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1. 发明授权

US08650964B2 Testing apparatus 失效
标题翻译：测试仪器
公开(公告)号：US08650964B2
公开(公告)日：2014-02-18
申请号：US13473679
申请日：2012-05-17
申请人： Wei-Min Qin , Cong-Xu Hu , Yu-Lin Liu
发明人： Wei-Min Qin , Cong-Xu Hu , Yu-Lin Liu
IPC分类号： G01B5/30 , G01B7/16 , G01L1/00 , G01N3/00
CPC分类号： G01D11/30 , G01M7/027
摘要： A testing apparatus includes a retaining panel, a screw pole, two securing panels moveably attached to the screw pole, and two mounting members. Each of the two securing panels is slidably attached to the retaining panel. Each of the two mounting member is engaged with each of the two securing panels. The two securing panels are moveable relative to the screw pole for sandwiching an electronic device, and each of the two mounting member is engaged with the screw pole, for prevent the two securing panels from disengaged from the electronic device.
摘要翻译：测试装置包括保持板，螺杆，可移动地附接到螺杆的两个固定板和两个安装构件。两个固定面板中的每一个可滑动地附接到保持面板。两个安装构件中的每一个与两个固定板中的每一个接合。两个固定面板相对于用于夹持电子设备的螺杆可移动，并且两个安装构件中的每一个与螺钉杆接合，以防止两个固定板从电子设备脱离。

2. 发明授权

US08905362B2 Test support apparatus 有权
标题翻译：测试支持设备
公开(公告)号：US08905362B2
公开(公告)日：2014-12-09
申请号：US13565780
申请日：2012-08-02
申请人： Cong-Xu Hu , Yu-Lan Liu , Yong Ma , Yu-Lin Liu
发明人： Cong-Xu Hu , Yu-Lan Liu , Yong Ma , Yu-Lin Liu
IPC分类号： F16M11/06
CPC分类号： G01R31/2808
摘要： A test support apparatus includes a base, a support bracket, a first positioning member mounted to the support bracket; and a positioning arm. The support bracket is pivotally mounted to the base and keeps an angle relative to the base. The support bracket supports a product. The positioning arm defines an elongated positioning slot. The positioning arm is mounted to the base. The first positioning member is positioned in different positions of the elongated positioning slot to change the angle.
摘要翻译：测试支撑设备包括底座，支撑托架，安装到支撑托架上的第一定位构件; 和定位臂。支撑托架枢转地安装到基座并且相对于基座保持一定角度。支撑支架支撑产品。定位臂限定细长的定位槽。定位臂安装在底座上。第一定位构件定位在细长定位槽的不同位置以改变角度。

3. 发明授权

US08621933B2 Testing apparatus 失效
标题翻译：测试仪器
公开(公告)号：US08621933B2
公开(公告)日：2014-01-07
申请号：US13474812
申请日：2012-05-18
申请人： Yu-Lan Liu , Wei-Min Qin , Yu-Lin Liu
发明人： Yu-Lan Liu , Wei-Min Qin , Yu-Lin Liu
IPC分类号： G01L1/00 , G01B5/30 , G01B7/16 , G01N3/00
CPC分类号： G01M7/027
摘要： A testing apparatus includes a securing member, a first clipping panel, a second clipping panel, two mounting members, and a sliding member. The securing member includes a screw pole. The first clipping panel is secured to the screw pole. The second clipping panel is moveably attached to the screw pole, and the first clipping panel and the second clipping panel are attached to opposite side plates of an electronic device. The two mounting members are attached to the screw pole and located on opposite sides of the second clipping panel, for preventing the second clipping panel from disengaging from the electronic device. The sliding member is slidably attached to the screw pole and located between the first clipping panel and the second clipping panel, for moving the electronic device.
摘要翻译：测试装置包括固定构件，第一夹板，第二夹板，两个安装构件和滑动构件。固定构件包括螺杆。第一个裁剪面板固定在螺柱上。第二剪切板可移动地附接到螺杆，并且第一剪切板和第二剪切板附接到电子装置的相对侧板。两个安装构件附接到螺钉杆并且位于第二夹板的相对侧上，用于防止第二夹板与电子装置分离。滑动构件可滑动地附接到螺杆，并且位于第一剪切板和第二剪切板之间，用于移动电子装置。

4. 发明授权

US09031807B2 Motherboard testing apparatus 有权
标题翻译：主板测试仪
公开(公告)号：US09031807B2
公开(公告)日：2015-05-12
申请号：US13195006
申请日：2011-08-01
申请人： Xiang-Biao Chen , Hong-Lang Lu , Yu-Lin Liu
发明人： Xiang-Biao Chen , Hong-Lang Lu , Yu-Lin Liu
IPC分类号： G01R27/28 , G06F11/22
CPC分类号： G06F11/2284
摘要： A motherboard testing apparatus for testing a motherboard by subjecting it to sequential power-on and power-off modes includes a control module, a switch module and a display module. The control module stores power-on and power-off number of times and outputs control signals accordingly. The switch module provides a first voltage to the motherboard according to the control signals. The switch module includes a photocoupler and a delay. The photocoupler includes an LED and a phototransistor. The delay includes a winding element and a switch element. The display module displays the time periods and the number of times the motherboard abnormally power-on and power-off. The LED receives the control signals. The phototransistor turns on when the LED emits light. The winding element is powered up and closes the switch element. The switch element outputs the first voltage.
摘要翻译：用于通过对主板进行连续的上电和断电模式来测试主板的主板测试装置包括控制模块，开关模块和显示模块。控制模块存储上电和断电次数，并相应地输出控制信号。开关模块根据控制信号向主板提供第一电压。开关模块包括光电耦合器和延迟。光耦合器包括LED和光电晶体管。延迟包括绕组元件和开关元件。显示模块显示主板不正常上电和断电的时间段和次数。 LED接收控制信号。当LED发光时，光电晶体管导通。绕组元件通电并闭合开关元件。开关元件输出第一电压。

5. 发明授权

US08410405B2 Temperature control system 失效
标题翻译：温控系统
公开(公告)号：US08410405B2
公开(公告)日：2013-04-02
申请号：US12783624
申请日：2010-05-20
申请人： Xiang-Biao Chen , Yu-Lin Liu , Qiang Zhang
发明人： Xiang-Biao Chen , Yu-Lin Liu , Qiang Zhang
IPC分类号： H05B1/00
CPC分类号： G05D23/1917 , G01R31/2874 , G06F1/206 , G06F1/3203 , Y02D10/16
摘要： A temperature control system includes a temperature sensing module, a temperature control module, a pulse width modulation control module, a heating module, a heat dissipating module, and a switch module. The temperature sensing module is configured to obtain a current ambient temperature in a test box. The temperature control module is configured to output a control signal according to a difference between the current ambient temperature and a reference temperature. The pulse width modulation control module is configured to output a pulse width modulation signal according to the control signal. The switch module is configured to instruct the heating module or the heat dissipating module according to the pulse width modulation signal to keep the current ambient temperature generally equal to the reference temperature in the test box.
摘要翻译：温度控制系统包括温度感测模块，温度控制模块，脉宽调制控制模块，加热模块，散热模块和开关模块。温度感测模块被配置为在测试箱中获得当前的环境温度。温度控制模块被配置为根据当前环境温度和参考温度之间的差异来输出控制信号。脉冲宽度调制控制模块被配置为根据控制信号输出脉宽调制信号。开关模块被配置为根据脉冲宽度调制信号来指示加热模块或散热模块，以使当前的环境温度与测试箱中的基准温度一致。

6. 发明授权

US08870172B2 Test support apparatus 有权
标题翻译：测试支持设备
公开(公告)号：US08870172B2
公开(公告)日：2014-10-28
申请号：US13268165
申请日：2011-10-07
申请人： Meng-Bin Yu , Yang Chen , Wei Liang , Yu-Lin Liu
发明人： Meng-Bin Yu , Yang Chen , Wei Liang , Yu-Lin Liu
IPC分类号： B23Q3/02 , G01M99/00 , G01M7/02
CPC分类号： G01M99/00 , G01M7/027
摘要： A test support apparatus includes a supporting mechanism supporting a product, a holding post pressed on the product, a positioning assembly, an operating member and a clamping member. The positioning assembly is attached to the supporting mechanism and the holding post. The positioning assembly includes a positioning member and a moving member. The moving member is attached to the holding post, and moveably relative to the positioning member to adjust a distance between the holding post and the supporting mechanism. The operating member is rotatably attached to the positioning member. The clamping member is rotatably attached to the operating member and rotatable relative to the operating member about a first axis. The clamping member engaged with the supporting mechanism, and the operating member is rotatable relative to the positioning member about a second axis to rotate the clamping member about the first axis to disengaged from the supporting mechanism.
摘要翻译：测试支撑装置包括支撑产品的支撑机构，压在产品上的保持柱，定位组件，操作构件和夹紧构件。定位组件附接到支撑机构和保持柱。定位组件包括定位构件和移动构件。移动构件附接到保持柱，并且相对于定位构件可移动地调节保持柱和支撑机构之间的距离。操作构件可旋转地附接到定位构件。夹紧构件可旋转地附接到操作构件并且可围绕第一轴线相对于操作构件旋转。夹持构件与支撑机构接合，并且操作构件可相对于定位构件围绕第二轴线旋转，以使夹紧构件围绕第一轴线旋转以与支撑机构分离。

7. 发明授权

US08733858B2 Computer enclosure 有权
标题翻译：电脑外壳
公开(公告)号：US08733858B2
公开(公告)日：2014-05-27
申请号：US13562780
申请日：2012-07-31
申请人： Chao-Jie Cai , Wei Liang , Yong Ma , Yu-Lin Liu
发明人： Chao-Jie Cai , Wei Liang , Yong Ma , Yu-Lin Liu
IPC分类号： A47B81/00
CPC分类号： G06F1/188
摘要： A computer enclosure includes a computer case and a power supply tray. The computer case includes a side plate and a rear plate adjacent to the side plate. A clamping portion is located on the rear plate, and an opening is defined between the side plate and the rear plate. The power supply tray is attached to the opening and includes a clipping member. The clipping member includes a securing portion extending from the power supply tray and a clipping portion rotatably attached to the securing portion. The clipping portion is engaged with the clamping portion to secure the power supply tray to the computer case, and the clipping portion is rotatable relative to the rear plate to disengage the clipping portion from the clamping portion.
摘要翻译：计算机外壳包括电脑外壳和电源托盘。计算机外壳包括侧板和与侧板相邻的后板。夹紧部分位于后板上，并且在侧板和后板之间限定开口。供电托盘附接到开口并且包括夹持构件。夹持构件包括从电源托盘延伸的固定部分和可旋转地附接到固定部分的夹持部分。夹持部分与夹持部分接合，以将电源托盘固定到计算机机壳上，并且夹持部分可相对于后板旋转以使夹持部分与夹持部分脱离。

8. 发明授权

US08516877B2 Drop test apparatus 失效
标题翻译：跌落试验装置
公开(公告)号：US08516877B2
公开(公告)日：2013-08-27
申请号：US12964265
申请日：2010-12-09
申请人： Yin Le , Yu-Lin Liu , Qiang Zhang
发明人： Yin Le , Yu-Lin Liu , Qiang Zhang
IPC分类号： G01N3/00 , G01N19/02
CPC分类号： G01M7/08 , G01N3/303
摘要： A drop test apparatus includes a base panel, at least one height adjustment member attached to the base panel, and at least one angle adjustment member pivotally attached to the at least one height adjustment member. The at least one height adjustment member has a portion protruding upward from the base panel. A height of the portion is variable. The at least one angle adjustment member is configured for supporting a device thereon and capable of rotating to different angles.
摘要翻译：落下试验装置包括基板，附接到基板的至少一个高度调节构件和可枢转地附接到至少一个高度调节构件的至少一个角度调节构件。所述至少一个高度调节构件具有从所述基板向上突出的部分。该部分的高度是可变的。所述至少一个角度调整构件构造成用于在其上支撑装置并能够旋转到不同的角度。

9. 发明授权

US08443651B2 Drop test device for testing corner of case 失效
标题翻译：跌落测试设备用于测试角落
公开(公告)号：US08443651B2
公开(公告)日：2013-05-21
申请号：US12978130
申请日：2010-12-23
申请人： Yin Le , Yu-Lin Liu , Qiang Zhang
发明人： Yin Le , Yu-Lin Liu , Qiang Zhang
IPC分类号： G01N3/30
CPC分类号： G01M7/08 , G01N3/303
摘要： A drop test device for testing a corner portion of a work piece, includes a bottom board, a support pillar, and a hanging mechanism. The support pillar is mounted on the bottom board. The hanging mechanism is mounted on the support pillar and is located above the bottom board. The hanging mechanism includes a support member. The support member includes a triangle base. Angles and sides of the triangle base hold the work piece thereon to have a corner of the work piece directed towards the bottom board.
摘要翻译：用于测试工件的角部的落下试验装置包括底板，支柱和悬挂机构。支撑柱安装在底板上。悬挂机构安装在支撑柱上，位于底板上方。悬挂机构包括支撑构件。支撑构件包括三角形底座。三角形基座的角度和侧面将工件保持在其上，以使工件的拐角指向底板。

10. 发明授权

US08393527B2 Solder apparatus 失效
标题翻译：焊接设备
公开(公告)号：US08393527B2
公开(公告)日：2013-03-12
申请号：US13284957
申请日：2011-10-30
申请人： Xiang-Biao Chen , Li-Ping Fan , Xiao-Li Liu , Yu-Lin Liu
发明人： Xiang-Biao Chen , Li-Ping Fan , Xiao-Li Liu , Yu-Lin Liu
IPC分类号： B23K3/00 , B23K1/00 , B23K1/002
CPC分类号： B23K3/047 , B23K3/0478
摘要： A solder apparatus includes a platform, an operating mechanism, a solder member, a heater, and a control box module. The control box module includes a temperature controller and a temperature sensor. The temperature controller defines a predetermined temperature. The temperature sensor is capable of measuring the temperature of the solder member. The temperature controller has the heater heat the solder member when the measured temperature of the solder member is lower than or equal to the predetermined temperature, and has the heater stop heating the solder member, when the measured temperature of the solder member is higher than the predetermined temperature.
摘要翻译：焊接装置包括平台，操作机构，焊接部件，加热器和控制箱模块。控制箱模块包括温度控制器和温度传感器。温度控制器定义预定温度。温度传感器能够测量焊料的温度。当焊料成分的测量温度低于或等于预定温度时，温度控制器使加热器加热焊料，并且当焊料成分的测量温度高于预定温度。

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