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    • 3. 发明授权
    • Method and apparatus for detecting and inspecting through-penetrating defects in foils and films
    • 用于检测和检查箔和薄膜中穿透性缺陷的方法和装置
    • US08284247B2
    • 2012-10-09
    • US12378330
    • 2009-02-14
    • Volodymyr I RedkoVolodymyr S KhandetskyyElena M. Shembel
    • Volodymyr I RedkoVolodymyr S KhandetskyyElena M. Shembel
    • H04N7/18G01N21/00
    • G01N21/894G06T7/0004G06T7/62G06T2207/10152G06T2207/30124
    • The present invention is a method and apparatus for optical detection and size evaluation of through-penetrating defects such as pinholes in moving foil or film. The invention comprises the installation of at least one image capture device at a first given distance over the moving foil surface, placement of at least one elongated light source comprising an infinite number of point-sources that are not in phase, and are emitting light independently from one another under the foil, periodic automatic computer-controlled image capture of the foil surface with image capture devices, automatic transmission of the image captured by each device to a control computer, and processing of the transmitted image data to detect of defect light spot, followed by determination of generalized index of its initial image. This generalize index value is equal to the brightness averaged within the spot multiplied by the area of the spot. The invention further includes reporting the presence of a through-penetrating defect when the generalized index value exceeds a preset threshold. characteristics of the defect spots.
    • 本发明是一种用于光学检测和尺寸评估的方法和装置,其中穿透性缺陷例如移动箔片或薄膜中的针孔。 本发明包括在移动的箔表面上以第一给定距离安装至少一个图像捕获装置,放置至少一个细长的光源,其包括不同相的无限数量的点源,并且独立地发光 在箔片下方,使用图像捕获装置对箔片表面进行周期性自动计算机控制的图像捕获,将由每个装置捕获的图像自动传输到控制计算机,以及处理传输的图像数据以检测缺陷光点 ,然后确定其初始图像的广义指数。 该泛化指数值等于斑点内平均的亮度乘以点的面积。 本发明还包括当广义指数值超过预设阈值时报告穿透性缺陷的存在。 缺点的特点。