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    • 5. 发明授权
    • Burn-in test socket
    • 老化测试插座
    • US06267603B1
    • 2001-07-31
    • US09445001
    • 1999-11-30
    • Isamu YamamotoTomohiro NakanoAkira Kaneshige
    • Isamu YamamotoTomohiro NakanoAkira Kaneshige
    • H01R1200
    • G01R1/0483G01R1/0466
    • A socket for burn-in testing of an integrated circuit package having electrical leads. The socket includes an outer socket housing and an inner socket housing slidably moveable relative to the outer housing between an upper limit position and a lower limit position, the inner housing for supporting the integrated circuit package thereon and having a plurality of terminal-receiving cavities therein. The socket further includes a plurality of terminals disposed in the terminal-receiving cavities of said inner housing for contacting the leads of the integrated circuit package, a cam mechanism for raising and lowering the inner housing between the upper limit position and lower limit position relative to the outer housing, and a latch mechanism for holding and releasing the integrated circuit package relative to the inner housing.
    • 一种用于具有电引线的集成电路封装的老化测试的插座。 插座包括外插座壳体和内插座壳体,其在上限位置和下限位置之间可相对于外壳滑动地移动,所述内壳体用于在其上支撑集成电路封装并且在其中具有多个端子容纳腔 。 插座还包括设置在所述内壳体的端子容纳腔中的多个端子,用于接触集成电路封装的引线;凸轮机构,用于在上限位置和下限位置之间升高和降低内壳体相对于 外部壳体和用于相对于内部壳体保持和释放集成电路封装的闩锁机构。