
    • Methods and non-volatile storage systems are provided for determining erratically programmed storage elements, including under-programmed and over-programmed storage elements. Techniques do not require any additional data latches. A set of data latches may be used to store program data for a given memory element. This program data may be maintained after the programming is over for use in erratic program detection. In one embodiment, lockout status is kept in a data latch that is used to serially receive program data to be programmed into the storage element. Therefore, no extra data latches are required to program the storage elements and to maintain the program data afterwards.
    • 提供方法和非易失性存储系统用于确定不规则编程的存储元件,包括欠编程和过程编程的存储元件。 技术不需要任何额外的数据锁存器。 一组数据锁存器可用于存储给定存储器元件的程序数据。 该程序数据可以在编程结束之后保持,以用于不规则的程序检测。 在一个实施例中,锁定状态保存在数据锁存器中,该数据锁存器用于串行地接收要编程到存储元件中的程序数据。 因此,不需要额外的数据锁存器来对存储元件进行编程并且之后维护程序数据。
    • 4. 发明授权
    • Erratic program detection for non-volatile storage
    • 用于非易失性存储的错误程序检测
    • US08842476B2
    • 2014-09-23
    • US13292569
    • 2011-11-09
    • Manabu SakaiToru Miwa
    • Manabu SakaiToru Miwa
    • G11C11/34G11C16/04G11C16/08G11C16/26G11C16/34G11C11/56
    • G11C11/5628G11C16/0483G11C16/08G11C16/26G11C16/3454
    • Methods and non-volatile storage systems are provided for determining erratically programmed storage elements, including under-programmed and over-programmed storage elements. Techniques do not require any additional data latches. A set of data latches may be used to store program data for a given memory element. This program data may be maintained after the programming is over for use in erratic program detection. In one embodiment, lockout status is kept in a data latch that is used to serially receive program data to be programmed into the storage element. Therefore, no extra data latches are required to program the storage elements and to maintain the program data afterwards.
    • 提供方法和非易失性存储系统用于确定不规则编程的存储元件,包括欠编程和过程编程的存储元件。 技术不需要任何额外的数据锁存器。 一组数据锁存器可用于存储给定存储器元件的程序数据。 该程序数据可以在编程结束之后保持,以用于不规则的程序检测。 在一个实施例中,锁定状态保存在数据锁存器中,该数据锁存器用于串行地接收要编程到存储元件中的程序数据。 因此,不需要额外的数据锁存器来对存储元件进行编程并且之后维护程序数据。
    • 5. 发明申请
    • WRITE DATA PRESERVATION FOR NON-VOLATILE STORAGE
    • 写入数据保存非易失性存储
    • US20140063961A1
    • 2014-03-06
    • US13605583
    • 2012-09-06
    • Manabu SakaiToru MiwaTien-chien Kuo
    • Manabu SakaiToru MiwaTien-chien Kuo
    • G11C16/10G11C16/04
    • G11C11/5628G11C2211/5621
    • Methods and non-volatile storage systems are provided for recovering data during a programming of non-volatile storage. Program data that was originally stored in one set of latches may be preserved with a combination of two sets of latches. These two sets of latches may also be used to store verify status during programming of that program data. The original program data may be recovered by performing a logical operation on the data in the two sets of latches. For example, upper page data could be initially stored in one set of latches. While the upper page data is being programmed, that set of latches and another set of latches are used to store verify status with respect to the upper page data. If a program error occurs while the upper page data is being preserved, it may be recovered by performing a logical operation on the two sets of latches.
    • 提供方法和非易失性存储系统用于在非易失性存储器的编程期间恢复数据。 最初存储在一组锁存器中的程序数据可以通过两组锁存器的组合来保存。 这两组锁存器也可用于在该程序数据的编程期间存储验证状态。 可以通过对两组锁存器中的数据执行逻辑运算来恢复原始程序数据。 例如,上页数据可以最初存储在一组锁存器中。 当上位数据被编程时,该组锁存器和另一组锁存器用于存储相对于上位数据的验证状态。 如果在保留上位页数据时发生程序错误,则可以通过对两组锁存器执行逻辑运算来恢复程序错误。
    • 6. 发明申请
    • DEFECTIVE WORD LINE DETECTION
    • 有缺陷的字线检测
    • US20130114342A1
    • 2013-05-09
    • US13292556
    • 2011-11-09
    • Manabu SakaiToru Miwa
    • Manabu SakaiToru Miwa
    • G11C16/10G11C16/04G11C16/06
    • G11C29/025G11C11/5628G11C16/0483G11C2029/1202G11C2211/5621
    • Methods and non-volatile storage systems are provided for detecting defects in word lines. A “broken” word line defect may be detected. Information may be maintained as to which storage elements were intended to be programmed to a tracked state. Then, after programming is complete, the storage elements are read to determine which storage elements have a threshold voltage below a reference voltage level associated with the tracked state. By tracking which storage elements are in the tracked state, elements associated with other states may be filtered out such that an accurate assessment may be made as to which storage elements were under-programmed. From this information, a determination may be made whether the word line is defective. For example, if too many storage elements are under-programmed, this may indicate a broken word line.
    • 提供了用于检测字线中的缺陷的方法和非易失性存储系统。 可能检测到“破碎”的字线缺陷。 可以保持关于哪些存储元件被编程为跟踪状态的信息。 然后,在完成编程之后,读取存储元件以确定哪些存储元件具有低于与跟踪状态相关联的参考电压电平的阈值电压。 通过跟踪哪些存储元件处于跟踪状态,可以滤除与其他状态相关联的元件,使得可以对哪些存储元件被编程不正确进行准确的评估。 根据该信息,可以确定字线是否有缺陷。 例如,如果存储元素太多被编程不当,则这可能表示一个破损的字线。
    • 8. 发明申请
    • MULTI-PASS PROGRAMMING FOR MEMORY WITH REDUCED DATA STORAGE REQUIREMENT
    • 具有减少数据存储要求的存储器的多级编程
    • US20100061151A1
    • 2010-03-11
    • US12344763
    • 2008-12-29
    • Toru MiwaGerrit Jan Hemink
    • Toru MiwaGerrit Jan Hemink
    • G11C16/04G11C16/06
    • G11C11/5628G11C16/3418G11C2211/5621
    • Coupling effects between adjacent floating gates in a non-volatile storage device are reduced in a multi-pass programming operation, while reducing program data storage requirements. In one approach, storage elements are programmed in an out of sequence or zigzag word line order. A particular word line is programmed with a coarse program pass, after which another word line is programmed with a fine program pass, after which the particular word line is read. The particular word line is read before another word line is programmed with a coarse program pass which causes coupling interference to storage elements of the particular word line. The read data is subsequently used to perform a fine program pass for the particular word line. This avoids the need to store program data of multiple word lines concurrently, so that storage hardware can be reduced in size along with power consumption.
    • 在多通道编程操作中减少非易失性存储设备中的相邻浮动栅极之间的耦合效应,同时减少程序数据存储要求。 在一种方法中,存储元件被编程为不按顺序或之字形字线顺序。 一个特定的字线用一个粗略的程序通道进行编程,之后用一个精细的程序通道对另一个字线进行编程,然后读取特定的字线。 在另一个字线被粗略编程通道编程之前读取特定字线,其导致对特定字线的存储元件的耦合干扰。 读取的数据随后用于执行特定字线的精细节目通行。 这避免了同时存储多个字线的程序数据的需要,使得存储硬件可以与功耗一起减小。
    • 10. 发明授权
    • Non-volatile memory and control with improved partial page program capability
    • 非易失性存储器和具有改进的部分页面编程能力的控制
    • US07280396B2
    • 2007-10-09
    • US11381972
    • 2006-05-05
    • Yan LiYupin Kawing FongToru Miwa
    • Yan LiYupin Kawing FongToru Miwa
    • G11C16/04
    • G11C16/10G11C11/5628G11C11/5642G11C16/0483G11C2211/5646
    • In a non-volatile memory programming scheme where the memory cells are programmed in two or more sequential programming passes, when there is insufficient host data to program at least some of the memory cells during the second pass, some of the memory cells may be programmed to the wrong threshold voltage. This can be prevented by modifying the programming scheme so that this does not occur. In one implementation, this is accomplished by choosing a code scheme, which does not cause the memory cells to be programmed to the wrong threshold voltage during the second programming pass, or by programming the memory cells in accordance with substitute data that would not cause the cells to be programmed to an erroneous state.
    • 在非易失性存储器编程方案中,其中存储器单元被编程在两个或多个顺序编程遍中,当在第二遍期间存在不足的主机数据来编程至少一些存储器单元时,一些存储器单元可被编程 到错误的阈值电压。 这可以通过修改编程方案来避免这样的情况。 在一个实现中,这是通过选择代码方案来实现的,该代码方案不会在第二编程遍期间将存储器单元编程到错误的阈值电压,或者通过根据不会导致 单元被编程为错误状态。