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    • 1. 发明申请
    • LOW-POWER VOLTAGE REFERENCE CIRCUIT
    • 低功耗电压参考电路
    • US20130120050A1
    • 2013-05-16
    • US13293850
    • 2011-11-10
    • Wuyang HAOJungwon Suh
    • Wuyang HAOJungwon Suh
    • H03K17/14
    • G05F3/242
    • Methods and apparatus for a providing temperature-compensated reference voltage are provided. In an example, a temperature-compensated voltage reference circuit includes a current mirror portion and a temperature-compensated output portion coupled to the current mirror portion. The temperature-compensated output portion comprises a very low threshold voltage (Vt) transistor coupled in series with a negative temperature coefficient transistor. The output portion can further include a positive temperature coefficient element coupled in series with the very low Vt transistor. The positive temperature coefficient element can be an adjustable resistive element. The output portion can further include an output transistor having a gate coupled to the current mirror portion and coupled between a supply voltage and the positive temperature coefficient element. The very low Vt transistor can be a substantially zero Vt n-channel metal-oxide-semiconductor (NMOS) transistor, and can be coupled in a diode configuration.
    • 提供了提供温度补偿参考电压的方法和装置。 在一个示例中,温度补偿电压参考电路包括耦合到电流镜部分的电流镜部分和温度补偿输出部分。 温度补偿输出部分包括与负温度系数晶体管串联耦合的非常低的阈值电压(Vt)晶体管。 输出部分还可以包括与极低Vt晶体管串联耦合的正温度系数元件。 正温度系数元件可以是可调电阻元件。 输出部分还可以包括输出晶体管,其具有耦合到电流镜部分并且耦合在电源电压和正温度系数元件之间的栅极。 非常低的Vt晶体管可以是基本为零的Vt n沟道金属氧化物半导体(NMOS)晶体管,并且可以以二极管配置耦合。
    • 6. 发明授权
    • Low-power voltage reference circuit
    • 低功耗参考电路
    • US08786355B2
    • 2014-07-22
    • US13293850
    • 2011-11-10
    • Wuyang HaoJungwon Suh
    • Wuyang HaoJungwon Suh
    • H01L35/00
    • G05F3/242
    • Methods and apparatus for a providing temperature-compensated reference voltage are provided. In an example, a temperature-compensated voltage reference circuit includes a current mirror portion and a temperature-compensated output portion coupled to the current mirror portion. The temperature-compensated output portion comprises a very low threshold voltage (Vt) transistor coupled in series with a negative temperature coefficient transistor. The output portion can further include a positive temperature coefficient element coupled in series with the very low Vt transistor. The positive temperature coefficient element can be an adjustable resistive element. The output portion can further include an output transistor having a gate coupled to the current mirror portion and coupled between a supply voltage and the positive temperature coefficient element. The very low Vt transistor can be a substantially zero Vt n-channel metal-oxide-semiconductor (NMOS) transistor, and can be coupled in a diode configuration.
    • 提供了提供温度补偿参考电压的方法和装置。 在一个示例中,温度补偿电压参考电路包括耦合到电流镜部分的电流镜部分和温度补偿输出部分。 温度补偿输出部分包括与负温度系数晶体管串联耦合的非常低的阈值电压(Vt)晶体管。 输出部分还可以包括与极低Vt晶体管串联耦合的正温度系数元件。 正温度系数元件可以是可调电阻元件。 输出部分还可以包括输出晶体管,其具有耦合到电流镜部分并且耦合在电源电压和正温度系数元件之间的栅极。 非常低的Vt晶体管可以是基本上为零的Vt n沟道金属氧化物半导体(NMOS)晶体管,并且可以以二极管配置耦合。
    • 10. 发明申请
    • Sensing Current Recycling Method During Self-Refresh
    • 自刷新期间感应当前回收方法
    • US20070140032A1
    • 2007-06-21
    • US11677457
    • 2007-02-21
    • Jungwon Suh
    • Jungwon Suh
    • G11C7/00
    • G11C11/40615G11C7/12G11C11/406G11C11/4094
    • A bit line sensing scheme is provided for a semiconductor memory device that significantly reduces current drain during a self-refresh mode. After bit line sensing of a selected wordline and deactivation of the selected wordline, a capacitor is connected to a source node associated with a bit line sensing amplifier for the selected wordline to charge the capacitor with charge remaining on the bit line. Then, during the next activate-precharge cycle for another selected wordline, the capacitor is coupled to the source node of a bit line sensing amplifier associated with another selected wordline to discharge charge stored by the capacitor to the bit line associated with said other selected wordline. Thus, charge is returned from the bit line to the capacitor. This is where the self-refresh current reduction is achieved.
    • 为半导体存储器件提供位线检测方案,其在自刷新模式期间显着减少电流消耗。 在对所选择的字线进行位线检测和停用所选择的字线之后,将电容器连接到与用于选定字线的位线检测放大器相关联的源节点,以对位线上剩余电荷充电电容器。 然后,在下一个激活预充电循环期间,对于另一个选定的字线,电容器耦合到与另一选定字线相关联的位线感测放大器的源节点,以将由电容器存储的电荷放电到与所述另一选定字线相关联的位线 。 因此,电荷从位线返回到电容器。 这是实现自刷新电流降低的地方。