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    • 3. 发明授权
    • Logic circuit and method for calculating an encrypted result operand
    • 用于计算加密结果操作数的逻辑电路和方法
    • US07876893B2
    • 2011-01-25
    • US11462144
    • 2006-08-03
    • Antoine DegrendelWinfried KampManfred RothThomas Kodytek
    • Antoine DegrendelWinfried KampManfred RothThomas Kodytek
    • H04L9/28
    • H03K19/0948G06F7/00G06F21/755G06F2207/7238G06F2207/7266
    • A logic circuit for calculating an encrypted dual-rail result operand from encrypted dual-rail input operands according to a combination rule includes inputs for receiving the input operands and an output for outputting the encrypted result operand. Each operand may comprise a first logic state or a second logic state. The logic circuit comprises a first logic stage connected between the inputs and an intermediate node and a second logic stage connected between the intermediate node and the output. The logic stages are formed to calculate the first or second logic state of the encrypted result operand from the input operands according to the combination rule and to maintain or change exactly once the logic state of the encrypted result operand, independently of an order of arrival of the encrypted input operands, depending on the combination rule, in order to impress the calculated first logic state or second logic state on the output.
    • 用于根据组合规则从加密的双轨输入操作数计算加密的双轨结果操作数的逻辑电路包括用于接收输入操作数的输入和用于输出加密结果操作数的输出。 每个操作数可以包括第一逻辑状态或第二逻辑状态。 逻辑电路包括连接在输入与中间节点之间的第一逻辑级和连接在中间节点与输出之间的第二逻辑级。 逻辑级被形成为根据组合规则从输入操作数计算加密结果操作数的第一或第二逻辑状态,并且只要一旦加密结果操作数的逻辑状态独立于维护或更改 加密的输入操作数,取决于组合规则,以便将计算出的第一逻辑状态或第二逻辑状态置于输出上。
    • 5. 发明授权
    • Latch based memory device
    • 基于锁存器的存储器件
    • US08331163B2
    • 2012-12-11
    • US12876560
    • 2010-09-07
    • Siegmar KoeppeWinfried KampJulie Aunis
    • Siegmar KoeppeWinfried KampJulie Aunis
    • G11C7/10
    • G11C29/10G11C7/10G11C11/41G11C19/28G11C29/022G11C29/32
    • A latch based memory device includes a plurality of latches and a method of testing the latch based memory device that includes serially connecting the latches with each other so as to form a shift register chain. A bit sequence is input into the shift register chain to shift the bit sequence through the shift register chain. A bit sequence is outputted and shifted through the shift register chain, and the input bit sequence is compared with the output sequence to evaluate the functionality of the latches in a first test phase and to test the remaining structures of the latch based memory device in a second test phase by using, e.g., a conventional scan test approach.
    • 一种基于锁存器的存储器件包括多个锁存器和一种测试基于锁存器的存储器件的方法,该存储器件包括将锁存器彼此串联连接以形成移位寄存器链。 一个位序列被输入到移位寄存器链中,以通过移位寄存器链来移位比特序列。 输出比特序列并通过移位寄存器链进行移位,并将输入比特序列与输出序列进行比较,以评估第一个测试阶段的锁存器的功能,并测试基于锁存器的存储器件的剩余结构 通过使用例如常规扫描测试方法的第二测试阶段。