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    • 6. 发明授权
    • Sense amplifier with individually optimized high and low power modes
    • 感应放大器,具有单独优化的高功率和低功耗模式
    • US5850365A
    • 1998-12-15
    • US772567
    • 1996-12-24
    • Dirk A. ReeseMyron W. WongJohn C. Costello
    • Dirk A. ReeseMyron W. WongJohn C. Costello
    • G11C7/06G11C7/02
    • G11C7/067
    • The present invention is a sense amplifier circuit for use with programmable logic devices that provides improved switching time by actively limiting the voltage swing on the bit line which it is sensing, rather than passively sensing the voltage, employs feedback circuits to further improve switching time and may be selectively operated in low power mode without significant reduction in switching speed. Voltage reference control circuitry, comprising variable current limiters controlled by the potential of a supply of reference potential, can be added to improve noise immunity. The circuitry of the supply of reference potential is designed so that its sensitivity to fabrication variations is substantially similar to that of the sense amplifier and so that it adjusts the reference potential accordingly.
    • 本发明是一种与可编程逻辑器件一起使用的读出放大器电路,通过主动地限制其正在感测的位线上的电压摆幅而不是被动地感测电压来提供改进的开关时间,采用反馈电路来进一步提高开关时间, 可以选择性地在低功率模式下操作而不显着降低开关速度。 可以添加包括由参考电位供应的电位控制的可变电流限制器的电压参​​考控制电路,以提高抗噪声性能。 设计参考电位的电路被设计成使得其对制造变化的敏感度基本上类似于读出放大器的灵敏度,并因此相应地调整参考电位。
    • 9. 发明授权
    • Programmable logic device with redundant circuitry
    • 具有冗余电路的可编程逻辑器件
    • US5369314A
    • 1994-11-29
    • US199620
    • 1994-02-22
    • Rakesh H. PatelMyron W. Wong
    • Rakesh H. PatelMyron W. Wong
    • G06F11/20H03K19/003H03K19/173H03K19/177
    • H03K19/1737H03K19/00392
    • A programmable logic device is provided that has redundant circuitry. When a portion of the programmable logic device circuitry is found to be defective, the redundant circuitry is switched into use in place of the defective circuitry by programming appropriate portions of the circuitry of the programmable logic device. The programmable logic device is arranged in rows and columns of programmable logic containing logic array blocks, which a user selectively configures by loading programming data into vertical and horizontal programming blocks. Programming blocks are used to program the logic array blocks and various associated logic circuitry. When the redundant circuitry is switched into place, the programming data is redirected to the appropriate programming blocks, so that the device functions identically, regardless of whether or not the redundant circuitry is used.
    • 提供了一种具有冗余电路的可编程逻辑器件。 当可编程逻辑器件电路的一部分被发现是有缺陷的时候,通过对可编程逻辑器件的电路的适当部分进行编程,将冗余电路切换到使用中来代替有缺陷的电路。 可编程逻辑器件被布置成包含逻辑阵列块的可编程逻辑的行和列,用户通过将编程数据加载到垂直和水平编程块中来选择性地配置。 编程块用于对逻辑阵列块和各种相关的逻辑电路进行编程。 当冗余电路切换到位时,编程数据被重定向到相应的编程块,使得器件的功能相同,而不管冗余电路是否被使用。
    • 10. 发明授权
    • Apparatus and method for margin testing single polysilicon EEPROM cells
    • 单个多晶硅EEPROM单元的边缘测试的装置和方法
    • US06646919B1
    • 2003-11-11
    • US09874716
    • 2001-06-04
    • Raminda U. MaduraweMyron W. WongJohn C. CostelloJames D. SansburyBruce F. Mielke
    • Raminda U. MaduraweMyron W. WongJohn C. CostelloJames D. SansburyBruce F. Mielke
    • G11C1606
    • H01L27/11521G11C16/04G11C16/0441G11C16/26G11C16/3427G11C29/50G11C29/50004G11C2216/10H01L27/115H01L27/11558
    • Disclosed is a method and apparatus for evaluating margin voltages in single poly EEPROM cells. Briefly, the invention involves shifting the cell's threshold voltage higher, resulting in a corresponding rise in the margin voltage, so that testing for the erase margin may be conducted in the positive voltage range. The present invention implements a variety of solutions to the problem, including both innovations in cell processing and circuitry. In one embodiment, the process steps employed to create the floating gate transistor are changed in order to increase its threshold voltage. Alternatively, or in combination with these general process changes, the width of the floating gate transistor may be reduced, resulting in a corresponding increase in the margin voltage. Circuit modifications include providing a separate test mode condition where the sense amp trip current is higher than under normal operation, and raising the source line's voltage level with a new sense amp optimization, or only during the margin testing mode, both of which shift the erase margin voltages for the cell into the testable range.
    • 公开了一种用于评估单个多层EEPROM单元中的边缘电压的方法和装置。 简而言之,本发明涉及将电池的阈值电压更高,导致余量电压的相应上升,从而可以在正电压范围内进行擦除裕度的测试。 本发明实现了针对该问题的各种解决方案,包括在小区处理和电路中的创新。 在一个实施例中,用于产生浮栅晶体管的工艺步骤被改变以增加其阈值电压。 或者,或者与这些一般的工艺变化相结合,浮栅晶体管的宽度可能会减小,导致余量电压的相应增加。 电路修改包括提供单独的测试模式条件,其中感测放大器跳闸电流高于正常操作,并且通过新的感测放大器优化提高源极线路的电压电平,或者仅在裕度测试模式期间,两者都移动擦除 电池的裕度电压进入可测量范围。