会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Detecting defective ejector in digital lithography system
    • 在数字光刻系统中检测有缺陷的喷射器
    • US07514114B2
    • 2009-04-07
    • US11218416
    • 2005-09-01
    • William S. WongSteven E. ReadyAna Claudia Arias
    • William S. WongSteven E. ReadyAna Claudia Arias
    • C23C16/52B05D5/12
    • B41J29/393
    • A digital lithography system prints a large-area electronic device by dividing the overall device printing process into a series of discrete feature printing sub-processes, where each feature printing sub-process involves printing both a predetermined portion (feature) of the device in a designated substrate area, and an associated test pattern in a designated test area that is remote from the feature. At the end of each feature printing sub-process, the test pattern is analyzed, e.g., using a camera and associated imaging system, to verify that the test pattern has been successfully printed. A primary ejector is used until an unsuccessfully printed test pattern is detected, at which time a secondary (reserve) ejector replaces the primary ejector and reprints the feature associated with the defective test pattern. When multiple printheads are used in parallel, analysis of the test pattern is used to efficiently identify the location of a defective ejector.
    • 数字光刻系统通过将整个设备打印过程划分成一系列离散特征打印子过程来打印大面积电子设备,其中每个特征打印子过程涉及将设备的预定部分(特征)打印在一个 指定的基板区域以及远离该特征的指定测试区域中的关联测试图案。 在每个特征打印子过程结束时,分析测试图案,例如使用相机和相关联的成像系统来验证测试图案是否已被成功打印。 使用初级喷射器,直到检测到未成功打印的测试图案,此时次要(预留)喷射器取代主喷射器并重印与缺陷测试图案相关的特征。 当并行使用多个打印头时,使用测试图案的分析来有效地识别有缺陷的喷射器的位置。
    • 6. 发明申请
    • Thin Film Field Effect Transistor with Dual Semiconductor Layers
    • 具有双半导体层的薄膜场效应晶体管
    • US20120007079A1
    • 2012-01-12
    • US13239078
    • 2011-09-21
    • Sanjiv SambandanAna Claudia AriasGregory Lewis Whiting
    • Sanjiv SambandanAna Claudia AriasGregory Lewis Whiting
    • H01L29/04H01L29/786
    • H01L29/78696H01L29/42384H01L29/78606H01L29/78645
    • A thin film field effect transistor is disclosed which provides improved time-based channel stability. The field effect transistor includes first and second disordered semiconductor layers separated by an insulator. In an embodiment a carrier injection terminal is provided in a thin semiconductor layer closest to the gate terminal. An electric field is established in the thin semiconductor layer. At sufficient field strength, the electric field extends into the second semiconductor layer, which is in contact with the source and drain terminals. At sufficient field strength a channel is established in the second semiconductor layer, permitting current to flow between source and drain terminals. Above a certain gate voltage, there is sufficient free charge is induced in the first semiconductor layer so that the field does not extend into the second semiconductor, effectively shutting off current between source and drain. Single-device transition detection (as well as other applications) may be obtained.
    • 公开了薄膜场效应晶体管,其提供改进的基于时间的信道稳定性。 场效应晶体管包括由绝缘体隔开的第一和第二无序半导体层。 在一个实施例中,载流子注入端子设置在最靠近栅极端子的薄半导体层中。 在薄半导体层中形成电场。 在足够的场强下,电场延伸到与源极和漏极端子接触的第二半导体层。 在足够的场强下,在第二半导体层中建立通道,允许电流在源极和漏极端子之间流动。 在一定的栅极电压之上,在第一半导体层中感应出足够的自由电荷,使得场不延伸到第二半导体中,有效地关闭源极和漏极之间的电流。 可以获得单器件转换检测(以及其他应用)。
    • 9. 发明申请
    • Printed Material Constrained By Well Structures And Devices Including Same
    • 由结构和包括相同的设备约束的打印材料
    • US20140094003A1
    • 2014-04-03
    • US14094677
    • 2013-12-02
    • Jurgen H. DanielAna Claudia Arias
    • Jurgen H. DanielAna Claudia Arias
    • H01L29/66
    • H01L21/02288H01L21/02488H01L21/02521H01L21/02623H01L21/02628H01L21/38H01L27/1292H01L29/66742H01L29/66772H01L29/78684H01L29/7869H01L51/0004
    • A first patterned contact layer, for example a gate electrode, is formed over an insulative substrate. Insulating and functional layers are formed at least over the first patterned contact layer. A second patterned contact layer, for example source/drain electrodes, is formed over the functional layer. Insulative material is then selectively deposited over at least a portion of the second patterned contact layer to form first and second wall structures such that at least a portion of the second patterned contact layer is exposed, the first and second wall structures defining a well therebetween. Electrically conductive or semiconductive material is deposited within the well, for example by jet-printing, such that the first and second wall structures confine the conductive or semiconductive material and prevent spreading and electrical shorting to adjacent devices. The conductive or semiconductive material is in electrical contact with the exposed portion of the second patterned contact layer to form, e.g., an operative transistor.
    • 第一图案化接触层,例如栅电极,形成在绝缘衬底上。 至少在第一图案化接触层上形成绝缘层和功能层。 在功能层上形成第二图案化接触层,例如源/漏电极。 绝缘材料然后选择性地沉积在第二图案化接触层的至少一部分上以形成第一和第二壁结构,使得第二图案化接触层的至少一部分被暴露,第一和第二壁结构在其间限定了一个阱。 导电或半导体材料例如通过喷墨印刷沉积在阱内,使得第一和第二壁结构限制导电或半导体材料并防止相邻器件的扩展和电短路。 导电或半导体材料与第二图案化接触层的暴露部分电接触以形成例如有效晶体管。