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    • 8. 发明授权
    • Illuminating optical apparatus and making method thereof, exposure apparatus and making method thereof, and device manufacturing method
    • 照明光学装置及其制造方法,曝光装置及其制造方法以及装置制造方法
    • US06727981B2
    • 2004-04-27
    • US10307963
    • 2002-12-03
    • Taichi TaniuchiKyoji NakamuraEizo OhyaHiromitsu Yoshimoto
    • Taichi TaniuchiKyoji NakamuraEizo OhyaHiromitsu Yoshimoto
    • G03B2752
    • G03F7/70916G03B27/42G03F7/70058G03F7/709
    • The illuminating optical system is divided into a first portion including movable blades moving during exposure, and a second portion not containing a movable portion moving over the movable blade during exposure. The second portion is installed on the exposure main portion, and the first portion, separately from the exposure main portion. The frames configuring the first and the second optical units, the second optical unit having optical elements of a smaller movable amount than the movable amount of the movable blades, are relatively displaceably connected via the bellows-shaped member. The frames configuring the second optical units are fixed to each other via the O-ring suppressing relative displacement. As a result, the effect of vibration of the illuminating optical system during exposure on the main portion can be reduced. Upon purging nitrogen gas or the like in the space interior of the frame and the space between adjacent frames, the degree of air-tightness and chemical cleanliness is improved, consequently improving the exposure accuracy.
    • 照明光学系统被分为包括在曝光期间移动的可移动刀片的第一部分和不包含在曝光期间在可动刀片上移动的可移动部分的第二部分。 第二部分安装在曝光主体部分上,第一部分与曝光主体部分分开。 构成第一和第二光学单元的框架,具有比可动叶片的可移动量小的可移动量的光学元件的第二光学单元经由波纹管状构件相对可移动地连接。 构成第二光学单元的框架经由O形环彼此固定,抑制相对位移。 结果,可以减少照射光学系统在主要部分的曝光期间的振动的影响。 当在框架的空间内部和相邻框架之间的空间中吹扫氮气等时,提高了气密性和化学清洁度,从而提高了曝光精度。
    • 9. 发明授权
    • Exposure method and device manufacturing method including selective deformation of a mask
    • 包括掩模选择性变形的曝光方法和装置制造方法
    • US09304385B2
    • 2016-04-05
    • US12560760
    • 2009-09-16
    • Alton H. PhillipsDouglas C. WatsonHiromitsu YoshimotoYusaku Uehara
    • Alton H. PhillipsDouglas C. WatsonHiromitsu YoshimotoYusaku Uehara
    • G03B27/32G03F1/00G03F7/20
    • G03B27/32G03F1/144G03F1/50G03F7/70783G03F7/70875
    • An exposure method that uses a substrate (M) held by a holding member (28) to perform exposure processing, comprising a holding process, which holds a prescribed region (AR3) of the substrate as the holding region by means of the holding member, and a deformation process, which selectively deforms one side of the holding region of the substrate held by the holding process with respect to the other side. According to the present invention, a prescribed region of the substrate is held as a holding region by means of a holding member, and one side of the holding region of said held substrate is selectively deformed with respect to the other side, so it is possible to selectively eliminate the nonlinear deformation components attributable to holding of the substrate with respect to one side from among the two sides of the substrate using the holding region as a reference. Since it is possible to put the pattern projected via the substrate into a linearly correctable status, it is possible to reduce warping of the pattern.
    • 一种使用由保持构件(28)保持的基板(M)进行曝光处理的曝光方法,包括通过保持构件保持基板的规定区域(AR3)作为保持区域的保持工序, 以及变形过程,其选择性地使通过保持过程保持的基板的保持区域的一侧相对于另一侧变形。 根据本发明,通过保持构件将衬底的规定区域保持为保持区域,并且所述保持衬底的保持区域的一侧相对于另一侧选择性地变形,因此可能 以使用保持区域作为基准来选择性地消除归因于基板相对于基板的两侧之间的一侧的保持的非线性变形分量。 由于可以将通过基板投射的图案置于线性可校正状态,可以减少图案的翘曲。
    • 10. 发明申请
    • EXPOSURE METHOD, DEVICE MANUFACTURING METHOD, AND MASK
    • 曝光方法,装置制造方法和掩模
    • US20100097588A1
    • 2010-04-22
    • US12560760
    • 2009-09-16
    • Alton H. PhillipsDouglas C. WatsonHiromitsu YoshimotoYusaku Uehara
    • Alton H. PhillipsDouglas C. WatsonHiromitsu YoshimotoYusaku Uehara
    • G03B27/42G03B27/32G03F1/00
    • G03B27/32G03F1/144G03F1/50G03F7/70783G03F7/70875
    • An exposure method that uses a substrate (M) held by a holding member (28) to perform exposure processing, comprising a holding process, which holds a prescribed region (AR3) of the substrate as the holding region by means of the holding member, and a deformation process, which selectively deforms one side of the holding region of the substrate held by the holding process with respect to the other side. According to the present invention, a prescribed region of the substrate is held as a holding region by means of a holding member, and one side of the holding region of said held substrate is selectively deformed with respect to the other side, so it is possible to selectively eliminate the nonlinear deformation components attributable to holding of the substrate with respect to one side from among the two sides of the substrate using the holding region as a reference. Since it is possible to put the pattern projected via the substrate into a linearly correctable status, it is possible to reduce warping of the pattern.
    • 一种使用由保持构件(28)保持的基板(M)进行曝光处理的曝光方法,包括通过保持构件保持基板的规定区域(AR3)作为保持区域的保持工序, 以及变形过程,其选择性地使通过保持过程保持的基板的保持区域的一侧相对于另一侧变形。 根据本发明,通过保持构件将衬底的规定区域保持为保持区域,并且所述保持衬底的保持区域的一侧相对于另一侧选择性地变形,因此可能 以使用保持区域作为基准来选择性地消除归因于基板相对于基板的两侧之间的一侧的保持的非线性变形分量。 由于可以将通过基板投射的图案置于线性可校正状态,可以减少图案的翘曲。