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    • 3. 发明授权
    • Selective encapsulation, controlled atmosphere annealing for III-V
semiconductor device fabrication
    • III-V半导体器件制造的选择性封装,受控气氛退火
    • US4396437A
    • 1983-08-02
    • US260455
    • 1981-05-04
    • Siang P. KwokMilton FengVictor K. Eu
    • Siang P. KwokMilton FengVictor K. Eu
    • H01L21/324H01L21/265
    • H01L21/3245
    • A post-ion implantation annealing technique is provided to remove implantation damage in the active region of III-V (e.g., GaAs) semiconductor devices formed in a III-V semi-insulating substrate and separated by a field region. The technique involves applying a dielectric encapsulation selectively over the device active area and annealing in a controlled reducing atmosphere which includes the Group V element (e.g., arsenic). The dielectric encapsulant over the active region permits migration of the species employed to render the substrate semi-insulating (e.g., Cr in GaAs substrates), thereby resulting in high carrier mobility in the active region. Without encapsulation, migration of the species in the field region is substantially suppressed, thereby resulting in good inter-device isolation.
    • 提供离子后注入退火技术以去除在III-V半绝缘衬底中形成并被场区域分离的III-V(例如,GaAs)半导体器件的有源区域中的注入损伤。 该技术涉及在器件有源区域上选择性地施加电介质封装并在包括第V族元素(例如砷)的受控还原气氛中进行退火。 有源区上的电介质密封剂允许用于使衬底半绝缘(例如,GaAs衬底中的Cr)所用的物质的迁移,从而在有源区域中导致高的载流子迁移率。 没有包封,实质上抑制了场区域中的物质的迁移,从而导致良好的器件间隔离。
    • 4. 发明申请
    • High speed light emitting semiconductor methods and devices
    • 高速发光半导体的方法和装置
    • US20120249009A1
    • 2012-10-04
    • US13506626
    • 2012-05-03
    • Gabriel WalterMilton FengNick Holonyak, JR.Han Wui ThenChao-Hsin Wu
    • Gabriel WalterMilton FengNick Holonyak, JR.Han Wui ThenChao-Hsin Wu
    • H05B37/00H01L33/62H01L33/60
    • H01S5/06203B82Y20/00H01L33/0016H01L33/30H01L33/38H01S5/06213H01S5/183H01S5/1835H01S5/34313
    • A method including: providing a transistor structure that includes a base region of first semiconductor type between semiconductor emitter and collector regions of second semiconductor type; providing, in the base region, at least one region exhibiting quantum size effects; providing emitter, base, and collector electrodes respectively coupled with emitter, base, and collector regions; applying electrical signals, including a high frequency electrical signal component, with respect to the emitter, base, and collector electrodes to produce output spontaneous light emission from the base region, aided by the quantum size region, the output spontaneous light emission including a high frequency optical signal component representative of the high frequency electrical signal component; providing an optical cavity for the light emission in the region between the base and emitter electrodes; and scaling the lateral dimensions of the optical cavity to control the speed of light emission response to the high frequency electrical signal component.
    • 一种方法,包括:提供晶体管结构,所述晶体管结构包括在半导体发射极和第二半导体类型的集电极区之间的第一半导体类型的基极区; 在碱性区域中提供至少一个呈现量子效应的区域; 提供分别与发射极,基极和集电极区耦合的发射极,基极和集电极电极; 对发射极,基极和集电极施加包括高频电信号分量的电信号,以在量子尺寸区域辅助下产生从基极区域输出的自发光发射,包括高频的输出自发光发射 光信号分量代表高频电信号分量; 在基极和发射极之间的区域中提供用于发光的光学腔; 以及缩放光腔的横向尺寸以控制对高频电信号分量的发光响应的速度。
    • 9. 发明授权
    • High cycle deflection beam MEMS devices
    • 高周期偏转光束MEMS器件
    • US06998946B2
    • 2006-02-14
    • US10245790
    • 2002-09-17
    • Milton FengRichard Chan
    • Milton FengRichard Chan
    • H01H51/22
    • H01H59/0009H01H2059/0072H01P1/127
    • A high life cycle MEMS device is provided by the invention. The inventors have recognized that the deflection beam or deflection beams of an MEMS shunt switch are a failure point in need of improvement. In an aspect of the invention, at least a portion of the signals in the grounded state of an MEMS shunt switch are bypassed to ground on a path that avoids the deflection beam(s) supporting the movable pad. In a preferred embodiment, ground posts are disposed to contact the movable pad in an actuated position and establish a signal path from a signal line to ground. The inventors have also recognized that a shape of deflection beams near their anchor point contributes to failures. In another preferred aspect of the invention, an anchoring portion of the deflection beam or deflection beams is generally coplanar with the remaining portion of the deflection beam(s). An additional post beneath the anchoring portion of the deflection beam(s) permits deflection beam(s) lacking any turns that form a weak structural point.
    • 本发明提供了高寿命的MEMS器件。 本发明人认识到MEMS分流开关的偏转光束或偏转光束是需要改进的失效点。 在本发明的一个方面中,在MEMS分流开关的接地状态下的至少一部分信号在路径上被旁路到地,以避免支撑可移动焊盘的偏转光束。 在优选实施例中,接地柱设置成在致动位置接触可移动垫,并建立从信号线到地面的信号路径。 本发明人还认识到,靠近它们的锚点的偏转束的形状有助于失效。 在本发明的另一优选方面,偏转光束或偏转光束的锚固部分通常与偏转光束的剩余部分共面。 在偏转光束的锚固部分下面的附加柱允许缺乏形成弱结构点的任何匝的偏转光束。