专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07609076B2 Method of measuring characteristic impedance of electrostatic discharge protecting circuit and apparatus for realizing the same 有权
标题翻译：测量静电放电保护电路的特性阻抗的方法及其实现方法
公开(公告)号：US07609076B2
公开(公告)日：2009-10-27
申请号：US11749912
申请日：2007-05-17
申请人： Toshiyuki Nakaie , Masanori Sawada , Taizo Shintani , Natarajan Mahadeva Iyer , David Eric Tremouilles
发明人： Toshiyuki Nakaie , Masanori Sawada , Taizo Shintani , Natarajan Mahadeva Iyer , David Eric Tremouilles
IPC分类号： G01R27/08
CPC分类号： G01R27/04 , G01R31/2827
摘要： A method of quickly measuring a characteristic impedance of an ESD protecting circuit by applying a discharge voltage to the ESD protecting circuit, includes the steps of measuring a variation in discharge voltage applied to and a variation in discharge current caused to flow through the ESD protecting circuit with time; simultaneously detecting a state when both the discharge voltage and discharge current corresponding to each other are attenuated, after both the discharge voltage and discharge current sequentially rise to arrive individually to respective peak values based on an input to or an output from a computer; and taking a ratio of the variation of discharge voltage to the variation of discharge current during the attenuation as an impedance value when the ratio is nearly constant as well as an apparatus for realizing the same.
摘要翻译：通过向ESD保护电路施加放电电压来快速测量ESD保护电路的特性阻抗的方法包括以下步骤：测量施加的放电电压的变化和通过ESD保护电路流过的放电电流的变化随着时间的推移; 同时检测放电电压和放电电流两者彼此衰减时的状态，在放电电压和放电电流两者依次从计算机输入或从计算机输出之后依次上升到相应的峰值时; 并且当该比率几乎恒定时，将放电电压的变化与衰减期间的放电电流的变化的比率以及实现该比率的装置进行比较。

2. 发明申请

US20100142105A1 Bidirectional ESD Power Clamp 审中-公开
标题翻译：双向ESD电源钳位
公开(公告)号：US20100142105A1
公开(公告)日：2010-06-10
申请号：US12630170
申请日：2009-12-03
申请人： Dimitri Linten , Steven Thijs , David Eric Tremouilles , Natarajan Mahadeva Iyer
发明人： Dimitri Linten , Steven Thijs , David Eric Tremouilles , Natarajan Mahadeva Iyer
IPC分类号： H02H9/04
CPC分类号： H01L27/0285
摘要： The disclosed method and device relates to a bidirectional ESD power clamp, comprising a semiconductor structure (BigNFET; BigPFET) having a conductive path connected between first and second nodes and having a triggering node via which the conductive path can be triggered. An ESD transient detection circuit is connected between the first and second nodes and to the triggering node and comprises a first part for detecting an occurrence of a first ESD transient on the first node. The semiconductor structure is provided on an insulator substrate, such that a parasitic conductive path between said first and second nodes via the substrate is avoided. The ESD transient detection circuit further comprises a second part for detecting an occurrence of a second ESD transient on the second node.
摘要翻译：所公开的方法和装置涉及双向ESD功率钳位，其包括半导体结构（BigNFET; BigPFET），其具有连接在第一和第二节点之间的导电路径，并且具有触发节点，通过该触发节点可以触发导电路径。 ESD瞬变检测电路连接在第一和第二节点与触发节点之间，并且包括用于检测第一节点上的第一ESD瞬变的发生的第一部分。半导体结构设置在绝缘体基板上，使得避免了经由基板的所述第一和第二节点之间的寄生导电路径。 ESD瞬态检测电路还包括用于检测第二节点上的第二ESD瞬态的发生的第二部分。

3. 发明授权

US07821272B2 Method for calibrating an electrostatic discharge tester 有权
标题翻译：校准静电放电测试仪的方法
公开(公告)号：US07821272B2
公开(公告)日：2010-10-26
申请号：US12051749
申请日：2008-03-19
申请人： Mirko Scholz , David Eric Tremouilles , Steven Thijs , Dimitri Linten
发明人： Mirko Scholz , David Eric Tremouilles , Steven Thijs , Dimitri Linten
IPC分类号： G01R35/00 , G01R27/02
CPC分类号： G01R31/002 , G01R35/005
摘要： The present disclosure relates to a method for calibrating transient behaviour of an electrostatic discharge (ESD) test system. The system includes an ESD pulse generator and probe needles for applying a predetermined pulse on a device under test. The probe needles are connected to the ESD pulse generator via conductors. The test system includes measurement equipment for detecting transient behaviour of the device under test by simultaneously capturing voltage and current waveforms the device as a result of the pulse. The method includes the steps of: (a) applying the ESD test system on a first known system with a first known impedance, (b) applying the ESD test system on a second known system with a known second impedance, and (c) determining calibration data for the transient behaviour the ESD test system on the basis of captured voltage and current waveforms, taking into account said known first and second impedances. In preferred embodiments the waveforms are transferred to the frequency domain for correlation.
摘要翻译：本公开涉及一种用于校准静电放电（ESD）测试系统的瞬态特性的方法。该系统包括用于在被测器件上施加预定脉冲的ESD脉冲发生器和探针。探针通过导体连接到ESD脉冲发生器。该测试系统包括用于通过同时捕获脉冲结果的电压和电流波形来检测被测器件的瞬态特性的测量设备。该方法包括以下步骤：（a）将ESD测试系统应用于具有第一已知阻抗的第一已知系统上，（b）将ESD测试系统应用于具有已知第二阻抗的第二已知系统上，以及（c）确定考虑到所述已知的第一和第二阻抗，基于捕获的电压和电流波形，ESD测试系统的瞬态特性的校准数据。在优选实施例中，波形被传送到频域以进行相关。

4. 发明申请

US20090073621A1 Fast Triggering ESD Protection Device and Method for Designing Same 审中-公开
标题翻译：快速触发ESD保护装置及其设计方法
公开(公告)号：US20090073621A1
公开(公告)日：2009-03-19
申请号：US12209926
申请日：2008-09-12
申请人： Steven Thijs , David Eric Tremouilles
发明人： Steven Thijs , David Eric Tremouilles
IPC分类号： H02H9/00 , G06F17/50
CPC分类号： H01L27/0262 , H01L29/0649 , H01L29/7391 , H01L29/7436 , H01L29/861 , H03K17/08144 , H03K17/305
摘要： A method and apparatus for designing an ESD protection circuit comprising a main ESD device and a triggering device connected to a triggering node of the main ESD device by means of which the main ESD device can be triggered for conducting ESD current at a reduced voltage. The triggering device is located in an initial current path for the ESD current. In this initial current path, there is at least one triggering component which can be triggered from an off-state to an on-state. The triggering speed of this component is considered and its design is optimised in view of increasing its triggering speed. Further shown is an ESD protection circuit in which at least one triggering component is selected to be of a predetermined type for achieving a fast triggering speed, preferably of the gated diode type.
摘要翻译：一种用于设计ESD保护电路的方法和装置，包括主ESD装置和连接到主ESD装置的触发节点的触发装置，通过该ESD触发装置可以触发主ESD装置以在降低的电压下传导ESD电流。触发装置位于用于ESD电流的初始电流路径中。在该初始电流路径中，存在至少一个触发组件，其可以从截止状态触发到导通状态。考虑到该组件的触发速度，考虑到其触发速度的增加，其设计被优化。进一步示出了ESD保护电路，其中至少一个触发组件被选择为预定类型，以实现快速的触发速度，优选地是门控二极管类型。

5. 发明申请

US20090280582A1 Design Methodology for MuGFET ESD Protection Devices 有权
标题翻译： MuGFET ESD保护器件的设计方法
公开(公告)号：US20090280582A1
公开(公告)日：2009-11-12
申请号：US12437294
申请日：2009-05-07
申请人： Steven Thijs , Dimitri Linten , David Eric Tremouilles
发明人： Steven Thijs , Dimitri Linten , David Eric Tremouilles
IPC分类号： H01L21/66
CPC分类号： H01L27/0248 , H01L29/66795
摘要： A method for manufacturing a MuGFET ESD protection device having a given layout by means of a given manufacturing process, the method comprising selecting multiple interdependent layout and process parameters of which a first set are fixed by said manufacturing process and a second set are variable, selecting multiple combinations of possible layout and process parameter values which meet predetermined ESD constraints; determining an optimum value for at least one other parameter in view of a predetermined design target apart from the predetermined ESD constraints; determining values for fin width (Wfin), gate length (LG) and number of fins (N) on the basis of the optimum value; and manufacturing said MuGFET ESD protection device using the given manufacturing and process values.
摘要翻译：一种通过给定的制造工艺制造具有给定布局的MuGFET ESD保护装置的方法，所述方法包括：通过所述制造过程选择第一组固定的多个相互依赖的布局和工艺参数，第二组是可变的，选择可能的布局和过程参数值的多种组合满足预定的ESD约束; 鉴于除了预定的ESD约束之外的预定设计目标，确定至少一个其他参数的最佳值; 基于最佳值确定翅片宽度（Wfin），栅极长度（LG）和翅片数（N）的值; 并使用给定的制造和过程值制造所述MuGFET ESD保护装置。

6. 发明申请

US20090027063A1 Method for Calibrating an Electrostatic Discharge Tester 有权
标题翻译：校准静电放电测试仪的方法
公开(公告)号：US20090027063A1
公开(公告)日：2009-01-29
申请号：US12051749
申请日：2008-03-19
申请人： Mirko Scholz , David Eric Tremouilles , Steven Thijs , Dimitri Linten
发明人： Mirko Scholz , David Eric Tremouilles , Steven Thijs , Dimitri Linten
IPC分类号： G01R35/00
CPC分类号： G01R31/002 , G01R35/005
摘要： The present disclosure relates to a method for calibrating transient behaviour of an electrostatic discharge (ESD) test system. The system includes an ESD pulse generator and probe needles for applying a predetermined pulse on a device under test. The probe needles are connected to the ESD pulse generator via conductors. The test system includes measurement equipment for detecting transient behaviour of the device under test by simultaneously capturing voltage and current waveforms the device as a result of the pulse. The method comprises the steps of: (a) applying the ESD test system on a first known system with a first known impedance, (b) applying the ESD test system on a second known system with a known second impedance, and (c) determining calibration data for the transient behaviour the ESD test system on the basis of captured voltage and current waveforms, taking into account said known first and second impedances. In preferred embodiments the waveforms are transferred to the frequency domain for correlation.
摘要翻译：本公开涉及一种用于校准静电放电（ESD）测试系统的瞬态特性的方法。该系统包括用于在被测器件上施加预定脉冲的ESD脉冲发生器和探针。探针通过导体连接到ESD脉冲发生器。该测试系统包括用于通过同时捕获脉冲结果的电压和电流波形来检测被测器件的瞬态特性的测量设备。该方法包括以下步骤：（a）将ESD测试系统应用于具有第一已知阻抗的第一已知系统上，（b）将ESD测试系统应用于具有已知第二阻抗的第二已知系统上，以及（c）确定考虑到所述已知的第一和第二阻抗，基于捕获的电压和电流波形，ESD测试系统的瞬态特性的校准数据。在优选实施例中，波形被传送到频域以进行相关。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式