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1. 发明申请

US20100263098A1 METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJECTS TO BE ANALYZED 有权
标题翻译：用于分析物体的样品的组合分析的方法和装置
公开(公告)号：US20100263098A1
公开(公告)日：2010-10-14
申请号：US12670570
申请日：2008-07-24
申请人： Torsten Müller , Kathryn Anne Poole , Detlef Knebel , Torsten Jähnke
发明人： Torsten Müller , Kathryn Anne Poole , Detlef Knebel , Torsten Jähnke
IPC分类号： G01Q60/24 , G01Q90/00
CPC分类号： G01Q60/42 , B82Y35/00 , G01N21/6458 , G01N2021/6482 , G01Q30/02 , G01Q30/04
摘要： The invention relates to a method for the combined analysis of a sample with objects to be analysed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analysed in the sample are obtained by analysing the one or more objects to be analysed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analysed by analysing the one or more objects to be analysed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects.
摘要翻译：本发明涉及一种用于将样品与待分析物体，特别是具有生物物体的样品进行组合分析的方法，其中通过分析样品中的一种或多种待分析对象的测量结果，或更多的物体通过测量的成像方法进行分析，通过用探针微观测量方法分析一个或多个要分析的对象来获得待分析的一个或多个对象的探针显微测量结果，并且在可选的先前中间处理之后，测量结果和探针显微测量结果彼此分配。此外，本发明涉及一种用于对待研究对象，特别是具有生物体的样本进行组合分析的装置。

2. 发明授权

US08505109B2 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope 有权
标题翻译：用于探针显微镜，测量单元和扫描探针显微镜的测量探针装置
公开(公告)号：US08505109B2
公开(公告)日：2013-08-06
申请号：US12670561
申请日：2008-07-24
申请人： Torsten Jähnke , Torsten Müller , Kathryn Anne Poole , Detlef Knebel
发明人： Torsten Jähnke , Torsten Müller , Kathryn Anne Poole , Detlef Knebel
IPC分类号： G01Q30/14
CPC分类号： G01Q30/14 , B01L3/5025 , B01L3/5085 , B01L2300/0819 , B01L2300/0851 , B01L2300/10 , G01Q60/42
摘要： The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell.
摘要翻译：本发明涉及一种用于探针显微镜，特别是扫描探针显微镜的测量探针装置，其具有设置在测量探针支架上的测量探针支架和测量探针，测量探针支架设置用于样品的探针显微镜研究，其中在测量探针支架上，形成测量探针室，该测量探针室至少部分地接收测量探针，并且在远离测量探针支架的一侧开口，并且被配置为接收测量探针周围的液体。本发明还涉及用于接收用于探针显微镜的液体样品的测量池，具有测量探针装置的扫描探针显微镜和具有测量池的扫描探针显微镜。

3. 发明授权

US08898809B2 Method and apparatus for the combined analysis of a sample with objects to be analyzed 有权
标题翻译：用于将样品与要分析的物体组合分析的方法和装置
公开(公告)号：US08898809B2
公开(公告)日：2014-11-25
申请号：US12670570
申请日：2008-07-24
申请人： Torsten Müller , Kathryn Anne Poole , Detlef Knebel , Torsten Jähnke
发明人： Torsten Müller , Kathryn Anne Poole , Detlef Knebel , Torsten Jähnke
IPC分类号： G01Q60/00 , G01Q30/04 , G01Q30/02 , G01Q60/42 , B82Y35/00 , G01N21/64
CPC分类号： G01Q60/42 , B82Y35/00 , G01N21/6458 , G01N2021/6482 , G01Q30/02 , G01Q30/04
摘要： The invention relates to a method for the combined analysis of a sample with objects to be analyzed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analyzed in the sample are obtained by analyzing the one or more objects to be analyzed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analyzed by analyzing the one or more objects to be analyzed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects.
摘要翻译：本发明涉及一种用于将样品与待分析物体，特别是具有生物物体的样品进行组合分析的方法，其中通过分析样品中的一种或多种待分析对象的测量结果，或更多的物体通过测量的成像方法进行分析，通过用探针微观测量方法分析一个或多个要分析的对象来获得待分析的一个或多个对象的探针显微测量结果，并且在可选的先前中间处理之后，测量结果和探针显微测量结果彼此分配。此外，本发明涉及一种用于对待研究对象，特别是具有生物体的样本进行组合分析的装置。

4. 发明申请

US20100263096A1 MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND SCANNING PROBE MICROSCOPE 有权
标题翻译：用于探针显微镜，测量细胞和扫描探针显微镜的测量探针装置
公开(公告)号：US20100263096A1
公开(公告)日：2010-10-14
申请号：US12670561
申请日：2008-07-24
申请人： Torsten Jähnke , Torsten Müller , Kathryn Anne Poole , Detlef Knebel
发明人： Torsten Jähnke , Torsten Müller , Kathryn Anne Poole , Detlef Knebel
IPC分类号： G01Q70/02 , G01Q30/00 , B01L3/00
CPC分类号： G01Q30/14 , B01L3/5025 , B01L3/5085 , B01L2300/0819 , B01L2300/0851 , B01L2300/10 , G01Q60/42
摘要： The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell.
摘要翻译：本发明涉及一种用于探针显微镜，特别是扫描探针显微镜的测量探针装置，其具有设置在测量探针支架上的测量探针支架和测量探针，测量探针支架设置用于样品的探针显微镜研究，其中在测量探针支架上，形成测量探针室，该测量探针室至少部分地接收测量探针，并且在远离测量探针支架的一侧开口，并且被配置为接收测量探针周围的液体。本发明还涉及用于接收用于探针显微镜的液体样品的测量池，具有测量探针装置的扫描探针显微镜和具有测量池的扫描探针显微镜。

5. 发明授权

US07971266B2 Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope 有权
标题翻译：用于在探针显微镜中提供用于探针显微镜分析测试样品并用探针显微镜布置的探针的方法
公开(公告)号：US07971266B2
公开(公告)日：2011-06-28
申请号：US12320114
申请日：2009-01-16
申请人： Torsten Jähnke , Torsten Müller , Detlef Knebel , Kathryn Poole
发明人： Torsten Jähnke , Torsten Müller , Detlef Knebel , Kathryn Poole
IPC分类号： G01N13/16 , G01N13/10 , G01Q60/24 , G01Q60/38
CPC分类号： G01Q70/00
摘要： The present invention relates to a method for providing a measuring probe (1, 1a, 2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe microscope, in which the measuring probe (1), which has a probe base (1a) and a probe extension (2) formed thereon, is held on a carrier device and the measuring probe (1) is processed before or after a measurement by detaching a section of the probe extension (2). The invention further relates to an arrangement having a probe microscope for the probe microscopic examination of a sample, in particular a scanning probe microscope.
摘要翻译：本发明涉及一种在探针显微镜，特别是扫描探针显微镜中提供用于样品的探针显微镜检查的测量探针（1,1a，2）的方法，其中测量探针（1）具有探针基座（1a）和形成在其上的探针延伸部（2）保持在载体装置上，并且在测量之前或之后通过分离探针延伸部分（2）的一部分来处理测量探针（1）。本发明还涉及具有用于样品的探针显微镜检查的探针显微镜的装置，特别是扫描探针显微镜。

6. 发明申请

US20090300807A1 Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope 有权
标题翻译：用于在探针显微镜中提供用于探针显微镜分析测试样品并用探针显微镜布置的探针的方法
公开(公告)号：US20090300807A1
公开(公告)日：2009-12-03
申请号：US12320114
申请日：2009-01-16
申请人： Torsten Jähnke , Torsten Müller , Detlef Knebel , Kathryn Poole
发明人： Torsten Jähnke , Torsten Müller , Detlef Knebel , Kathryn Poole
IPC分类号： G12B21/08
CPC分类号： G01Q70/00
摘要： The present invention relates to a method for providing a measuring probe (1, 1a, 2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe microscope, in which the measuring probe (1), which has a probe base (1a) and a probe extension (2) formed thereon, is held on a carrier device and the measuring probe (1) is processed before or after a measurement by detaching a section of the probe extension (2). The invention further relates to an arrangement having a probe microscope for the probe microscopic examination of a sample, in particular a scanning probe microscope.
摘要翻译：本发明涉及一种在探针显微镜，特别是扫描探针显微镜中提供用于样品的探针显微镜检查的测量探针（1,1a，2）的方法，其中测量探针（1）具有探针基座（1a）和形成在其上的探针延伸部（2）保持在载体装置上，并且在测量之前或之后通过分离探针延伸部分（2）的一部分来处理测量探针（1）。本发明还涉及具有用于样品的探针显微镜检查的探针显微镜的装置，特别是扫描探针显微镜。

7. 发明授权

US07022985B2 Apparatus and method for a scanning probe microscope 有权
公开(公告)号：US07022985B2
公开(公告)日：2006-04-04
申请号：US10490442
申请日：2002-09-24
申请人： Detlef Knebel , Torsten Jähnke , Olaf Sünwoldt
发明人： Detlef Knebel , Torsten Jähnke , Olaf Sünwoldt
IPC分类号： G01N23/00
CPC分类号： G01Q20/02 , Y10S977/868
摘要： The invention relates to an apparatus and a method for a scanning probe microscope, comprising a measuring assembly which includes a lateral shifting unit to displace a probe in a plane, a vertical shifting unit to displace the probe in a direction perpendicular to the plane, and a specimen support to receive a specimen. A condenser light path is formed through the measuring assembly so that the specimen support is located in the area of an end of the condenser light path.

8. 发明授权

US07934323B2 Method and a device for the positioning of a displaceable component in an examining system 有权
标题翻译：用于在检查系统中定位可移位部件的方法和装置
公开(公告)号：US07934323B2
公开(公告)日：2011-05-03
申请号：US11992850
申请日：2006-09-29
申请人： Detlef Knebel , Torsten Jähnke
发明人： Detlef Knebel , Torsten Jähnke
IPC分类号： G01B5/00
CPC分类号： G01Q70/04 , G01N35/04 , G01N2035/0491 , G01Q10/04
摘要： The invention relates to a method and a device for the positioning of a displaceable component in an examining system, particularly a measuring or an analytic system wherein, during the process, the displaceable component is displaced with the support of an actuating element coupled to the displaceable component from a home position into an end position, wherein the actuating element is moved by means of a drive force and the displaceable component is impacted with a fixation force fixating the displaceable component in the end position by way of a fixation component connected to the displaceable component, where the fixation component is submerged at least partially in a reservoir of a medium and is fixated in the medium by means of the transformation of the medium from a liquid state into a solidified state, wherein the medium is transformed from the liquid state into the solidified state by means of the impact-application with a manipulating variable.
摘要翻译：本发明涉及一种用于在检查系统中定位可移动部件的方法和装置，特别是测量系统或分析系统，其中在该过程期间，可移位部件与致动元件的支撑件相接触，组件从原始位置到终端位置，其中致动元件通过驱动力移动，并且可移动部件用固定力冲击，固定力通过连接到可移位的固定部件固定到终止位置组分，其中固定组分至少部分地浸没在介质的储存器中，并且通过将介质从液态转变为固化状态而固定在介质中，其中介质从液态转变为通过具有操纵变量的冲击应用的固化状态。

9. 发明授权

US07473894B2 Apparatus and method for a scanning probe microscope 有权
标题翻译：扫描探针显微镜的装置和方法
公开(公告)号：US07473894B2
公开(公告)日：2009-01-06
申请号：US11378258
申请日：2006-03-20
申请人： Detlef Knebel , Torsten Jähnke , Olaf Sünwoldt
发明人： Detlef Knebel , Torsten Jähnke , Olaf Sünwoldt
IPC分类号： G01N23/00 , G21K7/00
CPC分类号： G01Q20/02 , Y10S977/868
摘要： The invention relates to an apparatus and a method for a scanning probe microscope, comprising a measuring assembly which includes a lateral shifting unit to displace a probe in a plane, a vertical shifting unit to displace the probe in a direction perpendicular to the plane, and a specimen support to receive a specimen. A condenser light path is formed through the measuring assembly so that the specimen support is located in the area of an end of the condenser light path.
摘要翻译：本发明涉及一种用于扫描探针显微镜的装置和方法，包括测量组件，其包括用于使平面中的探针移位的横向移位单元，垂直移动单元，用于沿垂直于该平面的方向移位探针;以及样本支架接受样本。通过测量组件形成冷凝器光路，使得样本支架位于聚光器光路端部的区域中。

10. 发明授权

US08769711B2 Method for examining a measurement object, and apparatus 有权
标题翻译：用于检查测量对象的方法及装置
公开(公告)号：US08769711B2
公开(公告)日：2014-07-01
申请号：US12083303
申请日：2006-06-30
申请人： Torsten Jähnke
发明人： Torsten Jähnke
IPC分类号： G01Q60/24
CPC分类号： G01Q10/06 , G01Q30/025 , G01Q30/06
摘要： The invention relates to a method for examining a measurement object (2, 12), in which the measurement object (2, 12) is examined by means of scanning probe microscopy using a measurement probe (10) of a scanning probe measurement device, and in which at least one subsection (1) of the measurement object (2, 12) is optically examined by an optical measurement system in an observation region associated with the optical measurement system, wherein a displacement of the at least one subsection (1) of the measurement object (2, 12) out of the observation region which is brought about by the examination by means of scanning probe microscopy is corrected in such a way that the at least one displaced subsection (1) of the measurement object (2, 12) is arranged back in the observation region by means of a readjustment device which processes data signals that characterize the displacement.
摘要翻译：本发明涉及一种用于检查测量对象（2,12）的方法，其中使用扫描探针测量装置的测量探针（10）通过扫描探针显微镜检查测量对象（2,12），以及其中所述测量对象（2,12）的至少一个子部分（1）由与所述光学测量系统相关联的观察区域中的光学测量系统进行光学检查，其中所述至少一个子部分（1）的位移通过扫描探针显微镜检查引起的观察区域外的测量对象（2,12）被校正为使得测量对象（2,12）的至少一个移位子部分（1））通过处理表征位移的数据信号的重新调整装置布置在观察区域中。

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