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    • 3. 发明申请
    • Impedance measurement in a fluidic microsystem
    • 流体微系统中的阻抗测量
    • US20060243594A1
    • 2006-11-02
    • US10523175
    • 2003-07-28
    • Thomas SchnelleTorsten MuellerStephen Shirley
    • Thomas SchnelleTorsten MuellerStephen Shirley
    • B03C5/02
    • G01N15/1209G01N2015/1236G01N2015/1254
    • Described are a method and a measuring device for measuring the impedance in a fluidic microsystem comprising a compartment (10) through which a liquid comprising at least one suspended particle (16) flows, and in which at least one impedance detector (40) is arranged, by means of which for detection of the at least one particle at least one impedance value is acquired which is characteristic for the impedance of the compartment, and which in the presence of the at least one particle changes in a predetermined way, wherein focusing of the at least one particle takes place in a predetermined space relative to the impedance detector, wherein focusing involves a movement of the at least one particle relative to the fluid flowing in the compartment as a result of dielectrophoretic forces, which forces are exerted by means of at least two focusing electrodes (30).
    • 描述了一种用于测量流体微系统中的阻抗的方法和测量装置,其包括隔室(10),包括至少一个悬浮颗粒(16)的液体通过该隔室(10)流过,并且其中布置有至少一个阻抗检测器(40) 用于检测至少一个颗粒,获得至少一个阻抗值,该阻抗值是隔室的阻抗的特征,并且在至少一个颗粒的存在下以预定的方式改变,其中聚焦 所述至少一个颗粒相对于所述阻抗检测器发生在预定空间中,其中聚焦涉及所述至少一个颗粒相对于由于介电电泳力而在所述隔室中流动的流体的运动,所述力通过 至少两个聚焦电极(30)。