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1. 发明授权

US06240033B1 Antifuse circuitry for post-package DRAM repair 有权
标题翻译：用于后封装DRAM修复的防漏电路
公开(公告)号：US06240033B1
公开(公告)日：2001-05-29
申请号：US09479665
申请日：2000-01-10
申请人： Woodward Yang , Joo Sun Choi , Jae Kyung Wee , Young Ho Seol , Jin Keun Oh , Phil Jung Kim , Ho Youe Cho
发明人： Woodward Yang , Joo Sun Choi , Jae Kyung Wee , Young Ho Seol , Jin Keun Oh , Phil Jung Kim , Ho Youe Cho
IPC分类号： G11C700
CPC分类号： G11C29/781 , G11C17/18
摘要： The anti-fuse circuit includes three sub-blocks: a multiplexer having inputs of control signals and addresses and yielding the activation of a programming signal and program addresses; a programming voltage generator consisting of an oscillator and a charge pump; and an anti-fuse unit circuits for the program/read of anti-fuse states. For an anti-fuse program at the special test mode, a program address generation circuit having inputs of control signals and addresses activates the programming voltage generator and makes a special or program address for selection of anti-fuse. In the normal mode, the program address generation circuit and an internal power generator remain at an inactive state. In anti-fuse unit circuit, the program address and the programming voltage signal from the programming voltage generator serve to switch the terminal of the anti-fuse up to a programming voltage level when the anti-fuse is selected for programming of anti-fuse elements.
摘要翻译：反熔丝电路包括三个子块：具有控制信号和地址的输入并产生编程信号和程序地址的激活的多路复用器; 由振荡器和电荷泵组成的编程电压发生器; 以及用于编程/读取反熔丝状态的反熔丝单元电路。对于在特殊测试模式下的反熔丝程序，具有控制信号和地址的输入的程序地址产生电路激活编程电压发生器，并产生用于选择反熔丝的特殊或程序地址。在正常模式中，程序地址产生电路和内部发电机保持在非工作状态。在反熔丝单元电路中，编程电压发生器的程序地址和编程电压信号用于在反熔丝被选择用于编程抗熔丝元件时将反熔丝的端子切换到编程电压电平。

2. 发明授权

US06366118B2 Antifuse repair circuit 失效
标题翻译：防腐修复电路
公开(公告)号：US06366118B2
公开(公告)日：2002-04-02
申请号：US09790019
申请日：2001-02-21
申请人： Jin Keun Oh , Jae Kyung Wee , Chang Hyuk Lee , Phil Jung Kim
发明人： Jin Keun Oh , Jae Kyung Wee , Chang Hyuk Lee , Phil Jung Kim
IPC分类号： G06F738
CPC分类号： G11C17/18 , G11C29/785
摘要： An antifuse repair circuit is disclosed for selectively programming a specific antifuse to replace a defective cell with a redundant cell. The antifuse repair circuit includes: (a) a special test mode decoder for selecting an antifuse box according to an address signal; (b) a bank selector for selecting an antifuse bank according to the output signal from the special test mode decoder and the address signal; (c) a special address multiplexer for selecting a specific antifuse within an antifuse bank selected by the bank selector according to the output signal from the bank selector and the address signal; (d) a negative voltage generator for generating a negative voltage to program an antifuse device; (e) a power-up detector for detecting the supply voltage to generate a plurality of control signals in order to detect whether the antifuse device is programmed; (f) a unit antifuse circuit for programming the antifuse device according to the signals from the special test mode detector, the special address multiplexer, the negative voltage generator and the power-up detector; and (g) a repair circuit responsive to the output signal from the unit antifuse circuit and an external control signal to replace a defective cell with a redundant cell.
摘要翻译：公开了一种反熔丝修复电路，用于选择性地编程特定反熔丝以用冗余单元替换有缺陷的单元。反熔丝修复电路包括：（a）专用测试模式解码器，用于根据地址信号选择反熔丝; （b）根据来自特殊测试模式解码器的输出信号和地址信号选择反熔丝组的存储体选择器; （c）专用地址多路复用器，用于根据来自存储体选择器的输出信号和地址信号，选择由存储体选择器选择的反熔丝库内的特定反熔丝; （d）用于产生负电压以编程反熔丝装置的负电压发生器; （e）上电检测器，用于检测电源电压以产生多个控制信号，以便检测反熔丝装置是否被编程; （f）用于根据来自特殊测试模式检测器，专用地址多路复用器，负电压发生器和上电检测器的信号对反熔丝装置进行编程的单元反熔丝电路; 和（g）响应于来自单元反熔丝电路的输出信号的修复电路和外部控制信号以用冗余单元替换有缺陷的单元。

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