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    • 8. 发明申请
    • Gated Diode Nonvolatile Memory Cell Array
    • 门极二极管非易失性存储单元阵列
    • US20090080254A1
    • 2009-03-26
    • US12326706
    • 2008-12-02
    • Yi Ying LiaoWen Jer TsaiChih Chieh Yeh
    • Yi Ying LiaoWen Jer TsaiChih Chieh Yeh
    • G11C16/02G11C11/36
    • G11C11/36B82Y10/00G11C16/02G11C2216/06H01L27/1021H01L29/8616
    • A memory integrated circuit has memory arrays that are vertically layered. These memory arrays include word lines and bit lines. Intersections between the word lines and the bit lines include a diode and a memory state storage element. The diode and the memory storage element are connected in between a word line and a bit line. The diode at the intersections includes a first diode node and a second diode node. Various aspects of the memory integrated circuit are electrically interconnected in various ways, such as corresponding word lines, corresponding first diode nodes, or corresponding second diode nodes of different memory arrays being electrically interconnected. Various aspects of the memory integrated circuit are isolated in various ways, such as word lines, first diode nodes, or second diode nodes of different memory arrays being isolated.
    • 存储器集成电路具有垂直分层的存储器阵列。 这些存储器阵列包括字线和位线。 字线和位线之间的交点包括二极管和存储器状态存储元件。 二极管和存储器存储元件连接在字线和位线之间。 交叉处的二极管包括第一二极管节点和第二二极管节点。 存储器集成电路的各个方面以各种方式电互连,例如相应的字线,对应的第一二极管节点或不同存储器阵列的相应的第二二极管节点电互连。 存储器集成电路的各个方面以各种方式隔离,例如隔离不同存储器阵列的字线,第一二极管节点或第二二极管节点。
    • 10. 发明授权
    • Operation methods for a non-volatile memory cell in an array
    • 阵列中非易失性存储单元的操作方法
    • US07272043B2
    • 2007-09-18
    • US11020269
    • 2004-12-27
    • Yi Ying LiaoChih Chieh YehWen Jer Tsai
    • Yi Ying LiaoChih Chieh YehWen Jer Tsai
    • G11C11/34G11C16/06
    • G11C11/5671G11C16/0475G11C16/0483
    • A method of reducing gate disturb in a charge-trapping layer memory cell by applying different Vpass voltages to different sides of a selected wordline. A higher Vpass voltage is used to pass higher source/drain voltage and a lower Vpass voltage is used to pass a lower source/drain voltage. By controlling the Vpass voltages on different sides of a selected wordline, it is possible to reduce a vertical field that is established in a gate region when the Vpass voltages are applied. A reduced vertical field results in suppressed gate disturb. The method also includes a novel bit-line biasing scheme that may further reduce the vertical field and thereby may further suppress gate disturb, particularly in an array of memory cells.
    • 一种通过在选定字线的不同侧面施加不同的Vpass电压来减少电荷俘获层存储单元中的门扰动的方法。 较高的Vpass电压用于传递较高的源极/漏极电压,较低的Vpass电压用于通过较低的源极/漏极电压。 通过控制所选字线的不同侧的Vpass电压,可以减小施加Vpass电压时在栅极区域中建立的垂直场。 减小的垂直场导致抑制的门扰动。 该方法还包括新颖的位线偏置方案,其可以进一步减小垂直场,从而可进一步抑制门扰动,特别是在存储器单元阵列中。