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    • 4. 发明申请
    • Non-Volatile Memory and Control with Improved Partial Page Program Capability
    • 非易失性存储器和具有改进的部分页面程序能力的控制
    • US20060203561A1
    • 2006-09-14
    • US11381972
    • 2006-05-05
    • Yan LiYupin FongToru Miwa
    • Yan LiYupin FongToru Miwa
    • G11C16/04
    • G11C16/10G11C11/5628G11C11/5642G11C16/0483G11C2211/5646
    • In a non-volatile memory programming scheme where the memory cells are programmed in two or more sequential programming passes, when there is insufficient host data to program at least some of the memory cells during the second pass, some of the memory cells may be programmed to the wrong threshold voltage. This can be prevented by modifying the programming scheme so that this does not occur. In one implementation, this is accomplished by choosing a code scheme, which does not cause the memory cells to be programmed to the wrong threshold voltage during the second programming pass, or by programming the memory cells in accordance with substitute data that would not cause the cells to be programmed to an erroneous state.
    • 在非易失性存储器编程方案中,其中存储器单元被编程在两个或多个顺序编程遍中,当在第二遍期间存在不足的主机数据来编程至少一些存储器单元时,一些存储器单元可被编程 到错误的阈值电压。 这可以通过修改编程方案来避免这样的情况。 在一个实现中,这是通过选择代码方案来实现的,该代码方案不会在第二编程遍期间将存储器单元编程到错误的阈值电压,或者通过根据不会导致 单元被编程为错误状态。